{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,15]],"date-time":"2025-12-15T14:07:47Z","timestamp":1765807667555,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":24,"publisher":"ACM","license":[{"start":{"date-parts":[[2019,1,21]],"date-time":"2019-01-21T00:00:00Z","timestamp":1548028800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2019,1,21]]},"DOI":"10.1145\/3287624.3287692","type":"proceedings-article","created":{"date-parts":[[2019,1,18]],"date-time":"2019-01-18T21:45:18Z","timestamp":1547847918000},"page":"341-346","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":14,"title":["Improving scan chain diagnostic accuracy using multi-stage artificial neural networks"],"prefix":"10.1145","author":[{"given":"Mason","family":"Chern","sequence":"first","affiliation":[{"name":"National Tsing Hua University, Taiwan"}]},{"given":"Shih-Wei","family":"Lee","sequence":"additional","affiliation":[{"name":"National Tsing Hua University, Taiwan"}]},{"given":"Shi-Yu","family":"Huang","sequence":"additional","affiliation":[{"name":"National Tsing Hua University, Taiwan"}]},{"given":"Yu","family":"Huang","sequence":"additional","affiliation":[{"name":"Mentor"}]},{"given":"Gaurav","family":"Veda","sequence":"additional","affiliation":[{"name":"Mentor"}]},{"given":"Kun-Han (Hans)","family":"Tsai","sequence":"additional","affiliation":[{"name":"Mentor"}]},{"given":"Wu-Tung","family":"Cheng","sequence":"additional","affiliation":[{"name":"Mentor"}]}],"member":"320","published-online":{"date-parts":[[2019,1,21]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"303","article-title":"On Diagnosis of Faults in a Scan Chain","author":"Kundu S.","year":"1993","unstructured":"S. Kundu , \" On Diagnosis of Faults in a Scan Chain ,\" Proc. of VLSI Test Symposium (VTS) , pp. 303 -- 308 , 1993 . S. Kundu, \"On Diagnosis of Faults in a Scan Chain,\" Proc. of VLSI Test Symposium (VTS), pp. 303--308, 1993.","journal-title":"Proc. of VLSI Test Symposium (VTS)"},{"key":"e_1_3_2_1_2_1","first-page":"268","article-title":"A Technique for Fault Diagnosis of Defects in Scan Chains","author":"Guo R.","year":"2001","unstructured":"R. Guo and S. Venkataraman , \" A Technique for Fault Diagnosis of Defects in Scan Chains ,\" Proc. of Int'l Test Conf. (ITC) , pp. 268 -- 277 , 2001 . R. Guo and S. Venkataraman, \"A Technique for Fault Diagnosis of Defects in Scan Chains,\" Proc. of Int'l Test Conf. (ITC), pp. 268--277, 2001.","journal-title":"Proc. of Int'l Test Conf. (ITC)"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.83"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.5555\/783328.783549"},{"key":"e_1_3_2_1_5_1","first-page":"140","volume-title":"Proc. of Int'l Test Conf.","author":"P. Song","year":"2004","unstructured":"P. Song et al., \" A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current\" , Proc. of Int'l Test Conf. , pp. 140 -- 147 , 2004 . P. Song et al., \"A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current\", Proc. of Int'l Test Conf., pp. 140--147, 2004."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.66"},{"key":"e_1_3_2_1_7_1","first-page":"396","volume-title":"Proc. Int'l Symp. for Testing and Failure Analysis","author":"Localization J. Hwang et al., \"Deterministic","year":"2008","unstructured":"J. Hwang et al., \"Deterministic Localization and Analysis of Scan Hold-Time Faults\" , Proc. Int'l Symp. for Testing and Failure Analysis , pp. 396 -- 401 , 2008 . J. Hwang et al., \"Deterministic Localization and Analysis of Scan Hold-Time Faults\", Proc. Int'l Symp. for Testing and Failure Analysis, pp. 396--401, 2008."},{"key":"e_1_3_2_1_8_1","first-page":"198","volume-title":"Proc. of VLSI Test Symposium (VTS)","author":"Schafer J. L.","year":"1992","unstructured":"J. L. Schafer , \" Partner SRLs for Improved Shift Register Diagnosis ,\" Proc. of VLSI Test Symposium (VTS) , pp. 198 -- 201 , 1992 . J. L. Schafer, \"Partner SRLs for Improved Shift Register Diagnosis,\" Proc. of VLSI Test Symposium (VTS), pp. 198--201, 1992."},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.5555\/882503.884937"},{"key":"e_1_3_2_1_10_1","first-page":"704","article-title":"An Efficient Scheme to Diagnose Scan Chains","author":"Narayanan S.","year":"1997","unstructured":"S. Narayanan and A. Das , \" An Efficient Scheme to Diagnose Scan Chains ,\" Proc. of Int'l Test Conf. (ITC) , pp. 704 -- 713 , 1997 . S. Narayanan and A. Das, \"An Efficient Scheme to Diagnose Scan Chains,\" Proc. of Int'l Test Conf. (ITC), pp.704--713, 1997.","journal-title":"Proc. of Int'l Test Conf. (ITC)"},{"key":"e_1_3_2_1_11_1","first-page":"217","volume-title":"Symp. on Defect and Fault Tolerance in VLSI Systems (DFT)","author":"Wu Y.","year":"1998","unstructured":"Y. Wu , \" Diagnosis of Scan Chain Failures ,\" Prof. of Int'l Symp. on Defect and Fault Tolerance in VLSI Systems (DFT) , pp. 217 -- 222 , 1998 . Y. Wu, \"Diagnosis of Scan Chain Failures,\" Prof. of Int'l Symp. on Defect and Fault Tolerance in VLSI Systems (DFT), pp. 217--222, 1998."},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/54.970425"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/1120725.1120934"},{"key":"e_1_3_2_1_14_1","first-page":"510","volume-title":"Proc. Design, Automation & Test in Europe","author":"Huang Y.","year":"2007","unstructured":"Y. Huang , \" Dynamic Learning Based Scan Chain Diagnosis\" , Proc. Design, Automation & Test in Europe , pp. 510 -- 515 , 2007 . Y. Huang, \"Dynamic Learning Based Scan Chain Diagnosis\", Proc. Design, Automation & Test in Europe, pp.510--515, 2007."},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.848800"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2005.89"},{"key":"e_1_3_2_1_17_1","first-page":"171","volume-title":"Proc. IEEE Int'l Symp. on VLSI Design, Automation and Test","author":"Hsu J.-J.","year":"2006","unstructured":"J.-J. Hsu , C.-W. Tzeng , and S.-Y. Huang , \" A New Robust Paradigm for Diagnosing Hold-Time Faults in Scan Chains ,\" Proc. IEEE Int'l Symp. on VLSI Design, Automation and Test , pp 171 -- 174 , 2006 . J.-J. Hsu, C.-W. Tzeng, and S.-Y. Huang, \"A New Robust Paradigm for Diagnosing Hold-Time Faults in Scan Chains,\" Proc. IEEE Int'l Symp. on VLSI Design, Automation and Test, pp 171--174, 2006."},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20060205"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.36"},{"key":"e_1_3_2_1_20_1","first-page":"319","volume-title":"Proc. of Int'l Test Conf. (ITC)","author":"Huang Y.","year":"2003","unstructured":"Y. Huang , W.-T. Cheng , S.-M. Reddy , C.-J. Hsieh , and Y.-T. Hung , \" Statistical Diagnosis for Intermittent Scan Chain Hold-Time Fault ,\" Proc. of Int'l Test Conf. (ITC) , pp. 319 -- 328 , 2003 . Y. Huang, W.-T. Cheng, S.-M. Reddy, C.-J. Hsieh, and Y.-T. Hung, \"Statistical Diagnosis for Intermittent Scan Chain Hold-Time Fault,\" Proc. of Int'l Test Conf. (ITC), pp. 319--328, 2003."},{"key":"e_1_3_2_1_21_1","volume-title":"Proc. of Asian Test Symp. (ATS)","author":"Huang Y.","year":"2017","unstructured":"Y. Huang , B. Benware , R. Klingenberg , H. Tang , Jayant Dsouza and W.-T. Cheng , \" Scan Chain Diagnosis Based on Unsupervised Machine Learning\" , Proc. of Asian Test Symp. (ATS) , 2017 . Y. Huang, B. Benware, R. Klingenberg, H. Tang, Jayant Dsouza and W.-T. Cheng, \"Scan Chain Diagnosis Based on Unsupervised Machine Learning\", Proc. of Asian Test Symp. (ATS), 2017."},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2012.6466672"},{"key":"e_1_3_2_1_23_1","volume-title":"Cambridge University Press","author":"Mackay D. J.C.","year":"2005","unstructured":"D. J.C. Mackay , \" Information Theory , Inference, and Learning Algorithms\" , Cambridge University Press , 2005 . D. J.C. Mackay, \"Information Theory, Inference, and Learning Algorithms\", Cambridge University Press, 2005."},{"volume-title":"Large-Scale Machine Learning on Heterogeneous Systems\" Google Research","year":"2015","key":"e_1_3_2_1_24_1","unstructured":"\"TensorFlow. Large-Scale Machine Learning on Heterogeneous Systems\" Google Research . November 9, 2015 . \"TensorFlow. Large-Scale Machine Learning on Heterogeneous Systems\" Google Research. November 9, 2015."}],"event":{"name":"ASPDAC '19: 24th Asia and South Pacific Design Automation Conference","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEICE ESS Institute of Electronics, Information and Communication Engineers, Engineering Sciences Society","IEEE CAS","IEEE CEDA","IPSJ SIG-SLDM Information Processing Society of Japan, SIG System LSI Design Methodology"],"location":"Tokyo Japan","acronym":"ASPDAC '19"},"container-title":["Proceedings of the 24th Asia and South Pacific Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3287624.3287692","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3287624.3287692","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T01:08:05Z","timestamp":1750208885000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3287624.3287692"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,1,21]]},"references-count":24,"alternative-id":["10.1145\/3287624.3287692","10.1145\/3287624"],"URL":"https:\/\/doi.org\/10.1145\/3287624.3287692","relation":{},"subject":[],"published":{"date-parts":[[2019,1,21]]},"assertion":[{"value":"2019-01-21","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}