{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T00:11:13Z","timestamp":1780445473597,"version":"3.54.1"},"publisher-location":"New York, NY, USA","reference-count":22,"publisher":"ACM","license":[{"start":{"date-parts":[[2019,1,21]],"date-time":"2019-01-21T00:00:00Z","timestamp":1548028800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2019,1,21]]},"DOI":"10.1145\/3287624.3287693","type":"proceedings-article","created":{"date-parts":[[2019,1,18]],"date-time":"2019-01-18T21:45:18Z","timestamp":1547847918000},"page":"352-357","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":43,"title":["ScanSAT"],"prefix":"10.1145","author":[{"given":"Lilas","family":"Alrahis","sequence":"first","affiliation":[{"name":"Khalifa University, Abu Dhabi, U.A.E."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Muhammad","family":"Yasin","sequence":"additional","affiliation":[{"name":"New York University"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hani","family":"Saleh","sequence":"additional","affiliation":[{"name":"Khalifa University, Abu Dhabi, U.A.E."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Baker","family":"Mohammad","sequence":"additional","affiliation":[{"name":"Khalifa University, Abu Dhabi, U.A.E."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mahmoud","family":"Al-Qutayri","sequence":"additional","affiliation":[{"name":"Khalifa University, Abu Dhabi, U.A.E."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ozgur","family":"Sinanoglu","sequence":"additional","affiliation":[{"name":"New York University Abu Dhabi, Abu Dhabi, U.A.E."}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2019,1,21]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2335155"},{"key":"e_1_3_2_1_2_1","volume-title":"Outsourcing Test - What are the most valuable engagement periods?\" http:\/\/www.amkor.com\/go\/outsourcing-test","author":"Berry M.","year":"2014","unstructured":"M. Berry and G. John , \" Outsourcing Test - What are the most valuable engagement periods?\" http:\/\/www.amkor.com\/go\/outsourcing-test , 2014 , {May 16, 2016}. M. Berry and G. John, \"Outsourcing Test - What are the most valuable engagement periods?\" http:\/\/www.amkor.com\/go\/outsourcing-test, 2014, {May 16, 2016}."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2010.284"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2511144"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.193"},{"key":"e_1_3_2_1_6_1","volume-title":"Encrypt Flip-Flop: A Novel Logic Encryption Technique For Sequential Circuits,\" arXiv preprint arXiv:1801.04961","author":"Karmakar R.","year":"2018","unstructured":"R. Karmakar , S. Chatopadhyay , and R. Kapur , \" Encrypt Flip-Flop: A Novel Logic Encryption Technique For Sequential Circuits,\" arXiv preprint arXiv:1801.04961 , 2018 . R. Karmakar, S. Chatopadhyay, and R. Kapur, \"Encrypt Flip-Flop: A Novel Logic Encryption Technique For Sequential Circuits,\" arXiv preprint arXiv:1801.04961, 2018."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2772817"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2797019"},{"key":"e_1_3_2_1_9_1","first-page":"137","article-title":"Evaluating the Security of Logic Encryption Algorithms","author":"Subramanyan P.","year":"2015","unstructured":"P. Subramanyan , S. Ray , and S. Malik , \" Evaluating the Security of Logic Encryption Algorithms ,\" in IEEE International Symposium on Hardware Oriented Security and Trust , 2015 , pp. 137 -- 143 . P. Subramanyan, S. Ray, and S. Malik, \"Evaluating the Security of Logic Encryption Algorithms,\" in IEEE International Symposium on Hardware Oriented Security and Trust, 2015, pp. 137--143.","journal-title":"IEEE International Symposium on Hardware Oriented Security and Trust"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"e_1_3_2_1_11_1","first-page":"139","article-title":"Activation of Logic Encrypted Chips: Pre-test or Post-Test?\" in Design","author":"Yasin M.","year":"2016","unstructured":"M. Yasin , S. M. Saeed , J. Rajendran , and O. Sinanoglu , \" Activation of Logic Encrypted Chips: Pre-test or Post-Test?\" in Design , Automation Test in Europe , 2016 , pp. 139 -- 144 . M. Yasin, S. M. Saeed, J. Rajendran, and O. Sinanoglu, \"Activation of Logic Encrypted Chips: Pre-test or Post-Test?\" in Design, Automation Test in Europe, 2016, pp. 139--144.","journal-title":"Automation Test in Europe"},{"key":"e_1_3_2_1_12_1","first-page":"33","volume-title":"2017 IEEE\/ACM International Conference on. IEEE","author":"El Massad M.","year":"2017","unstructured":"M. El Massad , S. Garg , and M. Tripunitara , \" Reverse engineering camouflaged sequential circuits without scan access,\" in Computer-Aided Design (ICCAD) , 2017 IEEE\/ACM International Conference on. IEEE , 2017 , pp. 33 -- 40 . M. El Massad, S. Garg, and M. Tripunitara, \"Reverse engineering camouflaged sequential circuits without scan access,\" in Computer-Aided Design (ICCAD), 2017 IEEE\/ACM International Conference on. IEEE, 2017, pp. 33--40."},{"key":"e_1_3_2_1_13_1","first-page":"339","article-title":"Scan based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard","author":"Yang B.","year":"2004","unstructured":"B. Yang , K. Wu , and R. Karri , \" Scan based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard ,\" in IEEE International Test Conference , 2004 , pp. 339 -- 344 . B. Yang, K. Wu, and R. Karri, \"Scan based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard,\" in IEEE International Test Conference, 2004, pp. 339--344.","journal-title":"IEEE International Test Conference"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2007.70215"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.29"},{"key":"e_1_3_2_1_16_1","first-page":"1","article-title":"Test-Mode-Only Scan Attack and Countermeasure for Contemporary Scan Architectures","author":"Saeed S. M.","year":"2014","unstructured":"S. M. Saeed , S. S. Ali , O. Sinanoglu , and R. Karri , \" Test-Mode-Only Scan Attack and Countermeasure for Contemporary Scan Architectures ,\" in IEEE International Test Conference , 2014 , pp. 1 -- 8 . S. M. Saeed, S. S. Ali, O. Sinanoglu, and R. Karri, \"Test-Mode-Only Scan Attack and Countermeasure for Contemporary Scan Architectures,\" in IEEE International Test Conference, 2014, pp. 1--8.","journal-title":"IEEE International Test Conference"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.89"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2016.2613847"},{"key":"e_1_3_2_1_19_1","first-page":"155","article-title":"Dynamically Changeable Secure Scan Architecture against Scan-based Side Channel Attack","author":"Atobe Y.","year":"2012","unstructured":"Y. Atobe , Y. Shi , M. Yanagisawa , and N. Togawa , \" Dynamically Changeable Secure Scan Architecture against Scan-based Side Channel Attack ,\" in International SoC Design Conference , 2012 , pp. 155 -- 158 . Y. Atobe, Y. Shi, M. Yanagisawa, and N. Togawa, \"Dynamically Changeable Secure Scan Architecture against Scan-based Side Channel Attack,\" in International SoC Design Conference, 2012, pp. 155--158.","journal-title":"International SoC Design Conference"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2005.36"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.906483"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1985.294856"}],"event":{"name":"ASPDAC '19: 24th Asia and South Pacific Design Automation Conference","location":"Tokyo Japan","acronym":"ASPDAC '19","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEICE ESS Institute of Electronics, Information and Communication Engineers, Engineering Sciences Society","IEEE CAS","IEEE CEDA","IPSJ SIG-SLDM Information Processing Society of Japan, SIG System LSI Design Methodology"]},"container-title":["Proceedings of the 24th Asia and South Pacific Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3287624.3287693","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3287624.3287693","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T01:08:05Z","timestamp":1750208885000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3287624.3287693"}},"subtitle":["unlocking obfuscated scan chains"],"short-title":[],"issued":{"date-parts":[[2019,1,21]]},"references-count":22,"alternative-id":["10.1145\/3287624.3287693","10.1145\/3287624"],"URL":"https:\/\/doi.org\/10.1145\/3287624.3287693","relation":{},"subject":[],"published":{"date-parts":[[2019,1,21]]},"assertion":[{"value":"2019-01-21","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}