{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:29:03Z","timestamp":1750220943750,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":16,"publisher":"ACM","license":[{"start":{"date-parts":[[2019,6,2]],"date-time":"2019-06-02T00:00:00Z","timestamp":1559433600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2019,6,2]]},"DOI":"10.1145\/3316781.3323482","type":"proceedings-article","created":{"date-parts":[[2019,5,23]],"date-time":"2019-05-23T18:07:13Z","timestamp":1558634833000},"page":"1-3","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":3,"title":["Design Principles for True Random Number Generators for Security Applications"],"prefix":"10.1145","author":[{"given":"Milo\u0161","family":"Gruji\u0107","sequence":"first","affiliation":[{"name":"COSIC, KU Leuven, Leuven, Belgium"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vladimir","family":"Ro\u017ei\u0107","sequence":"additional","affiliation":[{"name":"COSIC, KU Leuven, Leuven, Belgium"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Johnston","sequence":"additional","affiliation":[{"name":"Intel Corporation, Hilsboro, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John","family":"Kelsey","sequence":"additional","affiliation":[{"name":"NIST, Gaithersburg, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ingrid","family":"Verbauwhede","sequence":"additional","affiliation":[{"name":"COSIC, KU Leuven, Leuven, Belgium"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2019,6,2]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2009.02.004"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-29912-4_13"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351222"},{"key":"e_1_3_2_1_4_1","volume-title":"Automation Test in Europe Conference Exhibition (DATE). 1520--1523","author":"Gruji\u0107 Milo\u0161","year":"2018","unstructured":"Milo\u0161 Gruji\u0107 , Bohan Yang , Vladimir Ro\u017ei\u0107 , and Ingrid Verbauwhede . 2018 . Towards inter-vendor compatibility of true random number generators for FPGAs. In 2018 Design , Automation Test in Europe Conference Exhibition (DATE). 1520--1523 . Milo\u0161 Gruji\u0107, Bohan Yang, Vladimir Ro\u017ei\u0107, and Ingrid Verbauwhede. 2018. Towards inter-vendor compatibility of true random number generators for FPGAs. In 2018 Design, Automation Test in Europe Conference Exhibition (DATE). 1520--1523."},{"key":"e_1_3_2_1_5_1","volume-title":"Bonn","author":"Killmann Wolfgang","year":"2011","unstructured":"Wolfgang Killmann and Werner Schindler . 2011. A proposal for: Functionality classes for random number generators. ser. BDI , Bonn ( 2011 ). Wolfgang Killmann and Werner Schindler. 2011. A proposal for: Functionality classes for random number generators. ser. BDI, Bonn (2011)."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2013.73"},{"key":"e_1_3_2_1_7_1","volume-title":"The Impact of Pulsed Electromagnetic Fault Injection on True Random Number Generators. In 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC). 43--48","author":"Madau Maxime","year":"2018","unstructured":"Maxime Madau , Michel Agoyan , Josep Balasch , Milo\u0161 Gruji\u0107 , Patrick Haddad , Philippe Maurine , Vladimir Ro\u017ei\u0107 , Dave Singel\u00e9e , Bohan Yang , and Ingrid Verbauwhede . 2018 . The Impact of Pulsed Electromagnetic Fault Injection on True Random Number Generators. In 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC). 43--48 . Maxime Madau, Michel Agoyan, Josep Balasch, Milo\u0161 Gruji\u0107, Patrick Haddad, Philippe Maurine, Vladimir Ro\u017ei\u0107, Dave Singel\u00e9e, Bohan Yang, and Ingrid Verbauwhede. 2018. The Impact of Pulsed Electromagnetic Fault Injection on True Random Number Generators. In 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC). 43--48."},{"key":"e_1_3_2_1_8_1","unstructured":"George Marsaglia. 1995. DIEHARD Test Suite. (1995). http:\/\/www.stat.fsu.edu\/pub\/diehard\/  George Marsaglia. 1995. DIEHARD Test Suite. (1995). http:\/\/www.stat.fsu.edu\/pub\/diehard\/"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2016.7577379"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744852"},{"key":"e_1_3_2_1_12_1","unstructured":"Andrew L. Rukhin Juan Soto James R. Nechvatal Miles E. Smid Stefan D. Leigh M. Levenson M. Vangel Nathanael A. Heckert and D. L. Banks. 2010. A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications. Special Publication (NIST SP) - 800-22 Rev 1a (Sept. 2010).  Andrew L. Rukhin Juan Soto James R. Nechvatal Miles E. Smid Stefan D. Leigh M. Levenson M. Vangel Nathanael A. Heckert and D. L. Banks. 2010. A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications. Special Publication (NIST SP) - 800-22 Rev 1a (Sept. 2010)."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.SP.800-90B"},{"key":"e_1_3_2_1_14_1","volume-title":"CHES 2010 (Lecture Notes in Computer Science), Stefan Mangard and Fran\u00e7ois-Xavier Standaert (Eds.). Springer Berlin Heidelberg, 351--365","author":"Varchola Michal","year":"2010","unstructured":"Michal Varchola and Milo\u0161 Drutarovsk\u00fd . 2010 . New High Entropy Element for FPGA Based True Random Number Generators. In Cryptographic Hardware and Embedded Systems , CHES 2010 (Lecture Notes in Computer Science), Stefan Mangard and Fran\u00e7ois-Xavier Standaert (Eds.). Springer Berlin Heidelberg, 351--365 . Michal Varchola and Milo\u0161 Drutarovsk\u00fd. 2010. New High Entropy Element for FPGA Based True Random Number Generators. In Cryptographic Hardware and Embedded Systems, CHES 2010 (Lecture Notes in Computer Science), Stefan Mangard and Fran\u00e7ois-Xavier Standaert (Eds.). Springer Berlin Heidelberg, 351--365."},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST.2017.8354001"},{"key":"e_1_3_2_1_16_1","first-page":"3","article-title":"ES-TRNG: A High-throughput, Low-area True Random Number Generator based on Edge Sampling","volume":"2018","author":"Yang Bohan","year":"2018","unstructured":"Bohan Yang , Vladimir Ro\u017ei\u0107 , Milo\u0161 Gruji\u0107 , Nele Mentens , and Ingrid Verbauwhede . 2018 . ES-TRNG: A High-throughput, Low-area True Random Number Generator based on Edge Sampling . IACR Transactions on Cryptographic Hardware and Embedded Systems 2018 , 3 (Aug. 2018), 267--292. Bohan Yang, Vladimir Ro\u017ei\u0107, Milo\u0161 Gruji\u0107, Nele Mentens, and Ingrid Verbauwhede. 2018. ES-TRNG: A High-throughput, Low-area True Random Number Generator based on Edge Sampling. IACR Transactions on Cryptographic Hardware and Embedded Systems 2018, 3 (Aug. 2018), 267--292.","journal-title":"IACR Transactions on Cryptographic Hardware and Embedded Systems"},{"key":"e_1_3_2_1_17_1","volume-title":"Automation Test in Europe Conference Exhibition (DATE). 127--132","author":"Yang Bohan","year":"2016","unstructured":"Bohan Yang , Vladimir Ro\u017ei\u0107 , Nele Mentens , Wim Dehaene , and Ingrid Verbauwhede . 2016 . TOTAL: TRNG on-the-fly testing for attack detection using Lightweight hardware. In 2016 Design , Automation Test in Europe Conference Exhibition (DATE). 127--132 . Bohan Yang, Vladimir Ro\u017ei\u0107, Nele Mentens, Wim Dehaene, and Ingrid Verbauwhede. 2016. TOTAL: TRNG on-the-fly testing for attack detection using Lightweight hardware. In 2016 Design, Automation Test in Europe Conference Exhibition (DATE). 127--132."}],"event":{"name":"DAC '19: The 56th Annual Design Automation Conference 2019","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA","SIGBED ACM Special Interest Group on Embedded Systems"],"location":"Las Vegas NV USA","acronym":"DAC '19"},"container-title":["Proceedings of the 56th Annual Design Automation Conference 2019"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3316781.3323482","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3316781.3323482","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T23:53:37Z","timestamp":1750204417000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3316781.3323482"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6,2]]},"references-count":16,"alternative-id":["10.1145\/3316781.3323482","10.1145\/3316781"],"URL":"https:\/\/doi.org\/10.1145\/3316781.3323482","relation":{},"subject":[],"published":{"date-parts":[[2019,6,2]]},"assertion":[{"value":"2019-06-02","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}