{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,5]],"date-time":"2026-02-05T10:42:41Z","timestamp":1770288161098,"version":"3.49.0"},"reference-count":108,"publisher":"Association for Computing Machinery (ACM)","issue":"3","license":[{"start":{"date-parts":[[2019,7,18]],"date-time":"2019-07-18T00:00:00Z","timestamp":1563408000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["ACM Trans. Softw. Eng. Methodol."],"published-print":{"date-parts":[[2019,7,31]]},"abstract":"<jats:p>Random testing is a software testing technique through which programs are tested by generating and executing random inputs. Because of its unstructured nature, it is difficult to determine when to stop a random testing process. Faults may be missed if the process is stopped prematurely, and resources may be wasted if the process is run too long. In this article, we propose two promising termination criteria, \u201cAll Equivalent\u201d (AEQ) and \u201cAll Included in One\u201d (AIO), applicable to random testing. These criteria stop random testing once the process has reached a code-coverage-based saturation point after which additional testing effort is unlikely to provide additional effectiveness. We model and implement them in the context of a general random testing process composed of independent random testing sessions. Thirty-six experiments involving GUI testing and unit testing of Java applications have demonstrated that the AEQ criteria is generally able to stop the process when a code coverage equal or very near to the saturation level is reached, while AIO is able to stop the process earlier in cases it reaches the saturation level of coverage. In addition, the performance of the two criteria has been compared against other termination criteria adopted in the literature.<\/jats:p>","DOI":"10.1145\/3339836","type":"journal-article","created":{"date-parts":[[2019,7,19]],"date-time":"2019-07-19T13:17:14Z","timestamp":1563542234000},"page":"1-52","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":10,"title":["Developing and Evaluating Objective Termination Criteria for Random Testing"],"prefix":"10.1145","volume":"28","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3264-185X","authenticated-orcid":false,"given":"Porfirio","family":"Tramontana","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Naples, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Domenico","family":"Amalfitano","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Naples, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicola","family":"Amatucci","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Naples, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Atif","family":"Memon","sequence":"additional","affiliation":[{"name":"Department of Computer Science, University of Maryland, Maryland, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anna Rita","family":"Fasolino","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Naples, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2019,7,18]]},"reference":[{"key":"e_1_2_1_1_1","first-page":"2015","article-title":"ISO\/IEC\/IEEE international standard--Software and systems engineering--Software testing--Part 4: Test techniques","volume":"29119","year":"2015","unstructured":"2015 . ISO\/IEC\/IEEE international standard--Software and systems engineering--Software testing--Part 4: Test techniques . ISO\/IEC\/IEEE 29119-4 : 2015 (Dec. 2015), 1--149. 2015. ISO\/IEC\/IEEE international standard--Software and systems engineering--Software testing--Part 4: Test techniques. ISO\/IEC\/IEEE 29119-4:2015 (Dec. 2015), 1--149.","journal-title":"ISO\/IEC\/IEEE"},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cor.2007.01.012"},{"key":"e_1_2_1_3_1","volume-title":"Proceedings of the 2nd ACM International Conference on Mobile Software Engineering and Systems (MOBILESoft\u201915)","author":"Amalfitano Domenico","unstructured":"Domenico Amalfitano , Nicola Amatucci , Anna Rita Fasolino , Porfirio Tramontana , Emily Kowalczyk , and Atif M. Memon . 2015. Exploiting the saturation effect in automatic random testing of android applications . In Proceedings of the 2nd ACM International Conference on Mobile Software Engineering and Systems (MOBILESoft\u201915) . IEEE Press, Los Alamitos, CA, 33--43. http:\/\/dl.acm.org\/citation.cfm?id&equals;2825041.2825046 Domenico Amalfitano, Nicola Amatucci, Anna Rita Fasolino, Porfirio Tramontana, Emily Kowalczyk, and Atif M. Memon. 2015. Exploiting the saturation effect in automatic random testing of android applications. In Proceedings of the 2nd ACM International Conference on Mobile Software Engineering and Systems (MOBILESoft\u201915). IEEE Press, Los Alamitos, CA, 33--43. http:\/\/dl.acm.org\/citation.cfm?id&equals;2825041.2825046"},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/2351676.2351717"},{"key":"e_1_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2018.08.007"},{"key":"e_1_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2008.12"},{"key":"e_1_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.44"},{"key":"e_1_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/2001420.2001452"},{"key":"e_1_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.85"},{"key":"e_1_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1486"},{"key":"e_1_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-013-9249-9"},{"key":"e_1_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.121"},{"key":"e_1_2_1_13_1","volume-title":"Visual Test 6 Bible","author":"Arnold Thomas R.","unstructured":"Thomas R. Arnold . 1998. Visual Test 6 Bible ( 1 st ed.). IDG Books Worldwide, Inc. , Foster City, CA . Thomas R. Arnold. 1998. Visual Test 6 Bible (1st ed.). IDG Books Worldwide, Inc., Foster City, CA.","edition":"1"},{"key":"e_1_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1145\/2351676.2351739"},{"key":"e_1_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/2635868.2635923"},{"key":"e_1_2_1_16_1","volume-title":"Proceedings of the 10th International Symposium on Software Reliability Engineering","author":"Briand L.","year":"1999","unstructured":"L. Briand and D. Pfahl . 1999. Using simulation for assessing the real impact of test coverage on defect coverage . In Proceedings of the 10th International Symposium on Software Reliability Engineering 1999 . 148--157. L. Briand and D. Pfahl. 1999. Using simulation for assessing the real impact of test coverage on defect coverage. In Proceedings of the 10th International Symposium on Software Reliability Engineering 1999. 148--157."},{"key":"e_1_2_1_17_1","volume-title":"Proceedings of the 15th IEEE International Conference on Automated Software Engineering (ASE\u201900)","author":"Bueno P. M. S.","unstructured":"P. M. S. Bueno and M. Jino . 2000. Identification of potentially infeasible program paths by monitoring the search for test data . In Proceedings of the 15th IEEE International Conference on Automated Software Engineering (ASE\u201900) . 209--218. P. M. S. Bueno and M. Jino. 2000. Identification of potentially infeasible program paths by monitoring the search for test data. In Proceedings of the 15th IEEE International Conference on Automated Software Engineering (ASE\u201900). 209--218."},{"key":"e_1_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1142\/S0218194002001074"},{"key":"e_1_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2015.2487274"},{"key":"e_1_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1145\/1083274.1083288"},{"key":"e_1_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.5555\/2337223.2337277"},{"key":"e_1_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1145\/2768829"},{"key":"e_1_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2006.04.017"},{"key":"e_1_2_1_24_1","volume-title":"Proceedings of the 3rd International Symposium on Software Metrics: From Measurement to Empirical Results (METRICS\u201996)","author":"Chen Mei-Hwa","unstructured":"Mei-Hwa Chen , M. R. Lyu , and W. E. Wong . 1996. An empirical study of the correlation between code coverage and reliability estimation . In Proceedings of the 3rd International Symposium on Software Metrics: From Measurement to Empirical Results (METRICS\u201996) . IEEE Computer Society, Los Alamitos, CA, 133--. http:\/\/dl.acm.org\/citation.cfm?id&equals;525586.823872 Mei-Hwa Chen, M. R. Lyu, and W. E. Wong. 1996. An empirical study of the correlation between code coverage and reliability estimation. In Proceedings of the 3rd International Symposium on Software Metrics: From Measurement to Empirical Results (METRICS\u201996). IEEE Computer Society, Los Alamitos, CA, 133--. http:\/\/dl.acm.org\/citation.cfm?id&equals;525586.823872"},{"key":"e_1_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.5555\/829522.830932"},{"key":"e_1_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/32.489081"},{"key":"e_1_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.02.022"},{"key":"e_1_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1145\/1363102.1363107"},{"key":"e_1_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0164-1212(01)00028-0"},{"key":"e_1_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1145\/1273463.1273476"},{"key":"e_1_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2008.20"},{"key":"e_1_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.415"},{"key":"e_1_2_1_33_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1986.6312914"},{"key":"e_1_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1016\/0164-1212(87)90015-X"},{"key":"e_1_2_1_35_1","doi-asserted-by":"publisher","DOI":"10.2307\/2340521"},{"key":"e_1_2_1_36_1","volume-title":"Proceedings of the 4th Conference on USENIX Windows Systems Symposium\u2014Volume 4 (WSS\u201900)","author":"Justin","unstructured":"Justin E. Forrester and Barton P. Miller. 2000. An empirical study of the robustness of windows NT applications using random testing . In Proceedings of the 4th Conference on USENIX Windows Systems Symposium\u2014Volume 4 (WSS\u201900) . USENIX Association, Berkeley, CA, 6--6. http:\/\/dl.acm.org\/citation.cfm?id&equals;1267102.1267108 Justin E. Forrester and Barton P. Miller. 2000. An empirical study of the robustness of windows NT applications using random testing. In Proceedings of the 4th Conference on USENIX Windows Systems Symposium\u2014Volume 4 (WSS\u201900). USENIX Association, Berkeley, CA, 6--6. http:\/\/dl.acm.org\/citation.cfm?id&equals;1267102.1267108"},{"key":"e_1_2_1_37_1","doi-asserted-by":"publisher","DOI":"10.1145\/288195.288298"},{"key":"e_1_2_1_38_1","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2011.19"},{"key":"e_1_2_1_39_1","volume-title":"Proceedings of the 2012 34th International Conference on Software Engineering (ICSE\u201912)","author":"Fraser G.","unstructured":"G. Fraser and A. Arcuri . 2012. Sound empirical evidence in software testing . In Proceedings of the 2012 34th International Conference on Software Engineering (ICSE\u201912) . 178--188. G. Fraser and A. Arcuri. 2012. Sound empirical evidence in software testing. In Proceedings of the 2012 34th International Conference on Software Engineering (ICSE\u201912). 178--188."},{"key":"e_1_2_1_40_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.14"},{"key":"e_1_2_1_41_1","volume-title":"Proceedings of the ICSE Workshop on Automation of Software Test (AST\u201909)","author":"Fraser G.","unstructured":"G. Fraser and A. Gargantini . 2009. Experiments on the test case length in specification based test case generation . In Proceedings of the ICSE Workshop on Automation of Software Test (AST\u201909) . 18--26. G. Fraser and A. Gargantini. 2009. Experiments on the test case length in specification based test case generation. In Proceedings of the ICSE Workshop on Automation of Software Test (AST\u201909). 18--26."},{"key":"e_1_2_1_42_1","doi-asserted-by":"publisher","DOI":"10.1145\/2480362.2480590"},{"key":"e_1_2_1_43_1","doi-asserted-by":"publisher","DOI":"10.1109\/STRQA.1994.526380"},{"key":"e_1_2_1_44_1","first-page":"6","article-title":"Automatic test data generation for data flow testing using a genetic algorithm","volume":"11","author":"Girgis Moheb R.","year":"2005","unstructured":"Moheb R. Girgis . 2005 . Automatic test data generation for data flow testing using a genetic algorithm . Journal of Universal Computer Science (JUCS) 11 , 6 (Jun. 2005), 898--915. Moheb R. Girgis. 2005. Automatic test data generation for data flow testing using a genetic algorithm. Journal of Universal Computer Science (JUCS) 11, 6 (Jun. 2005), 898--915.","journal-title":"Journal of Universal Computer Science (JUCS)"},{"key":"e_1_2_1_45_1","doi-asserted-by":"publisher","DOI":"10.1145\/1379022.1375607"},{"key":"e_1_2_1_46_1","doi-asserted-by":"publisher","DOI":"10.1145\/1064978.1065036"},{"key":"e_1_2_1_47_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1985.232177"},{"key":"e_1_2_1_48_1","doi-asserted-by":"publisher","DOI":"10.5555\/851006.856038"},{"key":"e_1_2_1_49_1","volume-title":"Proceedings of the 3rd IEEE International High-Assurance Systems Engineering Symposium","author":"Gokhale S. S.","year":"1998","unstructured":"S. S. Gokhale and K. S. Trivedi . 1998. Log-logistic software reliability growth model . In Proceedings of the 3rd IEEE International High-Assurance Systems Engineering Symposium 1998 . 34--41. S. S. Gokhale and K. S. Trivedi. 1998. Log-logistic software reliability growth model. In Proceedings of the 3rd IEEE International High-Assurance Systems Engineering Symposium 1998. 34--41."},{"key":"e_1_2_1_50_1","doi-asserted-by":"publisher","DOI":"10.1145\/2338965.2336763"},{"key":"e_1_2_1_51_1","doi-asserted-by":"publisher","DOI":"10.5555\/2337223.2337435"},{"key":"e_1_2_1_52_1","doi-asserted-by":"publisher","DOI":"10.1145\/2338965.2336762"},{"key":"e_1_2_1_53_1","doi-asserted-by":"publisher","DOI":"10.5555\/851033.856318"},{"key":"e_1_2_1_54_1","doi-asserted-by":"publisher","DOI":"10.5555\/367072.367295"},{"key":"e_1_2_1_55_1","volume-title":"Proceedings of the 2001 International Symposium on Quality Electronic Design. 31--37","author":"Hajjar A.","unstructured":"A. Hajjar , T. Chen , I. Munn , A. Andrews , and M. Bjorkman . 2001. Stopping criteria comparison: Towards high quality behavioral verification . In Proceedings of the 2001 International Symposium on Quality Electronic Design. 31--37 . A. Hajjar, T. Chen, I. Munn, A. Andrews, and M. Bjorkman. 2001. Stopping criteria comparison: Towards high quality behavioral verification. In Proceedings of the 2001 International Symposium on Quality Electronic Design. 31--37."},{"key":"e_1_2_1_56_1","doi-asserted-by":"publisher","DOI":"10.1145\/1145735.1145737"},{"key":"e_1_2_1_57_1","volume-title":"Random Testing","author":"Hamlet Richard","unstructured":"Richard Hamlet . 2002. Random Testing . John Wiley 8 Sons, New York, NY. Richard Hamlet. 2002. Random Testing. John Wiley 8 Sons, New York, NY."},{"key":"e_1_2_1_58_1","doi-asserted-by":"publisher","DOI":"10.1145\/2594368.2594390"},{"key":"e_1_2_1_59_1","volume-title":"Proceedings of the ICSE Workshop on Automation of Software Test (AST\u201909)","author":"Hofer B.","unstructured":"B. Hofer , B. Peischl , and F. Wotawa . 2009. GUI savvy end-to-end testing with smart monkeys . In Proceedings of the ICSE Workshop on Automation of Software Test (AST\u201909) . 130--137. B. Hofer, B. Peischl, and F. Wotawa. 2009. GUI savvy end-to-end testing with smart monkeys. In Proceedings of the ICSE Workshop on Automation of Software Test (AST\u201909). 130--137."},{"key":"e_1_2_1_60_1","doi-asserted-by":"publisher","DOI":"10.5555\/851010.856114"},{"key":"e_1_2_1_61_1","doi-asserted-by":"publisher","DOI":"10.5555\/257734.257766"},{"key":"e_1_2_1_62_1","volume-title":"Proceedings of the 1st International Conference on Software Testing, Reliability and Quality Assurance","author":"Jalote P.","year":"1994","unstructured":"P. Jalote and Y. R. Muralidhara . 1994. A coverage based model for software reliability estimation . In Proceedings of the 1st International Conference on Software Testing, Reliability and Quality Assurance 1994 . 6--10. P. Jalote and Y. R. Muralidhara. 1994. A coverage based model for software reliability estimation. In Proceedings of the 1st International Conference on Software Testing, Reliability and Quality Assurance 1994. 6--10."},{"key":"e_1_2_1_63_1","volume-title":"Proceedings of the 1996 Conference of the Centre for Advanced Studies on Collaborative Research (CASCON\u201996)","author":"Krishnamurthy Saileshwar","year":"2052","unstructured":"Saileshwar Krishnamurthy and Aditya P. Mathur . 1996. On predicting reliability of modules using code coverage . In Proceedings of the 1996 Conference of the Centre for Advanced Studies on Collaborative Research (CASCON\u201996) . IBM Press, 22-. http:\/\/dl.acm.org\/citation.cfm?id&equals;78 2052 .782074 Saileshwar Krishnamurthy and Aditya P. Mathur. 1996. On predicting reliability of modules using code coverage. In Proceedings of the 1996 Conference of the Centre for Advanced Studies on Collaborative Research (CASCON\u201996). IBM Press, 22-. http:\/\/dl.acm.org\/citation.cfm?id&equals;782052.782074"},{"key":"e_1_2_1_64_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2004.47"},{"key":"e_1_2_1_65_1","doi-asserted-by":"publisher","DOI":"10.5555\/377866.377872"},{"key":"e_1_2_1_66_1","doi-asserted-by":"publisher","DOI":"10.1109\/32.637384"},{"key":"e_1_2_1_67_1","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2010.61"},{"key":"e_1_2_1_68_1","volume-title":"Proceedings of the 2nd International Conference on Computer Engineering and Technology (ICCET\u201910)","volume":"2","author":"Liu Z.","unstructured":"Z. Liu , X. Gao , and X. Long . 2010. Adaptive random testing of mobile application . In Proceedings of the 2nd International Conference on Computer Engineering and Technology (ICCET\u201910) , Vol. 2 . IEEE, V2--297. Z. Liu, X. Gao, and X. Long. 2010. Adaptive random testing of mobile application. In Proceedings of the 2nd International Conference on Computer Engineering and Technology (ICCET\u201910), Vol. 2. IEEE, V2--297."},{"key":"e_1_2_1_69_1","unstructured":"Michael R Lyu etal 1996. Handbook of Software Reliability Engineering. Vol. 222. IEEE Computer Society Los Alamitos CA.   Michael R Lyu et al. 1996. Handbook of Software Reliability Engineering. Vol. 222. IEEE Computer Society Los Alamitos CA."},{"key":"e_1_2_1_70_1","doi-asserted-by":"publisher","DOI":"10.5555\/951952.952379"},{"key":"e_1_2_1_71_1","volume-title":"Proceedings of the 2015 30th IEEE\/ACM International Conference on Automated Software Engineering (ASE\u201915)","author":"Ma L.","unstructured":"L. Ma , C. Artho , C. Zhang , H. Sato , J. Gmeiner , and R. Ramler . 2015. GRT: Program-analysis-guided random testing (T) . In Proceedings of the 2015 30th IEEE\/ACM International Conference on Automated Software Engineering (ASE\u201915) . 212--223. L. Ma, C. Artho, C. Zhang, H. Sato, J. Gmeiner, and R. Ramler. 2015. GRT: Program-analysis-guided random testing (T). In Proceedings of the 2015 30th IEEE\/ACM International Conference on Automated Software Engineering (ASE\u201915). 212--223."},{"key":"e_1_2_1_72_1","doi-asserted-by":"publisher","DOI":"10.1145\/2491411.2491450"},{"key":"e_1_2_1_73_1","doi-asserted-by":"publisher","DOI":"10.1145\/2635868.2635896"},{"key":"e_1_2_1_74_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2002.804489"},{"key":"e_1_2_1_75_1","volume-title":"Proceedings of the 5th International Symposium on Software Reliability Engineering","author":"Malaiya Y. K.","year":"1994","unstructured":"Y. K. Malaiya , Naixin Li , J. Bieman , R. Karcich , and B. Skibbe . 1994. The relationship between test coverage and reliability . In Proceedings of the 5th International Symposium on Software Reliability Engineering 1994 . 186--195. Y. K. Malaiya, Naixin Li, J. Bieman, R. Karcich, and B. Skibbe. 1994. The relationship between test coverage and reliability. In Proceedings of the 5th International Symposium on Software Reliability Engineering 1994. 186--195."},{"key":"e_1_2_1_76_1","doi-asserted-by":"publisher","DOI":"10.5555\/786446.786465"},{"key":"e_1_2_1_77_1","doi-asserted-by":"publisher","DOI":"10.1023\/B:SQJO.0000024059.72478.4e"},{"key":"e_1_2_1_78_1","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1538"},{"key":"e_1_2_1_79_1","volume-title":"Advances in Computers","author":"Mariani Leonardo","unstructured":"Leonardo Mariani , Mauro Pezz\u00c3l , and Daniele Zuddas . 2015. Recent advances in automatic black-box testing . In Advances in Computers , Vol. 99 . Elsevier , 157--193. Leonardo Mariani, Mauro Pezz\u00c3l, and Daniele Zuddas. 2015. Recent advances in automatic black-box testing. In Advances in Computers, Vol. 99. Elsevier, 157--193."},{"key":"e_1_2_1_80_1","doi-asserted-by":"publisher","DOI":"10.1145\/1831708.1831730"},{"key":"e_1_2_1_81_1","doi-asserted-by":"publisher","DOI":"10.1109\/52.877876"},{"key":"e_1_2_1_82_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2005.06.006"},{"key":"e_1_2_1_83_1","volume-title":"Randomized Algorithms","author":"Motwani Rajeev","unstructured":"Rajeev Motwani and Prabhakar Raghavan . 1995. Randomized Algorithms . Cambridge University Press , New York, NY . Rajeev Motwani and Prabhakar Raghavan. 1995. Randomized Algorithms. Cambridge University Press, New York, NY."},{"key":"e_1_2_1_84_1","doi-asserted-by":"publisher","DOI":"10.1145\/1572272.1572280"},{"key":"e_1_2_1_85_1","doi-asserted-by":"publisher","DOI":"10.1109\/32.962563"},{"key":"e_1_2_1_86_1","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2005.55"},{"key":"e_1_2_1_87_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2012.100"},{"key":"e_1_2_1_88_1","doi-asserted-by":"publisher","DOI":"10.1145\/2593882.2593885"},{"key":"e_1_2_1_89_1","doi-asserted-by":"publisher","DOI":"10.1007\/11531142_22"},{"key":"e_1_2_1_90_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2007.37"},{"key":"e_1_2_1_91_1","doi-asserted-by":"publisher","DOI":"10.1145\/78973.78974"},{"key":"e_1_2_1_93_1","doi-asserted-by":"publisher","DOI":"10.5555\/257572.257635"},{"key":"e_1_2_1_94_1","volume-title":"Proceedings of the 8th International Conference on Software Engineering (ICSE\u201985)","author":"Ramsey James","unstructured":"James Ramsey and Victor R. Basili . 1985. Analyzing the test process using structural coverage . In Proceedings of the 8th International Conference on Software Engineering (ICSE\u201985) . IEEE Computer Society Press, Los Alamitos, CA, 306--312. James Ramsey and Victor R. Basili. 1985. Analyzing the test process using structural coverage. In Proceedings of the 8th International Conference on Software Engineering (ICSE\u201985). IEEE Computer Society Press, Los Alamitos, CA, 306--312."},{"key":"e_1_2_1_95_1","doi-asserted-by":"publisher","DOI":"10.1109\/ITNG.2010.95"},{"key":"e_1_2_1_96_1","doi-asserted-by":"publisher","DOI":"10.1145\/2594368.2594377"},{"key":"e_1_2_1_97_1","doi-asserted-by":"publisher","DOI":"10.5555\/2821339.2821346"},{"key":"e_1_2_1_98_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.818548"},{"key":"e_1_2_1_99_1","volume-title":"Proceedings of the 1999 IEEE Aerospace Conference","volume":"5","author":"Sahinoglu M.","unstructured":"M. Sahinoglu , A. von Mayrhauser , A. Hajjar , T. Chen , and C. Anderson . 1999. On the efficiency of a compound Poisson stopping rule for mixed strategy testing . In Proceedings of the 1999 IEEE Aerospace Conference , Vol. 5 . 93--98 vol. 5. M. Sahinoglu, A. von Mayrhauser, A. Hajjar, T. Chen, and C. Anderson. 1999. On the efficiency of a compound Poisson stopping rule for mixed strategy testing. In Proceedings of the 1999 IEEE Aerospace Conference, Vol. 5. 93--98 vol. 5."},{"key":"e_1_2_1_100_1","doi-asserted-by":"publisher","DOI":"10.5555\/1987434.1987460"},{"key":"e_1_2_1_101_1","doi-asserted-by":"publisher","DOI":"10.1145\/1595696.1595706"},{"key":"e_1_2_1_102_1","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.4370010203"},{"key":"e_1_2_1_103_1","doi-asserted-by":"publisher","DOI":"10.5555\/2663608.2663610"},{"key":"e_1_2_1_104_1","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.4370040103"},{"key":"e_1_2_1_105_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2010.34"},{"key":"e_1_2_1_106_1","series-title":"Lecture Notes in Computer Science","volume-title":"Is branch coverage a good measure of testing effectiveness? In Empirical Software Engineering and Verification, Bertrand Meyer and Martin Nordio (Eds.)","author":"Wei Yi","unstructured":"Yi Wei , Bertrand Meyer , and Manuel Oriol . 2012. Is branch coverage a good measure of testing effectiveness? In Empirical Software Engineering and Verification, Bertrand Meyer and Martin Nordio (Eds.) . Lecture Notes in Computer Science , Vol. 7007 . Springer , Berlin , 194--212. Yi Wei, Bertrand Meyer, and Manuel Oriol. 2012. Is branch coverage a good measure of testing effectiveness? In Empirical Software Engineering and Verification, Bertrand Meyer and Martin Nordio (Eds.). Lecture Notes in Computer Science, Vol. 7007. Springer, Berlin, 194--212."},{"key":"e_1_2_1_107_1","doi-asserted-by":"publisher","DOI":"10.1109\/32.83906"},{"key":"e_1_2_1_108_1","doi-asserted-by":"publisher","DOI":"10.1109\/32.328991"},{"key":"e_1_2_1_109_1","doi-asserted-by":"crossref","unstructured":"C. Wohlin P. Runeson M. H\u00f6st M. C. Ohlsson B. Regnell and A. Wessl\u00e9n. 2012. Experimentation in Software Engineering. Springer Berlin.   C. Wohlin P. Runeson M. H\u00f6st M. C. Ohlsson B. Regnell and A. Wessl\u00e9n. 2012. Experimentation in Software Engineering. Springer Berlin.","DOI":"10.1007\/978-3-642-29044-2"}],"container-title":["ACM Transactions on Software Engineering and Methodology"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3339836","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3339836","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T00:26:10Z","timestamp":1750206370000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3339836"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7,18]]},"references-count":108,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2019,7,31]]}},"alternative-id":["10.1145\/3339836"],"URL":"https:\/\/doi.org\/10.1145\/3339836","relation":{},"ISSN":["1049-331X","1557-7392"],"issn-type":[{"value":"1049-331X","type":"print"},{"value":"1557-7392","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,7,18]]},"assertion":[{"value":"2018-03-01","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2019-05-01","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2019-07-18","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}