{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:26:28Z","timestamp":1750220788864,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":14,"publisher":"ACM","license":[{"start":{"date-parts":[[2020,7,13]],"date-time":"2020-07-13T00:00:00Z","timestamp":1594598400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2020,7,13]]},"DOI":"10.1145\/3387904.3389299","type":"proceedings-article","created":{"date-parts":[[2020,9,12]],"date-time":"2020-09-12T20:04:38Z","timestamp":1599941078000},"page":"436-440","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["BugVis"],"prefix":"10.1145","author":[{"given":"David","family":"Bowes","sequence":"first","affiliation":[{"name":"Lancaster University, Lancaster, United Kingdom"}]},{"given":"Jean","family":"Petri\u0107","sequence":"additional","affiliation":[{"name":"Lancaster University, Lancaster, United Kingdom"}]},{"given":"Tracy","family":"Hall","sequence":"additional","affiliation":[{"name":"Lancaster University, Lancaster, United Kingdom"}]}],"member":"320","published-online":{"date-parts":[[2020,9,12]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"Getting Defect Prediction Into Industrial Practice: the ELFF Tool. In 2017 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW). 44--47","author":"Bowes D.","year":"2017","unstructured":"D. Bowes , S. Counsell , T. Hall , J. Petric , and T. Shippey . 2017 . Getting Defect Prediction Into Industrial Practice: the ELFF Tool. In 2017 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW). 44--47 . https:\/\/doi.org\/10.1109\/ISSREW. 2017 .11 10.1109\/ISSREW.2017.11 D. Bowes, S. Counsell, T. Hall, J. Petric, and T. Shippey. 2017. Getting Defect Prediction Into Industrial Practice: the ELFF Tool. In 2017 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW). 44--47. https:\/\/doi.org\/10.1109\/ISSREW.2017.11"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1186\/2195-1721-2-1"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/1370750.1370755"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/CSMR.2012.68"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2628055"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2007.45"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"crossref","unstructured":"Thomas D LaToza and Brad A Myers. 2010. Hard-to-answer questions about code. In Evaluation and Usability of Programming Languages and Tools. 1--6.  Thomas D LaToza and Brad A Myers. 2010. Hard-to-answer questions about code. In Evaluation and Usability of Programming Languages and Tools. 1--6.","DOI":"10.1145\/1937117.1937125"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2013.6693150"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/VISSOFT.2013.6650547"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/1081706.1081725"},{"key":"e_1_3_2_1_11_1","volume-title":"When do changes induce fixes? ACM sigsoft software engineering notes 30, 4","author":"\u015aliwerski Jacek","year":"2005","unstructured":"Jacek \u015aliwerski , Thomas Zimmermann , and Andreas Zeller . 2005. When do changes induce fixes? ACM sigsoft software engineering notes 30, 4 ( 2005 ), 1--5. Jacek \u015aliwerski, Thomas Zimmermann, and Andreas Zeller. 2005. When do changes induce fixes? ACM sigsoft software engineering notes 30, 4 (2005), 1--5."},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/1370750.1370754"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/2858036.2858442"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/VLHCC.2013.6645254"}],"event":{"name":"ICPC '20: 28th International Conference on Program Comprehension","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","IEEE CS"],"location":"Seoul Republic of Korea","acronym":"ICPC '20"},"container-title":["Proceedings of the 28th International Conference on Program Comprehension"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3387904.3389299","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3387904.3389299","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T22:41:42Z","timestamp":1750200102000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3387904.3389299"}},"subtitle":["Commit Slicing for Fault Visualisation"],"short-title":[],"issued":{"date-parts":[[2020,7,13]]},"references-count":14,"alternative-id":["10.1145\/3387904.3389299","10.1145\/3387904"],"URL":"https:\/\/doi.org\/10.1145\/3387904.3389299","relation":{},"subject":[],"published":{"date-parts":[[2020,7,13]]},"assertion":[{"value":"2020-09-12","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}