{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:25:47Z","timestamp":1750220747116,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":29,"publisher":"ACM","license":[{"start":{"date-parts":[[2020,6,27]],"date-time":"2020-06-27T00:00:00Z","timestamp":1593216000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/501100009077","name":"ITEA3","doi-asserted-by":"publisher","award":["16032"],"award-info":[{"award-number":["16032"]}],"id":[{"id":"10.13039\/501100009077","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2020,6,27]]},"DOI":"10.1145\/3387940.3392210","type":"proceedings-article","created":{"date-parts":[[2020,9,25]],"date-time":"2020-09-25T15:22:31Z","timestamp":1601047351000},"page":"742-745","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Mutant Density"],"prefix":"10.1145","author":[{"given":"Ali","family":"Parsai","sequence":"first","affiliation":[{"name":"University of Antwerp and FlandersMake, Antwerp, Belgium"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Serge","family":"Demeyer","sequence":"additional","affiliation":[{"name":"University of Antwerp and FlandersMake, Antwerp, Belgium"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2020,9,25]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2008.73"},{"volume-title":"Proceedings of the 27th international conference on Software engineering - ICSE '05 (St","year":"2005","author":"Andrews James H.","key":"e_1_3_2_1_2_1"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/CSMR-WCRE.2014.6747165"},{"volume-title":"ExMAn: A Generic and Customizable Framework for Experimental Mutation Analysis. In Second Workshop on Mutation Analysis (Mutation 2006 - ISSRE Workshops 2006)","year":"2006","author":"Bradbury Jeremy S.","key":"e_1_3_2_1_4_1"},{"key":"e_1_3_2_1_5_1","volume-title":"Two New Kinds of Class Level Mutants for Object-Oriented Programs. In 2006 IEEE International Conference on Systems, Man and Cybernetics","volume":"3","author":"Chen Huo Yan","year":"2006"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2016.147"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1002\/spe.1043"},{"volume-title":"Sooftware Business, Jo\u00e3o M","author":"Hyrynsalmi Sami","key":"e_1_3_2_1_8_1"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.62"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/2635868.2635929"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1987.233164"},{"key":"e_1_3_2_1_12_1","first-page":"7","article-title":"A fortran language system for mutation-based software testing. Software","volume":"21","author":"King Kim N.","year":"1991","journal-title":"Practice and Experience"},{"volume-title":"Software Metrics Suites for Project Landscapes. In 2009 13th European Conference on Software Maintenance and Reengineering. 317--318","year":"2009","author":"Lajios G.","key":"e_1_3_2_1_13_1"},{"volume-title":"13th International Symposium on Software Reliability Engineering, 2002. Proceedings. IEEE Comput. Soc, 352--363","year":"2002","author":"Ma Yu-Seung","key":"e_1_3_2_1_14_1"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1976.233837"},{"volume-title":"Proceedings of the 2014 ACM International Workshop on Software-Defined Ecosystems","author":"Monteith John Yates","key":"e_1_3_2_1_16_1"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1145\/1985362.1985364"},{"volume-title":"Yves Le Traon, and Mark Harman","year":"2018","author":"Papadakis Mike","key":"e_1_3_2_1_18_1"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-10801-4_33"},{"volume-title":"Testing Software and Systems, Inmaculada Medina-Bulo, Mercedes G","author":"Parsai Ali","key":"e_1_3_2_1_20_1"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1145\/2915970.2915992"},{"volume-title":"LittleDarwin: A Feature-Rich and Extensible Mutation Testing Framework for Large and Complex Java Systems. In Fundamentals of Software Engineering: 7th International Conference, FSEN 2017","year":"2017","author":"Parsai Ali","key":"e_1_3_2_1_22_1"},{"volume-title":"Mutation-Based Testing of Format String Bugs. In 2008 11th IEEE High Assurance Systems Engineering Symposium (HASE '08)","year":"2008","author":"Shahriar Hossain","key":"e_1_3_2_1_23_1"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2012.6261240"},{"volume-title":"Software Engineering: Software Engineering in Practice (ICSE-SEIP). 81--90. https:\/\/doi.org\/10.1109\/ICSE-SEIP.2019.00017","year":"2019","author":"St\u00c3\u011bhl D.","key":"e_1_3_2_1_25_1"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2016.25"},{"volume-title":"v. d. Meulen and M. A. Revilla","year":"2007","author":"M. J.","key":"e_1_3_2_1_27_1"},{"volume-title":"Mutation-Based Testing of Integer Overflow Vulnerabilities. In 2009 5th International Conference on Wireless Communications, Networking and Mobile Computing (WiCOM'09)","year":"2009","author":"Zeng Fanping","key":"e_1_3_2_1_28_1"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2007.28"}],"event":{"name":"ICSE '20: 42nd International Conference on Software Engineering","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","KIISE Korean Institute of Information Scientists and Engineers","IEEE CS"],"location":"Seoul Republic of Korea","acronym":"ICSE '20"},"container-title":["Proceedings of the IEEE\/ACM 42nd International Conference on Software Engineering Workshops"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3387940.3392210","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3387940.3392210","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T22:38:47Z","timestamp":1750199927000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3387940.3392210"}},"subtitle":["A Measure of Fault-Sensitive Complexity"],"short-title":[],"issued":{"date-parts":[[2020,6,27]]},"references-count":29,"alternative-id":["10.1145\/3387940.3392210","10.1145\/3387940"],"URL":"https:\/\/doi.org\/10.1145\/3387940.3392210","relation":{},"subject":[],"published":{"date-parts":[[2020,6,27]]},"assertion":[{"value":"2020-09-25","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}