{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:26:11Z","timestamp":1750220771952,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":6,"publisher":"ACM","license":[{"start":{"date-parts":[[2020,6,8]],"date-time":"2020-06-08T00:00:00Z","timestamp":1591574400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2020,6,8]]},"DOI":"10.1145\/3393691.3394185","type":"proceedings-article","created":{"date-parts":[[2020,6,8]],"date-time":"2020-06-08T22:04:07Z","timestamp":1591653847000},"page":"25-26","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":10,"title":["Fast Dimensional Analysis for Root Cause Investigation in a Large-Scale Service Environment"],"prefix":"10.1145","author":[{"given":"Fan","family":"Lin","sequence":"first","affiliation":[{"name":"Facebook Inc., Menlo Park, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Keyur","family":"Muzumdar","sequence":"additional","affiliation":[{"name":"Facebook Inc., Menlo Park, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nikolay Pavlovich","family":"Laptev","sequence":"additional","affiliation":[{"name":"Facebook Inc., Menlo Park, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mihai-Valentin","family":"Curelea","sequence":"additional","affiliation":[{"name":"Facebook Inc., Menlo Park, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seunghak","family":"Lee","sequence":"additional","affiliation":[{"name":"Facebook Inc., Menlo Park, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sriram","family":"Sankar","sequence":"additional","affiliation":[{"name":"Facebook Inc., Menlo Park, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2020,6,8]]},"reference":[{"key":"e_1_3_2_2_1_1","doi-asserted-by":"publisher","DOI":"10.14778\/2536222.2536231"},{"volume-title":"ACM SIGMOD International Conference on Management of Data.","author":"Agrawal R.","key":"e_1_3_2_2_2_1","unstructured":"R. Agrawal , T. Imielinski , and A. Swami . 1993. Mining association rules between sets of items in large databases . In ACM SIGMOD International Conference on Management of Data. R. Agrawal, T. Imielinski, and A. Swami. 1993. Mining association rules between sets of items in large databases. In ACM SIGMOD International Conference on Management of Data."},{"key":"e_1_3_2_2_3_1","volume":"199","author":"Bay S.D.","unstructured":"S.D. Bay and M. J. Pazzani. 199 9. Detecting change in categorical data: mining contrast sets. In ACM SIGKDD International Conference on Knowledge Discovery and Data Mining. S.D. Bay and M.J. Pazzani. 1999. Detecting change in categorical data: mining contrast sets. In ACM SIGKDD International Conference on Knowledge Discovery and Data Mining.","journal-title":"J. Pazzani."},{"key":"e_1_3_2_2_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/253260.253325"},{"key":"e_1_3_2_2_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/3106237.3106306"},{"key":"e_1_3_2_2_6_1","volume-title":"Mining Frequent Patterns Without Candidate Generation. In ACM SIGMOD International Conference on Management of Data.","author":"Han Jiawei","year":"2000","unstructured":"Jiawei Han , Jian Pei ,, and Yiwen Yin . 2000 . Mining Frequent Patterns Without Candidate Generation. In ACM SIGMOD International Conference on Management of Data. Jiawei Han, Jian Pei,, and Yiwen Yin. 2000. Mining Frequent Patterns Without Candidate Generation. In ACM SIGMOD International Conference on Management of Data."}],"event":{"name":"SIGMETRICS '20: ACM SIGMETRICS \/ International Conference on Measurement and Modeling of Computer Systems","sponsor":["SIGMETRICS ACM Special Interest Group on Measurement and Evaluation"],"location":"Boston MA USA","acronym":"SIGMETRICS '20"},"container-title":["Abstracts of the 2020 SIGMETRICS\/Performance Joint International Conference on Measurement and Modeling of Computer Systems"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3393691.3394185","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3393691.3394185","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T22:41:17Z","timestamp":1750200077000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3393691.3394185"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6,8]]},"references-count":6,"alternative-id":["10.1145\/3393691.3394185","10.1145\/3393691"],"URL":"https:\/\/doi.org\/10.1145\/3393691.3394185","relation":{},"subject":[],"published":{"date-parts":[[2020,6,8]]},"assertion":[{"value":"2020-06-08","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}