{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:20:53Z","timestamp":1750220453326,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":23,"publisher":"ACM","license":[{"start":{"date-parts":[[2021,1,18]],"date-time":"2021-01-18T00:00:00Z","timestamp":1610928000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100014036","name":"Multidisciplinary University Research Initiative","doi-asserted-by":"publisher","award":["N00014-16-R-FO05"],"award-info":[{"award-number":["N00014-16-R-FO05"]}],"id":[{"id":"10.13039\/100014036","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2021,1,18]]},"DOI":"10.1145\/3394885.3431615","type":"proceedings-article","created":{"date-parts":[[2021,1,29]],"date-time":"2021-01-29T11:32:46Z","timestamp":1611919966000},"page":"305-310","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Merged Logic and Memory Fabrics for AI Workloads"],"prefix":"10.1145","author":[{"given":"Brian","family":"Crafton","sequence":"first","affiliation":[{"name":"ECE Department, Georgia Tech"}]},{"given":"Samuel","family":"Spetalnick","sequence":"additional","affiliation":[{"name":"ECE Department, Georgia Tech"}]},{"given":"Arijit","family":"Raychowdhury","sequence":"additional","affiliation":[{"name":"ECE Department, Georgia Tech"}]}],"member":"320","published-online":{"date-parts":[[2021,1,29]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/23\/7\/075201"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/2463585.2463589"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2616357"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001140"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2020.3016587"},{"volume-title":"Breaking Barriers: Maximizing Array Utilization for Compute In-Memory Fabrics. In 2020 IFIP\/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SoC). IEEE.","year":"2020","author":"Crafton Brian","key":"e_1_3_2_1_6_1"},{"volume-title":"Counting Cards: Exploiting Weight and Variance Distributions for Robust Compute In-Memory. arXiv preprint arXiv:2006.03117","year":"2020","author":"Crafton Brian","key":"e_1_3_2_1_7_1"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.5555\/3122009.3242044"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/3079856.3080246"},{"volume-title":"Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 1769--1774","year":"2019","author":"Long Yun","key":"e_1_3_2_1_11_1"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9181022"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838346"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2019.8702715"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001139"},{"volume-title":"Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 1423--1428","year":"2018","author":"Sun Xiaoyu","key":"e_1_3_2_1_16_1"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2019.2933148"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2070050"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614513"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1145\/3307650.3322271"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3015178"},{"volume-title":"2021 IEEE International Reliability Physics Symposium. IEEE, 1--2.","year":"2021","author":"Yoon Jong-Hyeok","key":"e_1_3_2_1_23_1"}],"event":{"name":"ASPDAC '21: 26th Asia and South Pacific Design Automation Conference","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CAS","IEEE CEDA"],"location":"Tokyo Japan","acronym":"ASPDAC '21"},"container-title":["Proceedings of the 26th Asia and South Pacific Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3394885.3431615","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3394885.3431615","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3394885.3431615","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T20:47:59Z","timestamp":1750193279000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3394885.3431615"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,1,18]]},"references-count":23,"alternative-id":["10.1145\/3394885.3431615","10.1145\/3394885"],"URL":"https:\/\/doi.org\/10.1145\/3394885.3431615","relation":{},"subject":[],"published":{"date-parts":[[2021,1,18]]},"assertion":[{"value":"2021-01-29","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}