{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T01:25:21Z","timestamp":1773192321215,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":85,"publisher":"ACM","license":[{"start":{"date-parts":[[2020,7,18]],"date-time":"2020-07-18T00:00:00Z","timestamp":1595030400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"name":"National Science Foundation","award":["Nos. CCF- 1763906, CCF-1942430"],"award-info":[{"award-number":["Nos. CCF- 1763906, CCF-1942430"]}]},{"name":"the National Key Research and Development Program of China","award":["No. 2017YFB1001803"],"award-info":[{"award-number":["No. 2017YFB1001803"]}]},{"name":"the National Natural Science Foundation of China","award":["Nos. 61872008,61861130363"],"award-info":[{"award-number":["Nos. 61872008,61861130363"]}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2020,7,18]]},"DOI":"10.1145\/3395363.3397351","type":"proceedings-article","created":{"date-parts":[[2020,7,13]],"date-time":"2020-07-13T21:44:18Z","timestamp":1594676658000},"page":"75-87","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":85,"title":["Can automated program repair refine fault localization? a unified debugging approach"],"prefix":"10.1145","author":[{"given":"Yiling","family":"Lou","sequence":"first","affiliation":[{"name":"Peking University, China"}]},{"given":"Ali","family":"Ghanbari","sequence":"additional","affiliation":[{"name":"University of Texas at Dallas, USA"}]},{"given":"Xia","family":"Li","sequence":"additional","affiliation":[{"name":"University of Texas at Dallas, USA"}]},{"given":"Lingming","family":"Zhang","sequence":"additional","affiliation":[{"name":"University of Texas at Dallas, USA"}]},{"given":"Haotian","family":"Zhang","sequence":"additional","affiliation":[{"name":"Ant Financial Services, China"}]},{"given":"Dan","family":"Hao","sequence":"additional","affiliation":[{"name":"Peking University, China"}]},{"given":"Lu","family":"Zhang","sequence":"additional","affiliation":[{"name":"Peking University, China"}]}],"member":"320","published-online":{"date-parts":[[2020,7,18]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"2019. Alipay. https:\/\/intl.alipay.com\/. Accessed Aug-22-2019.  2019. Alipay. https:\/\/intl.alipay.com\/. Accessed Aug-22-2019."},{"key":"e_1_3_2_1_2_1","unstructured":"2019. JavaAgent. https:\/\/docs.oracle.com\/javase\/7\/docs\/api\/java\/lang\/ instrument\/package-summary.html  2019. JavaAgent. https:\/\/docs.oracle.com\/javase\/7\/docs\/api\/java\/lang\/ instrument\/package-summary.html"},{"key":"e_1_3_2_1_3_1","unstructured":"2019. Pitest. http:\/\/pitest.org  2019. Pitest. http:\/\/pitest.org"},{"key":"e_1_3_2_1_4_1","unstructured":"2019. Spring Framework. https:\/\/spring.io\/. Accessed Jan-10-2020.  2019. Spring Framework. https:\/\/spring.io\/. Accessed Jan-10-2020."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TAIC.PART.2007.13"},{"key":"e_1_3_2_1_6_1","unstructured":"Apache. 2019. Commons Math. https:\/\/commons.apache.org\/proper\/commonsmath\/. Accessed Aug-22-2019.  Apache. 2019. Commons Math. https:\/\/commons.apache.org\/proper\/commonsmath\/. Accessed Aug-22-2019."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/2931037.2931049"},{"key":"e_1_3_2_1_8_1","first-page":"85","article-title":"Software testing research: Achievements, challenges, dreams. In 2007 Future of Software Engineering","author":"Bertolino Antonia","year":"2007","unstructured":"Antonia Bertolino . 2007 . Software testing research: Achievements, challenges, dreams. In 2007 Future of Software Engineering . IEEE Computer Society , 85 - 103 . Antonia Bertolino. 2007. Software testing research: Achievements, challenges, dreams. In 2007 Future of Software Engineering. IEEE Computer Society, 85-103.","journal-title":"IEEE Computer Society"},{"key":"e_1_3_2_1_9_1","first-page":"137","article-title":"Using machine learning to support debugging with tarantula","author":"Briand Lionel C","year":"2007","unstructured":"Lionel C Briand , Yvan Labiche , and Xuetao Liu . 2007 . Using machine learning to support debugging with tarantula . In ISSRE. 137 - 146 . Lionel C Briand, Yvan Labiche, and Xuetao Liu. 2007. Using machine learning to support debugging with tarantula. In ISSRE. 137-146.","journal-title":"ISSRE."},{"key":"e_1_3_2_1_10_1","unstructured":"Eric Bruneton Romain Lenglet and Thierry Coupaye. 2002. ASM: a code manipulation tool to implement adaptable systems. Adaptable and extensible component systems 30 19 ( 2002 ).  Eric Bruneton Romain Lenglet and Thierry Coupaye. 2002. ASM: a code manipulation tool to implement adaptable systems. Adaptable and extensible component systems 30 19 ( 2002 )."},{"key":"e_1_3_2_1_11_1","first-page":"223","article-title":"Compiler Bug Isolation via E ective Witness Test Program Generation","author":"Chen Junjie","year":"2019","unstructured":"Junjie Chen , Jiaqi Han , Peiyi Sun , Lingming Zhang , Dan Hao , and Lu Zhang . 2019 . Compiler Bug Isolation via E ective Witness Test Program Generation . In FSE. 223 - 234 . Junjie Chen, Jiaqi Han, Peiyi Sun, Lingming Zhang, Dan Hao, and Lu Zhang. 2019. Compiler Bug Isolation via E ective Witness Test Program Generation. In FSE. 223-234.","journal-title":"FSE."},{"key":"e_1_3_2_1_12_1","first-page":"637","volume-title":"Proceedings of the 32Nd IEEE\/ACM International Conference on Automated Software Engineering (Urbana-Champaign, IL, USA) ( ASE 2017). IEEE Press","author":"Chen Liushan","unstructured":"Liushan Chen , Yu Pei , and Carlo A. Furia . 2017. Contract-based Program Repair Without the Contracts . In Proceedings of the 32Nd IEEE\/ACM International Conference on Automated Software Engineering (Urbana-Champaign, IL, USA) ( ASE 2017). IEEE Press , Piscataway, NJ, USA , 637 - 647 . http:\/\/dl.acm.org\/citation.cfm? id= 3155562. 3155642 Liushan Chen, Yu Pei, and Carlo A. Furia. 2017. Contract-based Program Repair Without the Contracts. In Proceedings of the 32Nd IEEE\/ACM International Conference on Automated Software Engineering (Urbana-Champaign, IL, USA) ( ASE 2017). IEEE Press, Piscataway, NJ, USA, 637-647. http:\/\/dl.acm.org\/citation.cfm? id= 3155562. 3155642"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"crossref","unstructured":"Lori A. Clarke. 1976. A system to generate test data and symbolically execute programs. TSE 3 ( 1976 ) 215-222.  Lori A. Clarke. 1976. A system to generate test data and symbolically execute programs. TSE 3 ( 1976 ) 215-222.","DOI":"10.1109\/TSE.1976.233817"},{"key":"e_1_3_2_1_14_1","first-page":"528","article-title":"Lightweight defect localization for java","author":"Dallmeier Valentin","year":"2005","unstructured":"Valentin Dallmeier , Christian Lindig , and Andreas Zeller . 2005 . Lightweight defect localization for java . In ECOOP. 528 - 550 . Valentin Dallmeier, Christian Lindig, and Andreas Zeller. 2005. Lightweight defect localization for java. In ECOOP. 528-550.","journal-title":"ECOOP."},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2009.15"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2010.66"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/C-M.1978.218136"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1961.10482090"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2755013"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1145\/3293882.3330559"},{"key":"e_1_3_2_1_21_1","first-page":"173","volume-title":"InProceedings of the 17th International Conference on Tools and Algorithms for the Construction and Analysis of Systems (Saarbrcken, Germany) ( TACAS'11\/ETAPS'11)","author":"Gopinath Divya","year":"2011","unstructured":"Divya Gopinath , Muhammad Zubair Malik , and Sarfraz Khurshid . 2011 . Speci cation-based Program Repair Using SAT . InProceedings of the 17th International Conference on Tools and Algorithms for the Construction and Analysis of Systems (Saarbrcken, Germany) ( TACAS'11\/ETAPS'11) . Springer-Verlag, Berlin, Heidelberg , 173 - 188 . http:\/\/dl.acm.org\/citation.cfm?id= 1987389. 1987408 Divya Gopinath, Muhammad Zubair Malik, and Sarfraz Khurshid. 2011. Speci cation-based Program Repair Using SAT. InProceedings of the 17th International Conference on Tools and Algorithms for the Construction and Analysis of Systems (Saarbrcken, Germany) ( TACAS'11\/ETAPS'11). Springer-Verlag, Berlin, Heidelberg, 173-188. http:\/\/dl.acm.org\/citation.cfm?id= 1987389. 1987408"},{"key":"e_1_3_2_1_22_1","unstructured":"Greg4cr. 2019. Defects4J-version 1.4.0. https:\/\/github.com\/Greg4cr\/defects4j\/ tree\/additional-faults-1.4.  Greg4cr. 2019. Defects4J-version 1.4.0. https:\/\/github.com\/Greg4cr\/defects4j\/ tree\/additional-faults-1.4."},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-009-0056-x"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-008-0025-9"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11390-009-9270-z"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.62"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2019.00033"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2019.00054"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1145\/3213846.3213871"},{"key":"e_1_3_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1145\/581339.581397"},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2628055"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.5555\/2486788.2486893"},{"key":"e_1_3_2_1_33_1","doi-asserted-by":"crossref","unstructured":"James C King. 1976. Symbolic execution and program testing. Commun. ACM 19 7 ( 1976 ) 385-394.  James C King. 1976. Symbolic execution and program testing. Commun. ACM 19 7 ( 1976 ) 385-394.","DOI":"10.1145\/360248.360252"},{"key":"e_1_3_2_1_34_1","volume-title":"Software testing in the real world: improving the process","author":"Kit Edward","unstructured":"Edward Kit and Susannah Finzi . 1995. Software testing in the real world: improving the process . ACM Press\/Addison-Wesley Publishing Co. Edward Kit and Susannah Finzi. 1995. Software testing in the real world: improving the process. ACM Press\/Addison-Wesley Publishing Co."},{"key":"e_1_3_2_1_35_1","doi-asserted-by":"publisher","DOI":"10.1145\/2931037.2931051"},{"key":"e_1_3_2_1_36_1","first-page":"194","article-title":"Experience report: How do techniques, programs, and tests impact automated program repair?","author":"Kong Xianglong","year":"2015","unstructured":"Xianglong Kong , Lingming Zhang , W Eric Wong , and Bixin Li . 2015 . Experience report: How do techniques, programs, and tests impact automated program repair? . In ISSRE. 194 - 204 . Xianglong Kong, Lingming Zhang, W Eric Wong, and Bixin Li. 2015. Experience report: How do techniques, programs, and tests impact automated program repair?. In ISSRE. 194-204.","journal-title":"ISSRE."},{"key":"e_1_3_2_1_37_1","doi-asserted-by":"publisher","DOI":"10.1145\/3338906.3338935"},{"key":"e_1_3_2_1_38_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.104"},{"key":"e_1_3_2_1_39_1","doi-asserted-by":"publisher","DOI":"10.1145\/3293882.3330574"},{"key":"e_1_3_2_1_40_1","doi-asserted-by":"publisher","DOI":"10.1145\/3133916"},{"key":"e_1_3_2_1_41_1","doi-asserted-by":"publisher","DOI":"10.1145\/3180155.3180242"},{"key":"e_1_3_2_1_42_1","doi-asserted-by":"crossref","unstructured":"Ben Liblit Mayur Naik Alice X Zheng Alex Aiken and Michael I Jordan. 2005. Scalable statistical bug isolation. PLDI ( 2005 ) 15-26.  Ben Liblit Mayur Naik Alice X Zheng Alex Aiken and Michael I Jordan. 2005. Scalable statistical bug isolation. PLDI ( 2005 ) 15-26.","DOI":"10.1145\/1064978.1065014"},{"key":"e_1_3_2_1_43_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2017.43"},{"key":"e_1_3_2_1_44_1","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786811"},{"key":"e_1_3_2_1_45_1","doi-asserted-by":"publisher","DOI":"10.1145\/2837614.2837617"},{"key":"e_1_3_2_1_46_1","doi-asserted-by":"publisher","DOI":"10.1145\/3293882.3330578"},{"key":"e_1_3_2_1_47_1","volume-title":"Proceedings of the 41st International Conference on Software Engineering: Software Engineering in Practice. 269-278","author":"Marginean Alexandru","year":"2019","unstructured":"Alexandru Marginean , Johannes Bader , Satish Chandra , Mark Harman , Yue Jia , Ke Mao , Alexander Mols , and Andrew Scott . 2019 . Sap x: Automated end-to-end repair at scale . In Proceedings of the 41st International Conference on Software Engineering: Software Engineering in Practice. 269-278 . Alexandru Marginean, Johannes Bader, Satish Chandra, Mark Harman, Yue Jia, Ke Mao, Alexander Mols, and Andrew Scott. 2019. Sap x: Automated end-to-end repair at scale. In Proceedings of the 41st International Conference on Software Engineering: Software Engineering in Practice. 269-278."},{"key":"e_1_3_2_1_48_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-016-9470-4"},{"key":"e_1_3_2_1_49_1","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884807"},{"key":"e_1_3_2_1_50_1","doi-asserted-by":"publisher","DOI":"10.1145\/3105906"},{"key":"e_1_3_2_1_51_1","volume-title":"2014 IEEE Seventh International Conference on. IEEE, 153-162","author":"Moon Seokhyeon","year":"2014","unstructured":"Seokhyeon Moon , Yunho Kim , Moonzoo Kim , and Shin Yoo . 2014 . Ask the mutants: Mutating faulty programs for fault localization. In Software Testing, Veri cation and Validation (ICST) , 2014 IEEE Seventh International Conference on. IEEE, 153-162 . Seokhyeon Moon, Yunho Kim, Moonzoo Kim, and Shin Yoo. 2014. Ask the mutants: Mutating faulty programs for fault localization. In Software Testing, Veri cation and Validation (ICST), 2014 IEEE Seventh International Conference on. IEEE, 153-162."},{"key":"e_1_3_2_1_52_1","volume-title":"The art of software testing","author":"Myers Glenford J","unstructured":"Glenford J Myers , Corey Sandler , and Tom Badgett . 2011. The art of software testing . John Wiley & Sons . Glenford J Myers, Corey Sandler, and Tom Badgett. 2011. The art of software testing. John Wiley & Sons."},{"key":"e_1_3_2_1_53_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606623"},{"key":"e_1_3_2_1_54_1","volume-title":"2012 IEEE Fifth International Conference on. IEEE, 691-700","author":"Papadakis Mike","year":"2012","unstructured":"Mike Papadakis and Yves Le Traon . 2012 . Using mutants to locate\" unknown\" faults. In Software Testing, Veri cation and Validation (ICST) , 2012 IEEE Fifth International Conference on. IEEE, 691-700 . Mike Papadakis and Yves Le Traon. 2012. Using mutants to locate\" unknown\" faults. In Software Testing, Veri cation and Validation (ICST), 2012 IEEE Fifth International Conference on. IEEE, 691-700."},{"key":"e_1_3_2_1_55_1","doi-asserted-by":"crossref","unstructured":"Mike Papadakis and Yves Le Traon. 2015. Metallaxis-FL: mutation-based fault localization. Software Testing Veri cation and Reliability 25 5-7 ( 2015 ) 605-628.  Mike Papadakis and Yves Le Traon. 2015. Metallaxis-FL: mutation-based fault localization. Software Testing Veri cation and Reliability 25 5-7 ( 2015 ) 605-628.","DOI":"10.1002\/stvr.1509"},{"key":"e_1_3_2_1_56_1","doi-asserted-by":"publisher","DOI":"10.1145\/2001420.2001445"},{"key":"e_1_3_2_1_57_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2017.62"},{"key":"e_1_3_2_1_58_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2014.2312918"},{"key":"e_1_3_2_1_59_1","volume-title":"E ective Methods for Software Testing: Includes Complete Guidelines, Checklists, and Templates","author":"Perry William E","unstructured":"William E Perry . 2007. E ective Methods for Software Testing: Includes Complete Guidelines, Checklists, and Templates . John Wiley & Sons . William E Perry. 2007. E ective Methods for Software Testing: Includes Complete Guidelines, Checklists, and Templates. John Wiley & Sons."},{"key":"e_1_3_2_1_60_1","doi-asserted-by":"publisher","DOI":"10.1145\/2568225.2568254"},{"key":"e_1_3_2_1_61_1","doi-asserted-by":"publisher","DOI":"10.1145\/2771783.2771791"},{"key":"e_1_3_2_1_62_1","first-page":"49","article-title":"A novel framework for locating software faults using latent divergences","author":"Roychowdhury Shounak","year":"2011","unstructured":"Shounak Roychowdhury and Sarfraz Khurshid . 2011 . A novel framework for locating software faults using latent divergences . In ECML. 49 - 64 . Shounak Roychowdhury and Sarfraz Khurshid. 2011. A novel framework for locating software faults using latent divergences. In ECML. 49-64.","journal-title":"ECML."},{"key":"e_1_3_2_1_63_1","doi-asserted-by":"publisher","DOI":"10.1145\/2070821.2070823"},{"key":"e_1_3_2_1_64_1","doi-asserted-by":"publisher","DOI":"10.1109\/IS.2012.6335163"},{"key":"e_1_3_2_1_65_1","doi-asserted-by":"publisher","DOI":"10.5555\/3155562.3155643"},{"key":"e_1_3_2_1_66_1","volume-title":"Geta x: Learning to x bugs automatically.arXiv preprint arXiv","author":"Scott Andrew","year":"1902","unstructured":"Andrew Scott , Johannes Bader , and Satish Chandra . 2019. Geta x: Learning to x bugs automatically.arXiv preprint arXiv : 1902 . 06111 ( 2019 ). Andrew Scott, Johannes Bader, and Satish Chandra. 2019. Geta x: Learning to x bugs automatically.arXiv preprint arXiv: 1902. 06111 ( 2019 )."},{"key":"e_1_3_2_1_67_1","doi-asserted-by":"publisher","DOI":"10.1145\/3092703.3092717"},{"key":"e_1_3_2_1_68_1","volume-title":"The economic impacts of inadequate infrastructure for software testing","author":"Tassey Gregory","year":"2002","unstructured":"Gregory Tassey . 2002. The economic impacts of inadequate infrastructure for software testing . National Institute of Standards and Technology , RTI Project 7007, 011 ( 2002 ). Gregory Tassey. 2002. The economic impacts of inadequate infrastructure for software testing. National Institute of Standards and Technology, RTI Project 7007, 011 ( 2002 )."},{"key":"e_1_3_2_1_69_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-66299-2_7"},{"key":"e_1_3_2_1_70_1","unstructured":"Tricentis. 2019. \"Tricentis Report\". https:\/\/www.tricentis. com. \"accessed 10-jan2020\".  Tricentis. 2019. \"Tricentis Report\". https:\/\/www.tricentis. com. \"accessed 10-jan2020\"."},{"key":"e_1_3_2_1_71_1","doi-asserted-by":"publisher","DOI":"10.1145\/1173706.1173734"},{"key":"e_1_3_2_1_72_1","first-page":"356","article-title":"Leveraging program equivalence for adaptive program repair: Models and rst results","author":"Weimer Westley","year":"2013","unstructured":"Westley Weimer , Zachary P Fry , and Stephanie Forrest . 2013 . Leveraging program equivalence for adaptive program repair: Models and rst results . InASE. 356 - 366 . Westley Weimer, Zachary P Fry, and Stephanie Forrest. 2013. Leveraging program equivalence for adaptive program repair: Models and rst results. InASE. 356-366.","journal-title":"InASE."},{"key":"e_1_3_2_1_73_1","doi-asserted-by":"publisher","DOI":"10.1145\/3180155.3180233"},{"key":"e_1_3_2_1_74_1","volume-title":"The Free Encyclopedia. https:\/\/en.wikipedia.org\/wiki\/Software_bug [accessed 10-jan-2020].","author":"Wikipedia","unstructured":"Wikipedia contributors. 2019. Software bug-Wikipedia , The Free Encyclopedia. https:\/\/en.wikipedia.org\/wiki\/Software_bug [accessed 10-jan-2020]. Wikipedia contributors. 2019. Software bug-Wikipedia, The Free Encyclopedia. https:\/\/en.wikipedia.org\/wiki\/Software_bug [accessed 10-jan-2020]."},{"key":"e_1_3_2_1_75_1","volume-title":"The Free Encyclopedia. https:\/\/en.wikipedia.org\/wiki\/Wilcoxon_signed-rank_test. [accessed 10-jan-2020].","author":"Wikipedia","unstructured":"Wikipedia contributors. 2019. Wilcoxon signed-rank test-Wikipedia , The Free Encyclopedia. https:\/\/en.wikipedia.org\/wiki\/Wilcoxon_signed-rank_test. [accessed 10-jan-2020]. Wikipedia contributors. 2019. Wilcoxon signed-rank test-Wikipedia, The Free Encyclopedia. https:\/\/en.wikipedia.org\/wiki\/Wilcoxon_signed-rank_test. [accessed 10-jan-2020]."},{"key":"e_1_3_2_1_76_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2521368"},{"key":"e_1_3_2_1_77_1","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884834"},{"key":"e_1_3_2_1_78_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2560811"},{"key":"e_1_3_2_1_79_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME.2014.41"},{"key":"e_1_3_2_1_80_1","first-page":"52","article-title":"Test case puri cation for improving fault localization","author":"Xuan Jifeng","year":"2014","unstructured":"Jifeng Xuan and Martin Monperrus . 2014 . Test case puri cation for improving fault localization . In FSE. 52 - 63 . Jifeng Xuan and Martin Monperrus. 2014. Test case puri cation for improving fault localization. In FSE. 52-63.","journal-title":"FSE."},{"key":"e_1_3_2_1_81_1","first-page":"765","article-title":"Injecting mechanical faults to localize developer faults for evolving software","author":"Zhang Lingming","year":"2013","unstructured":"Lingming Zhang , Lu Zhang , and Sarfraz Khurshid . 2013 . Injecting mechanical faults to localize developer faults for evolving software . In OOPSLA. 765 - 784 . Lingming Zhang, Lu Zhang, and Sarfraz Khurshid. 2013. Injecting mechanical faults to localize developer faults for evolving software. In OOPSLA. 765-784.","journal-title":"OOPSLA."},{"key":"e_1_3_2_1_82_1","doi-asserted-by":"publisher","DOI":"10.1145\/3092703.3092731"},{"key":"e_1_3_2_1_83_1","volume-title":"An Empirical Study of Boosting Spectrumbased Fault Localization via PageRank","author":"Zhang Mengshi","year":"2019","unstructured":"Mengshi Zhang , Yaoxian Li , Xia Li , Lingchao Chen , Yuqun Zhang , Lingming Zhang , and Sarfraz Khurshid . 2019. An Empirical Study of Boosting Spectrumbased Fault Localization via PageRank . IEEE Transactions on Software Engineering ( 2019 ). Mengshi Zhang, Yaoxian Li, Xia Li, Lingchao Chen, Yuqun Zhang, Lingming Zhang, and Sarfraz Khurshid. 2019. An Empirical Study of Boosting Spectrumbased Fault Localization via PageRank. IEEE Transactions on Software Engineering ( 2019 )."},{"key":"e_1_3_2_1_84_1","doi-asserted-by":"publisher","DOI":"10.1145\/1134285.1134324"},{"key":"e_1_3_2_1_85_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2019.2892102"}],"event":{"name":"ISSTA '20: 29th ACM SIGSOFT International Symposium on Software Testing and Analysis","location":"Virtual Event USA","acronym":"ISSTA '20","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering"]},"container-title":["Proceedings of the 29th ACM SIGSOFT International Symposium on Software Testing and Analysis"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3395363.3397351","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3395363.3397351","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3395363.3397351","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T22:38:35Z","timestamp":1750199915000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3395363.3397351"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7,18]]},"references-count":85,"alternative-id":["10.1145\/3395363.3397351","10.1145\/3395363"],"URL":"https:\/\/doi.org\/10.1145\/3395363.3397351","relation":{},"subject":[],"published":{"date-parts":[[2020,7,18]]},"assertion":[{"value":"2020-07-18","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}