{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:25:45Z","timestamp":1750220745976,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":19,"publisher":"ACM","license":[{"start":{"date-parts":[[2020,7,18]],"date-time":"2020-07-18T00:00:00Z","timestamp":1595030400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2020,7,18]]},"DOI":"10.1145\/3395363.3404369","type":"proceedings-article","created":{"date-parts":[[2020,7,13]],"date-time":"2020-07-13T21:44:18Z","timestamp":1594676658000},"page":"569-572","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":3,"title":["CPSDebug: a tool for explanation of failures in cyber-physical systems"],"prefix":"10.1145","author":[{"given":"Ezio","family":"Bartocci","sequence":"first","affiliation":[{"name":"TU Vienna, Austria"}]},{"given":"Niveditha","family":"Manjunath","sequence":"additional","affiliation":[{"name":"Austrian Institute of Technology, Austria \/ TU Vienna, Austria"}]},{"given":"Leonardo","family":"Mariani","sequence":"additional","affiliation":[{"name":"University of Milano-Bicocca, Italy"}]},{"given":"Cristinel","family":"Mateis","sequence":"additional","affiliation":[{"name":"Austrian Institute of Technology, Austria"}]},{"given":"Dejan","family":"Ni\u010dkovi\u0107","sequence":"additional","affiliation":[{"name":"Austrian Institute of Technology, Austria"}]},{"given":"Fabrizio","family":"Pastore","sequence":"additional","affiliation":[{"name":"University of Luxembourg, Luxembourg"}]}],"member":"320","published-online":{"date-parts":[[2020,7,18]]},"reference":[{"volume-title":"On the Accuracy of Spectrum-based Fault Localization. In Testing: Academic and Industrial Conference Practice and Research Techniques. IEEE, 89-98","author":"Abreu Rui","key":"e_1_3_2_1_1_1","unstructured":"Rui Abreu , Peter Zoeteweij , and Arjan J. C . van Gemund. 2007 . On the Accuracy of Spectrum-based Fault Localization. In Testing: Academic and Industrial Conference Practice and Research Techniques. IEEE, 89-98 . Rui Abreu, Peter Zoeteweij, and Arjan J. C. van Gemund. 2007. On the Accuracy of Spectrum-based Fault Localization. In Testing: Academic and Industrial Conference Practice and Research Techniques. IEEE, 89-98."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/1572272.1572300"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/3178126.3178131"},{"volume-title":"Software Engineering and Formal Methods (LNCS)","author":"Bartocci Ezio","key":"e_1_3_2_1_4_1","unstructured":"Ezio Bartocci , Niveditha Manjunath , Leonardo Mariani , Cristinel Mateis , and Dejan Nickovic . 2019. Automatic Failure Explanation in CPS Models . In Software Engineering and Formal Methods (LNCS) , Vol. 11724 . Springer , 69-86. Ezio Bartocci, Niveditha Manjunath, Leonardo Mariani, Cristinel Mateis, and Dejan Nickovic. 2019. Automatic Failure Explanation in CPS Models. In Software Engineering and Formal Methods (LNCS), Vol. 11724. Springer, 69-86."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10703-015-0240-5"},{"volume-title":"Proceedings of the 9th ACM\/IEEE International Conference on Cyber-Physical Systems. IEEE, 220-231","author":"Deshmukh Jyotirmoy V.","key":"e_1_3_2_1_6_1","unstructured":"Jyotirmoy V. Deshmukh , Xiaoqing Jin , Rupak Majumdar , and Vinayak S. Prabhu . 2018. Parameter optimization in control software using statistical fault localization techniques . In Proceedings of the 9th ACM\/IEEE International Conference on Cyber-Physical Systems. IEEE, 220-231 . Jyotirmoy V. Deshmukh, Xiaoqing Jin, Rupak Majumdar, and Vinayak S. Prabhu. 2018. Parameter optimization in control software using statistical fault localization techniques. In Proceedings of the 9th ACM\/IEEE International Conference on Cyber-Physical Systems. IEEE, 220-231."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.scico.2007.01.015"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.2514\/6.2005-5886"},{"key":"e_1_3_2_1_9_1","first-page":"25","volume-title":"1st and 2nd International Workshop on Applied veRification for Continuous and Hybrid Systems (EPiC Series in Computing)","volume":"34","author":"Hoxha Bardh","year":"2015","unstructured":"Bardh Hoxha , Houssam Abbas , and Georgios Fainekos . 2015 . Benchmarks for Temporal Logic Requirements for Automotive Systems. In ARCH14-15 . 1st and 2nd International Workshop on Applied veRification for Continuous and Hybrid Systems (EPiC Series in Computing) , Vol. 34 . 25 - 30 . Bardh Hoxha, Houssam Abbas, and Georgios Fainekos. 2015. Benchmarks for Temporal Logic Requirements for Automotive Systems. In ARCH14-15. 1st and 2nd International Workshop on Applied veRification for Continuous and Hybrid Systems (EPiC Series in Computing), Vol. 34. 25-30."},{"volume-title":"IEEE 24th International Conference on Software Analysis, Evolution and Reengineering (SANER). IEEE Computer Society, 359-370","author":"Liu Bing","key":"e_1_3_2_1_10_1","unstructured":"Bing Liu , Lucia Lucia , Shiva Nejati , and Lionel C. Briand . 2017. Improving fault localization for Simulink models using search-based testing and prediction models . In IEEE 24th International Conference on Software Analysis, Evolution and Reengineering (SANER). IEEE Computer Society, 359-370 . Bing Liu, Lucia Lucia, Shiva Nejati, and Lionel C. Briand. 2017. Improving fault localization for Simulink models using search-based testing and prediction models. In IEEE 24th International Conference on Software Analysis, Evolution and Reengineering (SANER). IEEE Computer Society, 359-370."},{"key":"e_1_3_2_1_11_1","volume-title":"Localizing Multiple Faults in Simulink Models. In IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering (SANER). IEEE Computer Society, 146-156","author":"Liu Bing","year":"2016","unstructured":"Bing Liu , Lucia Lucia , Shiva Nejati , Lionel C. Briand , and Thomas Bruckmann . 2016 . Localizing Multiple Faults in Simulink Models. In IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering (SANER). IEEE Computer Society, 146-156 . Bing Liu, Lucia Lucia, Shiva Nejati, Lionel C. Briand, and Thomas Bruckmann. 2016. Localizing Multiple Faults in Simulink Models. In IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering (SANER). IEEE Computer Society, 146-156."},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"crossref","unstructured":"Bing Liu Lucia Lucia Shiva Nejati Lionel C. Briand and Thomas Bruckmann. 2016. Simulink fault localization: an iterative statistical debugging approach. Software Testing Verification and Reliability 26 6 ( 2016 ) 431-459.  Bing Liu Lucia Lucia Shiva Nejati Lionel C. Briand and Thomas Bruckmann. 2016. Simulink fault localization: an iterative statistical debugging approach. Software Testing Verification and Reliability 26 6 ( 2016 ) 431-459.","DOI":"10.1002\/stvr.1605"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"crossref","unstructured":"Oded Maler and Dejan Nickovic. 2013. Monitoring properties of analog and mixed-signal circuits. Software Tools for Technology Transfer 15 3 ( 2013 ) 247-268.  Oded Maler and Dejan Nickovic. 2013. Monitoring properties of analog and mixed-signal circuits. Software Tools for Technology Transfer 15 3 ( 2013 ) 247-268.","DOI":"10.1007\/s10009-012-0247-9"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.93"},{"key":"e_1_3_2_1_15_1","volume-title":"RTAMT: Online Robustness Monitors from STL. arXiv","author":"Nickovic Dejan","year":"2020","unstructured":"Dejan Nickovic and Tomoya Yamaguchi . 2020 . RTAMT: Online Robustness Monitors from STL. arXiv : 2005. 11827 [cs.LO] Dejan Nickovic and Tomoya Yamaguchi. 2020. RTAMT: Online Robustness Monitors from STL. arXiv: 2005. 11827 [cs.LO]"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1145\/2001420.2001445"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2610387"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2017.43"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2521368"}],"event":{"name":"ISSTA '20: 29th ACM SIGSOFT International Symposium on Software Testing and Analysis","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering"],"location":"Virtual Event USA","acronym":"ISSTA '20"},"container-title":["Proceedings of the 29th ACM SIGSOFT International Symposium on Software Testing and Analysis"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3395363.3404369","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3395363.3404369","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T22:38:45Z","timestamp":1750199925000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3395363.3404369"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7,18]]},"references-count":19,"alternative-id":["10.1145\/3395363.3404369","10.1145\/3395363"],"URL":"https:\/\/doi.org\/10.1145\/3395363.3404369","relation":{},"subject":[],"published":{"date-parts":[[2020,7,18]]},"assertion":[{"value":"2020-07-18","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}