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To avoid over-designing, it is necessary to have an in-depth understanding of the available design options. However, an exhaustive listing is neither possible to create nor efficient to use due to its prohibitive size. In this work, we present a top-down binary tree classification for error detection and correction techniques. At each split, the design space is clearly divided into two complementary parts using one single attribute, compared with existing classifications that use splits with multiple attributes. A leaf inherits all the attributes of its ancestors from the root to the leaf. A technique is decomposed into primitive components, each one belonging to a different leaf. The single attribute splits can be used to efficiently compare the techniques and to prune the incompatible parts of the design space during the design of a technique. This essential single attribute division of the design space is required for the improvement of the techniques and for novel contributions to the fault-tolerance domain.<\/jats:p>","DOI":"10.1145\/3397268","type":"journal-article","created":{"date-parts":[[2020,7,7]],"date-time":"2020-07-07T12:38:30Z","timestamp":1594125510000},"page":"1-38","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":3,"title":["Binary Tree Classification of Rigid Error Detection and Correction Techniques"],"prefix":"10.1145","volume":"53","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9293-469X","authenticated-orcid":false,"given":"Angeliki","family":"Kritikakou","sequence":"first","affiliation":[{"name":"University of Rennes, Inria, CNRS, IRISA, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rafail","family":"Psiakis","sequence":"additional","affiliation":[{"name":"University of Rennes, Inria, CNRS, IRISA, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francky","family":"Catthoor","sequence":"additional","affiliation":[{"name":"IMEC, KU Leuven, Belgium"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Olivier","family":"Sentieys","sequence":"additional","affiliation":[{"name":"University of Rennes, Inria, CNRS, IRISA, France"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2020,8,20]]},"reference":[{"key":"e_1_2_2_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.2"},{"key":"e_1_2_2_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"e_1_2_2_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2003236"},{"key":"e_1_2_2_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2008.4567268"},{"key":"e_1_2_2_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2179038"},{"volume-title":"2013 50th ACM\/EDAC\/IEEE Design Automation Conference (DAC). 1--10","author":"Girbal S.","key":"e_1_2_2_6_1","unstructured":"S. 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