{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T23:10:04Z","timestamp":1750201804775,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":12,"publisher":"ACM","license":[{"start":{"date-parts":[[2020,5,28]],"date-time":"2020-05-28T00:00:00Z","timestamp":1590624000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5,28]]},"DOI":"10.1145\/3404687.3404695","type":"proceedings-article","created":{"date-parts":[[2020,7,30]],"date-time":"2020-07-30T16:12:53Z","timestamp":1596125573000},"page":"97-101","source":"Crossref","is-referenced-by-count":0,"title":["Research of Control Chart Pattern Recognition Based on Wavelet Decomposition in Lithium Battery Production"],"prefix":"10.1145","author":[{"given":"Zhou","family":"Ning","sequence":"first","affiliation":[{"name":"School of Information Engineering, Wuhan University of Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chen","family":"Xiaowei","sequence":"additional","affiliation":[{"name":"School of Information Engineering, Wuhan University of Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhou","family":"Jianxin","sequence":"additional","affiliation":[{"name":"School of Information Engineering, Wuhan University of Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2020,7,30]]},"reference":[{"issue":"21","key":"e_1_3_2_1_1_1","first-page":"145","article-title":"Application of Juran's Quality Management and Analysis in the Research of Scientific Research Projects","volume":"2008","author":"Li Lihong","year":"2008","journal-title":"Sci-Tech Information Development & Economy"},{"key":"e_1_3_2_1_2_1","unstructured":"Wang Bangjun. (2017). Research on Quality Control Methodology for Complex Product Manufacturing Processes Based on Data Variation Theory. University of Science and Technology Beijing China.  Wang Bangjun. (2017). Research on Quality Control Methodology for Complex Product Manufacturing Processes Based on Data Variation Theory. University of Science and Technology Beijing China."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"crossref","unstructured":"Shamsuzzaman Md. (2005). Integrated control chart systems. Doctoral thesis Nanyang Technological University Singapore. DOI= https:\/\/doi.org\/10.32657\/10356\/47276  Shamsuzzaman Md. (2005). Integrated control chart systems. Doctoral thesis Nanyang Technological University Singapore. DOI= https:\/\/doi.org\/10.32657\/10356\/47276","DOI":"10.32657\/10356\/47276"},{"key":"e_1_3_2_1_4_1","unstructured":"Zhou Haofei. (2016). Research on Quality Intelligent Diagnosis for Automatic Machining Process Based on Pattern Recognition. Zhengzhou University China.  Zhou Haofei. (2016). Research on Quality Intelligent Diagnosis for Automatic Machining Process Based on Pattern Recognition. Zhengzhou University China."},{"key":"e_1_3_2_1_5_1","unstructured":"Zhou Haofei. (2012). The Research of Control Chart Pattern Recognition Based on Wavelet Analysis. Zhengzhou University China.  Zhou Haofei. (2012). The Research of Control Chart Pattern Recognition Based on Wavelet Analysis. Zhengzhou University China."},{"key":"e_1_3_2_1_6_1","first-page":"2520","article-title":"Neural network for control chart pattern recognition based on kernel principle component analysis","volume":"2012","author":"Hu S.","year":"2012","journal-title":"Journal of Computer Applications"},{"key":"e_1_3_2_1_7_1","first-page":"60352","volume-title":"Computer Engineering and Applications","author":"Gao D.","year":"2014"},{"key":"e_1_3_2_1_8_1","first-page":"2467","article-title":"Processing anomaly detecion based on rough set and support vector machine","volume":"2015","author":"Xiang Q","year":"2015","journal-title":"Computer Integrated Manufacturing Systems"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1080\/00207540500442393"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1080\/00207540601011501"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-34816-7"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.5220\/0008552002200222"}],"event":{"name":"ICBDC 2020: 2020 5th International Conference on Big Data and Computing","sponsor":["Shenzhen University Shenzhen University","Sun Yat-Sen University"],"location":"Chengdu China","acronym":"ICBDC 2020"},"container-title":["Proceedings of the 2020 5th International Conference on Big Data and Computing"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3404687.3404695","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T22:38:19Z","timestamp":1750199899000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3404687.3404695"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5,28]]},"references-count":12,"alternative-id":["10.1145\/3404687.3404695","10.1145\/3404687"],"URL":"https:\/\/doi.org\/10.1145\/3404687.3404695","relation":{},"subject":[],"published":{"date-parts":[[2020,5,28]]}}}