{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T03:47:27Z","timestamp":1772164047854,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":6,"publisher":"ACM","license":[{"start":{"date-parts":[[2021,5,31]],"date-time":"2021-05-31T00:00:00Z","timestamp":1622419200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2021,5,31]]},"DOI":"10.1145\/3410220.3456275","type":"proceedings-article","created":{"date-parts":[[2021,6,6]],"date-time":"2021-06-06T06:11:02Z","timestamp":1622959862000},"page":"51-52","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":5,"title":["Load Balancing Under Strict Compatibility Constraints"],"prefix":"10.1145","author":[{"given":"Daan","family":"Rutten","sequence":"first","affiliation":[{"name":"Georgia Institute of Technology, Atlanta, GA, USA"}]},{"given":"Debankur","family":"Mukherjee","sequence":"additional","affiliation":[{"name":"Georgia Institute of Technology, Atlanta, GA, USA"}]}],"member":"320","published-online":{"date-parts":[[2021,6,6]]},"reference":[{"key":"e_1_3_2_2_1_1","doi-asserted-by":"publisher","DOI":"10.1214\/10-AAP726"},{"key":"e_1_3_2_2_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/1773394.1773400"},{"key":"e_1_3_2_2_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/2391229.2391236"},{"key":"e_1_3_2_2_4_1","doi-asserted-by":"publisher","DOI":"10.1287\/opre.2017.1620"},{"key":"e_1_3_2_2_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNET.2014.2362745"},{"key":"e_1_3_2_2_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/INFOCOM.2016.7524416"}],"event":{"name":"SIGMETRICS '21: ACM SIGMETRICS \/ International Conference on Measurement and Modeling of Computer Systems","location":"Virtual Event China","acronym":"SIGMETRICS '21","sponsor":["SIGMETRICS ACM Special Interest Group on Measurement and Evaluation"]},"container-title":["Abstract Proceedings of the 2021 ACM SIGMETRICS \/ International Conference on Measurement and Modeling of Computer Systems"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3410220.3456275","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3410220.3456275","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T18:40:59Z","timestamp":1750185659000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3410220.3456275"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,31]]},"references-count":6,"alternative-id":["10.1145\/3410220.3456275","10.1145\/3410220"],"URL":"https:\/\/doi.org\/10.1145\/3410220.3456275","relation":{"is-identical-to":[{"id-type":"doi","id":"10.1145\/3543516.3456275","asserted-by":"object"}]},"subject":[],"published":{"date-parts":[[2021,5,31]]},"assertion":[{"value":"2021-06-06","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}