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Syst."],"published-print":{"date-parts":[[2021,1,31]]},"abstract":"<jats:p>\n            Hardware Trojans (HTs) have become a major threat for the integrated circuit industry and supply chain and have motivated numerous developments of HT detection schemes. Although the side-channel HT detection approach is among the most promising solutions, most of the previous methods require a trusted golden chip reference. Furthermore, detection accuracy is often influenced by environmental noise and process variations. In this article, a novel electromagnetic (EM) side-channel fingerprinting-based HT detection method is proposed. Different from previous methods, the proposed solution eliminates the requirement of a trusted golden fabricated chip. Rather, only the genuine RTL code is required to generate the EM signatures as references. A factor analysis method is utilized to extract the spectral features of the HT trigger\u2019s EM radiation, and then a\n            <jats:italic>k<\/jats:italic>\n            -means clustering method is applied for HT detection. Experimentation on two selected sets of Trust-Hub benchmarks has been performed on FPGA platforms, and the results show that the proposed framework can detect all dormant HTs with a high confidence level.\n          <\/jats:p>","DOI":"10.1145\/3419105","type":"journal-article","created":{"date-parts":[[2020,12,7]],"date-time":"2020-12-07T18:26:48Z","timestamp":1607365608000},"page":"1-18","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":17,"title":["Golden Chip-Free Trojan Detection Leveraging Trojan Trigger\u2019s Side-Channel Fingerprinting"],"prefix":"10.1145","volume":"20","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1443-9279","authenticated-orcid":false,"given":"Jiaji","family":"He","sequence":"first","affiliation":[{"name":"Tsinghua University, Beijing Shi, China"}]},{"given":"Haocheng","family":"Ma","sequence":"additional","affiliation":[{"name":"Tianjin University, Tianjin Shi, China"}]},{"given":"Yanjiang","family":"Liu","sequence":"additional","affiliation":[{"name":"Tianjin University, Tianjin Shi, China"}]},{"given":"Yiqiang","family":"Zhao","sequence":"additional","affiliation":[{"name":"Tianjin University, Tianjin Shi, China"}]}],"member":"320","published-online":{"date-parts":[[2020,12,7]]},"reference":[{"key":"e_1_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2010.2061228"},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126618501384"},{"key":"e_1_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2015.7256167"},{"volume-title":"Proceedings of the 15th International Symposium on Quality Electronic Design. 47--54","year":"2014","author":"Bao C.","key":"e_1_2_1_4_1"},{"key":"e_1_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2424929"},{"key":"e_1_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1117\/1.3115362"},{"key":"e_1_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-28632-5_2"},{"key":"e_1_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.64"},{"key":"e_1_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2638442"},{"key":"e_1_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2019.2914079"},{"volume-title":"Proceedings of the Design, Automation, and Test in Europe Conference and Exhibition (DATE\u201917)","year":"2017","author":"Esirci F. 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