{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,10]],"date-time":"2026-06-10T13:42:43Z","timestamp":1781098963392,"version":"3.54.1"},"publisher-location":"New York, NY, USA","reference-count":13,"publisher":"ACM","license":[{"start":{"date-parts":[[2020,11,6]],"date-time":"2020-11-06T00:00:00Z","timestamp":1604620800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2020,11,6]]},"DOI":"10.1145\/3443467.3443793","type":"proceedings-article","created":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T23:48:19Z","timestamp":1612223299000},"page":"420-425","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Research on Interpretability of SAR Image Component Recognition Based on Residual Attention Mechanism"],"prefix":"10.1145","author":[{"given":"Binqian","family":"Wu","sequence":"first","affiliation":[{"name":"College of Electronic and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Gong","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Electronic and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuhua","family":"Sun","sequence":"additional","affiliation":[{"name":"College of Electronic and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2021,2]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1117\/12.242059"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-017-9405-6"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.12000\/JR19104"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.12000\/JR16130"},{"key":"e_1_3_2_1_5_1","volume-title":"2015 International Conference on Learning Representations, SanDiego, USA","author":"GOODFELLOW I J, SHLENS","year":"2015","unstructured":"GOODFELLOW I J, SHLENS J, and SZEGEDY C.Explaining and harnessing adversarial examples[C]. 2015 International Conference on Learning Representations, SanDiego, USA, 2015."},{"key":"e_1_3_2_1_6_1","volume-title":"EXplainable Artificial Intelligence (XAI)[R].DARPA\/I2O","author":"GUNNING","year":"2017","unstructured":"GUNNING D. EXplainable Artificial Intelligence (XAI)[R].DARPA\/I2O, 2017."},{"key":"e_1_3_2_1_7_1","volume-title":"Frascati","author":"DATCU M, ANDREI V, DUMITRU C O","year":"2019","unstructured":"DATCU M, ANDREI V, DUMITRU C O, et al.Explainable deep learning for SAR data[C]. \u03a6-week, Frascati, Italy, 2019."},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.isprsjprs.2020.01.016"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/tgrs.2019.2931620"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.3390\/rs12030560"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2019.107385"},{"key":"e_1_3_2_1_12_1","unstructured":"Simonyan K Zisserman A. Very deep convolutional networks for large-scale image recognition[OL]. [2017-07-10]. https:\/\/arxiv.org\/abs\/1409.1556."},{"key":"e_1_3_2_1_13_1","volume-title":"Learning deep features for discriminative localization[C] \/\/Proceedings of IEEE Conference on Computer Vision and Pattern Recognition","author":"Zhou B L","year":"2016","unstructured":"Zhou B L, Aditya K, Agata L, et al. Learning deep features for discriminative localization[C] \/\/Proceedings of IEEE Conference on Computer Vision and Pattern Recognition. Los Alamitos: IEEE Computer Society Press, 2016: 2922--2929"}],"event":{"name":"EITCE 2020: 2020 4th International Conference on Electronic Information Technology and Computer Engineering","location":"Xiamen China","acronym":"EITCE 2020"},"container-title":["Proceedings of the 2020 4th International Conference on Electronic Information Technology and Computer Engineering"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3443467.3443793","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3443467.3443793","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T22:02:14Z","timestamp":1750197734000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3443467.3443793"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,6]]},"references-count":13,"alternative-id":["10.1145\/3443467.3443793","10.1145\/3443467"],"URL":"https:\/\/doi.org\/10.1145\/3443467.3443793","relation":{},"subject":[],"published":{"date-parts":[[2020,11,6]]},"assertion":[{"value":"2021-02-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}