{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:24:08Z","timestamp":1750220648713,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":6,"publisher":"ACM","license":[{"start":{"date-parts":[[2020,11,6]],"date-time":"2020-11-06T00:00:00Z","timestamp":1604620800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2020,11,6]]},"DOI":"10.1145\/3443467.3443871","type":"proceedings-article","created":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T23:37:36Z","timestamp":1612222656000},"page":"875-879","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Thermal Failure Analysis of IGBT Based on Collector Leakage Current"],"prefix":"10.1145","author":[{"given":"Bo","family":"Wang","sequence":"first","affiliation":[{"name":"Mechanical and Electrical Engineering, Wuhan Donghu University, Wuhan, China"}]},{"given":"Yong","family":"Tang","sequence":"additional","affiliation":[{"name":"Mechanical and Electrical Engineering, Wuhan Donghu University, Wuhan, China"}]}],"member":"320","published-online":{"date-parts":[[2021,2]]},"reference":[{"issue":"5","key":"e_1_3_2_1_1_1","first-page":"61","article-title":"Novel trench gate field stop IGBT with trench shorted anode[J]","volume":"37","author":"Xudong Chen","year":"2016","unstructured":"Chen Xudong, Cheng Jianbing, Teng Guobing, et al. Novel trench gate field stop IGBT with trench shorted anode[J]. Iournal of Semiconductors, 2016, 37(5), pp. 61--64.","journal-title":"Iournal of Semiconductors"},{"key":"e_1_3_2_1_2_1","first-page":"2208","article-title":"Inverter Dynamic Electro-thermal Modeling and Simulation with Experimental Verification[C]","volume":"2005","author":"Reichl J.","unstructured":"J. Reichl, J. S. Lai, A. R. Hefner. Inverter Dynamic Electro-thermal Modeling and Simulation with Experimental Verification[C]. Proceedings of IEEE, 2005: 2208--2215.","journal-title":"Proceedings of IEEE"},{"key":"e_1_3_2_1_3_1","first-page":"37","article-title":"Simulation Studies and Modeling Short Circuit Current Oscillations in IGBTs[C]","volume":"2009","author":"Milady S","unstructured":"S Milady, D Silber, F Pfirsch, et al. Simulation Studies and Modeling Short Circuit Current Oscillations in IGBTs[C]. Proceeding of ISPSD, 2009: 37--40.","journal-title":"Proceeding of ISPSD"},{"key":"e_1_3_2_1_4_1","first-page":"715","article-title":"An Impact Analysis of Gate Resistance on Static and Dynamic Dissipation of IGBT Modules[C]","volume":"2011","author":"Hu","unstructured":"Hu Shao-wei, Zhu Yang-jun, Duan Yao-yu. An Impact Analysis of Gate Resistance on Static and Dynamic Dissipation of IGBT Modules[C]. Proceeding of ICECC, 2011: 715--718.","journal-title":"Proceeding of ICECC"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1002\/047172291X"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.07.058"}],"event":{"name":"EITCE 2020: 2020 4th International Conference on Electronic Information Technology and Computer Engineering","acronym":"EITCE 2020","location":"Xiamen China"},"container-title":["Proceedings of the 2020 4th International Conference on Electronic Information Technology and Computer Engineering"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3443467.3443871","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3443467.3443871","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T22:02:19Z","timestamp":1750197739000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3443467.3443871"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,6]]},"references-count":6,"alternative-id":["10.1145\/3443467.3443871","10.1145\/3443467"],"URL":"https:\/\/doi.org\/10.1145\/3443467.3443871","relation":{},"subject":[],"published":{"date-parts":[[2020,11,6]]},"assertion":[{"value":"2021-02-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}