{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:24:08Z","timestamp":1750220648984,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":15,"publisher":"ACM","license":[{"start":{"date-parts":[[2020,11,6]],"date-time":"2020-11-06T00:00:00Z","timestamp":1604620800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2020,11,6]]},"DOI":"10.1145\/3443467.3443897","type":"proceedings-article","created":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T23:48:19Z","timestamp":1612223299000},"page":"1013-1017","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Design of Visual Inspection System for Inner Surface of Small-diameter Workpiece"],"prefix":"10.1145","author":[{"given":"Feng","family":"Jiangang","sequence":"first","affiliation":[{"name":"College of Mechanical and Electronic Engineering, Shandong University of Science and Technology, Qingdao, China"}]},{"given":"Gao","family":"Feng","sequence":"additional","affiliation":[{"name":"College of Mechanical and Electronic Engineering, Shandong University of Science and Technology, Qingdao, China"}]},{"given":"Cai","family":"Xiaoyu","sequence":"additional","affiliation":[{"name":"Shanghai Institute of Measurementand Testing Technology, Shanghai, China"}]},{"given":"Wei","family":"Jiasi","sequence":"additional","affiliation":[{"name":"Shanghai Institute of Measurementand Testing Technology, Shanghai, China"}]},{"given":"Zhou","family":"Yong","sequence":"additional","affiliation":[{"name":"Shanghai JICE Information and Technology Co., Ltd, Shanghai, China"}]}],"member":"320","published-online":{"date-parts":[[2021,2]]},"reference":[{"issue":"08","key":"e_1_3_2_1_1_1","first-page":"23","article-title":"Summary of automatic optical (visual) inspection technology and its application in defect detection[J]","volume":"38","author":"Lu R S","year":"2018","unstructured":"Lu R S, Wu A, Zhang T D, et al. Summary of automatic optical (visual) inspection technology and its application in defect detection[J]. Acta Optica Sinica, 2018, 38(08): 23--58.","journal-title":"Acta Optica Sinica"},{"issue":"01","key":"e_1_3_2_1_2_1","first-page":"341","article-title":"Research on online detection of surface defects of stamping parts based on machine vision[J]","volume":"55","author":"Chen G F","year":"2018","unstructured":"Chen G F, Guan G Y, Wei X. Research on online detection of surface defects of stamping parts based on machine vision[J]. Progress in Laser and Optoelectronics, 2018, 55(01): 341--347.","journal-title":"Progress in Laser and Optoelectronics"},{"issue":"04","key":"e_1_3_2_1_3_1","first-page":"154","article-title":"Surface defect detection and topography analysis of cylindrical high-precision parts[J]","volume":"51","author":"Su J H","year":"2014","unstructured":"Su J H, Liu S L. Surface defect detection and topography analysis of cylindrical high-precision parts[J]. Progress in Laser and Optoelectronics, 2014, 51(04): 154--158.","journal-title":"Progress in Laser and Optoelectronics"},{"issue":"08","key":"e_1_3_2_1_4_1","first-page":"2025","article-title":"Three-dimensional imaging measurement system for the inner surface of small pipes[J]","volume":"37","author":"Ye J","year":"2010","unstructured":"Ye J, Zhou C H, Jia W. Three-dimensional imaging measurement system for the inner surface of small pipes[J]. Chinese Laser, 2010, 37(08): 2025--2028.","journal-title":"Chinese Laser"},{"key":"e_1_3_2_1_5_1","volume-title":"Research on the visual inspection system for the inner and outer wall of small-diameter workpiece[D]","author":"Lu W J","year":"2014","unstructured":"Lu W J. Research on the visual inspection system for the inner and outer wall of small-diameter workpiece[D]. Shanghai Jiaotong University, 2014."},{"key":"e_1_3_2_1_6_1","volume-title":"Optical System Design of Subminiature Endoscope with Imaging Fiber Bundle[C]\/\/ Conference on Advanced Laser Manufacturing Technology, may 09-11","author":"Lv J","year":"2016","unstructured":"Lv J, Xue B, Li T. Optical System Design of Subminiature Endoscope with Imaging Fiber Bundle[C]\/\/ Conference on Advanced Laser Manufacturing Technology, may 09-11, 2016. Beijing, China.Bellingham: SPIE, 2016:10153."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.020087"},{"issue":"12","key":"e_1_3_2_1_8_1","first-page":"45","article-title":"Technological Advancement of Ultrasonic Testing of the Small-Diameter Pipes[J]","volume":"78","author":"Burkin S P","year":"2012","unstructured":"Burkin S P, Serebryakov A V, Markov A D. Technological Advancement of Ultrasonic Testing of the Small-Diameter Pipes[J]. Inorganic Materials, 2012, 78(12): 45--49.","journal-title":"Inorganic Materials"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"crossref","unstructured":"Zhu Y Wei S C Dong Y C. Research on Ultrasonic Testing and Image Preprocessing Method of Re-manufactured Oil Pipe Inner Wall[C]\/\/Proceedings of 2017 IEEE Far East Forum on Nondestructive Evaluation\/Testing: New Technology & Application(IEEE FENDT 2017) June 22-24 2017.Xian China. New York: IEEE 2017: 23--25.","DOI":"10.1109\/FENDT.2017.8584582"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2014.56.10.560"},{"key":"e_1_3_2_1_11_1","volume-title":"Learning OpenCV[M]","author":"Gary B","year":"2009","unstructured":"Gary B, Adrian K. Learning OpenCV[M]. Beijing: TinghuauniversityPress, 2009."},{"issue":"05","key":"e_1_3_2_1_12_1","first-page":"373","article-title":"Pixel equivalent calibration method for vision measurement[J]","volume":"12","author":"Hao Y P","year":"2014","unstructured":"Hao Y P, Wang Y J, Zhang J Y, et al. Pixel equivalent calibration method for vision measurement[J]. Nanotechnology and Precision Engineering, 2014, 12(05): 373--380.","journal-title":"Nanotechnology and Precision Engineering"},{"issue":"09","key":"e_1_3_2_1_13_1","first-page":"95","article-title":"Design of high resolution imaging system based on polyline sampling[J]","volume":"32","author":"Wang S C","year":"2012","unstructured":"Wang S C, Huang Y P, Luo S W, et al. Design of high resolution imaging system based on polyline sampling[J]. Acta Optics, 2012, 32(09): 95--102.","journal-title":"Acta Optics"},{"issue":"01","key":"e_1_3_2_1_14_1","first-page":"71","article-title":"Standard template measurement technology based on SIFT image stitching algorithm [J]","volume":"56","author":"Cheng J R","year":"2019","unstructured":"Cheng J R, Zhao J, Cai X Y, et al. Standard template measurement technology based on SIFT image stitching algorithm [J]. Micro-Nanoelectronic Technology, 2019, 56(01): 71--77.","journal-title":"Micro-Nanoelectronic Technology"},{"issue":"02","key":"e_1_3_2_1_15_1","first-page":"250","article-title":"Adaptive Rotating Image Seamless Mosaic Algorithm Based on SIFT[J]","volume":"43","author":"Yao W","year":"2019","unstructured":"Yao W, Hu H. Adaptive Rotating Image Seamless Mosaic Algorithm Based on SIFT[J]. Journal of Nanjing University of Science and Technology, 2019, 43(02): 250--254.","journal-title":"Journal of Nanjing University of Science and Technology"}],"event":{"name":"EITCE 2020: 2020 4th International Conference on Electronic Information Technology and Computer Engineering","acronym":"EITCE 2020","location":"Xiamen China"},"container-title":["Proceedings of the 2020 4th International Conference on Electronic Information Technology and Computer Engineering"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3443467.3443897","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3443467.3443897","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T22:02:19Z","timestamp":1750197739000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3443467.3443897"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,6]]},"references-count":15,"alternative-id":["10.1145\/3443467.3443897","10.1145\/3443467"],"URL":"https:\/\/doi.org\/10.1145\/3443467.3443897","relation":{},"subject":[],"published":{"date-parts":[[2020,11,6]]},"assertion":[{"value":"2021-02-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}