{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T02:22:33Z","timestamp":1773195753802,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":20,"publisher":"ACM","license":[{"start":{"date-parts":[[2020,12,11]],"date-time":"2020-12-11T00:00:00Z","timestamp":1607644800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2020,12,11]]},"DOI":"10.1145\/3445815.3445853","type":"proceedings-article","created":{"date-parts":[[2021,3,17]],"date-time":"2021-03-17T17:05:28Z","timestamp":1616000728000},"page":"233-239","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":12,"title":["An Improved PCB Defect Detector Based on Feature Pyramid Networks"],"prefix":"10.1145","author":[{"given":"Dan","family":"Li","sequence":"first","affiliation":[{"name":"Hunan Normal University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"SongLing","family":"Fu","sequence":"additional","affiliation":[{"name":"Hunan Normal University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"QiJun","family":"Zhang","sequence":"additional","affiliation":[{"name":"Hunan Normal University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yang","family":"Mo","sequence":"additional","affiliation":[{"name":"Hunan Normal University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Liu","sequence":"additional","affiliation":[{"name":"Hunan Normal University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"ChuanFu","family":"Xu","sequence":"additional","affiliation":[{"name":"National University of Defense Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2021,3,17]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"149","volume-title":"International Conference on Frontiers of Signal Processing (ICFSP)","author":"Deng Y.S.","year":"2018","unstructured":"Deng , Y.S. , Luo , A.C. , Dai , M.J. :\u2018 Building an Automatic Defect Verification System Using Deep Neural Network for PCB Defect Classification\u2019 , International Conference on Frontiers of Signal Processing (ICFSP) , Poitiers, France , September 2018 ,pp. 145\u2013 149 Deng, Y.S., Luo, A.C.,Dai, M.J.:\u2018Building an Automatic Defect Verification System Using Deep Neural Network for PCB Defect Classification\u2019, International Conference on Frontiers of Signal Processing (ICFSP), Poitiers, France, September 2018,pp. 145\u2013149"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2014.08.218"},{"key":"e_1_3_2_1_3_1","volume-title":"Reducing misclassification of true defects in defect classification of electronic board. Computer and Information Science 719: 77","author":"Shiina T","year":"2018","unstructured":"Shiina T , Iwahori Y , Takada Y , Kijsirikul B , Bhuyan M , ( 2018 ) Reducing misclassification of true defects in defect classification of electronic board. Computer and Information Science 719: 77 . Shiina T, Iwahori Y, Takada Y, Kijsirikul B, Bhuyan M, (2018) Reducing misclassification of true defects in defect classification of electronic board. Computer and Information Science 719: 77."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"crossref","unstructured":"Peng W. Chang L. Mengyuan L. Yunlong G. & Hong L. . CNN-based reference comparison method for classifying bare PCB defects. 2018(16) 1528-1533.  Peng W. Chang L. Mengyuan L. Yunlong G. & Hong L. . CNN-based reference comparison method for classifying bare PCB defects. 2018(16) 1528-1533.","DOI":"10.1049\/joe.2018.8271"},{"key":"e_1_3_2_1_5_1","volume-title":"IEEE","author":"Ghosh B","year":"2019","unstructured":"Ghosh B , Bhuyan M K , Sasmal P , Defect Classification of Printed Circuit Boards based on Transfer Learning[C]\/\/ 2018 IEEE Applied Signal Processing Conference (ASPCON) . IEEE , 2019 . Ghosh B , Bhuyan M K , Sasmal P , Defect Classification of Printed Circuit Boards based on Transfer Learning[C]\/\/ 2018 IEEE Applied Signal Processing Conference (ASPCON). IEEE, 2019."},{"key":"e_1_3_2_1_6_1","volume-title":"Pseudo vs. True Defect Classification in Printed Circuits Boards using Wavelet Features[J]. Computer ence","author":"Sikka S","year":"2013","unstructured":"Sikka S , Sikka K , Bhuyan M K , Pseudo vs. True Defect Classification in Printed Circuits Boards using Wavelet Features[J]. Computer ence , 2013 . Sikka S , Sikka K , Bhuyan M K , Pseudo vs. True Defect Classification in Printed Circuits Boards using Wavelet Features[J]. Computer ence, 2013."},{"key":"e_1_3_2_1_7_1","volume-title":"Reduction of Defect Misclassification of Electronic Board Using Multiple SVM Classifiers [J]","author":"Nakagawa T","year":"2016","unstructured":"Nakagawa T , Iwahori Y , Bhuyan M K . Reduction of Defect Misclassification of Electronic Board Using Multiple SVM Classifiers [J] . 2016 . Nakagawa T, Iwahori Y, Bhuyan M K. Reduction of Defect Misclassification of Electronic Board Using Multiple SVM Classifiers [J]. 2016."},{"key":"e_1_3_2_1_8_1","first-page":"126","author":"Yuji Iwahori","year":"2018","unstructured":"Yuji Iwahori ,Yohei Takada, Tokiko Shiina ,Yoshinori Adachi,M.K. Bhuyan ,Boonserm Kijsirikul. Defect Classification of Electronic Board Using Dense SIFT and CNN [J]. Procedia Computer Science , 2018 , 126 . Yuji Iwahori,Yohei Takada,Tokiko Shiina,Yoshinori Adachi,M.K. Bhuyan,Boonserm Kijsirikul. Defect Classification of Electronic Board Using Dense SIFT and CNN [J]. Procedia Computer Science, 2018,126.","journal-title":"Procedia Computer Science"},{"key":"e_1_3_2_1_9_1","volume-title":"Feature-Learning-Based Printed Circuit Board Inspection via Speeded-Up Robust Features and Random Forest. Applied Sciences. 8. 932. 10.3390\/app8060932","author":"Yuk","year":"2018","unstructured":"Yuk , Eun & Park, Seung & Park, Cheong-Sool & Baek, Jun-Geol . ( 2018 ). Feature-Learning-Based Printed Circuit Board Inspection via Speeded-Up Robust Features and Random Forest. Applied Sciences. 8. 932. 10.3390\/app8060932 . Yuk, Eun & Park, Seung & Park, Cheong-Sool & Baek, Jun-Geol. (2018). Feature-Learning-Based Printed Circuit Board Inspection via Speeded-Up Robust Features and Random Forest. Applied Sciences. 8. 932. 10.3390\/app8060932."},{"key":"e_1_3_2_1_10_1","volume-title":"PATTERNS 2017 113\u2013116","author":"Yohei Takada","year":"2017","unstructured":"Yohei Takada , Tokiko Shiina, Hiroyasu Usami , Yuji Iwahori and M. K. Bhuyan ( 2017 ) \u201c Defect Detection and Classification of Electronic Circuit Boards Using Keypoint Extraction and CNN Features .\u201d PATTERNS 2017 113\u2013116 . Yohei Takada, Tokiko Shiina, Hiroyasu Usami, Yuji Iwahori and M. K. Bhuyan (2017) \u201cDefect Detection and Classification of Electronic Circuit Boards Using Keypoint Extraction and CNN Features.\u201d PATTERNS 2017 113\u2013116."},{"key":"e_1_3_2_1_11_1","first-page":"2018","author":"Jin Y.","year":"2018","unstructured":"Jin Y. Convolutional neural network-based multi-label classification of PCB defects [J]. The Journal of Engineering , 2018 , 2018 . Jin Y. Convolutional neural network-based multi-label classification of PCB defects [J]. The Journal of Engineering, 2018, 2018.","journal-title":"The Journal of Engineering"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.15344\/2456-4451\/2018\/137"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.106"},{"key":"e_1_3_2_1_14_1","volume-title":"Squeeze-and-Excitation Networks [J]","author":"Hu J","year":"2017","unstructured":"Hu J , Shen L , Albanie S , Squeeze-and-Excitation Networks [J] . IEEE Transactions on Pattern Analysis and Machine Intelligence, 2017 , PP ( 99). Hu J, Shen L, Albanie S, Squeeze-and-Excitation Networks [J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2017, PP (99)."},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00913"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.322"},{"key":"e_1_3_2_1_17_1","volume-title":"NIPS","author":"Ren K.","year":"2015","unstructured":"S. Ren , K. He , R. Girshick , and J. Sun . Faster R-CNN: Towards real-time object detection with region proposal networks . In NIPS , 2015 . S. Ren, K. He, R. Girshick, and J. Sun. Faster R-CNN: Towards real-time object detection with region proposal networks. In NIPS, 2015."},{"key":"e_1_3_2_1_18_1","volume-title":"Yolov3: An incremental improvement. ArXiv preprint arXiv","author":"Redmon J.","year":"1804","unstructured":"Redmon , J. and A. Farhadi , Yolov3: An incremental improvement. ArXiv preprint arXiv : 1804 .02767,2018. Redmon, J. and A. Farhadi, Yolov3: An incremental improvement. ArXiv preprint arXiv: 1804.02767,2018."},{"key":"e_1_3_2_1_19_1","volume-title":"Liao H Y M. YOLOv4: Optimal Speed and Accuracy of Object Detection [J]","author":"Bochkovskiy A","year":"2020","unstructured":"Bochkovskiy A , Wang C Y , Liao H Y M. YOLOv4: Optimal Speed and Accuracy of Object Detection [J] . 2020 . Bochkovskiy A, Wang C Y, Liao H Y M. YOLOv4: Optimal Speed and Accuracy of Object Detection [J]. 2020."},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.324"}],"event":{"name":"CSAI 2020: 2020 4th International Conference on Computer Science and Artificial Intelligence","location":"Zhuhai China","acronym":"CSAI 2020"},"container-title":["2020 4th International Conference on Computer Science and Artificial Intelligence"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3445815.3445853","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3445815.3445853","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T21:24:33Z","timestamp":1750195473000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3445815.3445853"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12,11]]},"references-count":20,"alternative-id":["10.1145\/3445815.3445853","10.1145\/3445815"],"URL":"https:\/\/doi.org\/10.1145\/3445815.3445853","relation":{},"subject":[],"published":{"date-parts":[[2020,12,11]]},"assertion":[{"value":"2021-03-17","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}