{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,17]],"date-time":"2026-05-17T03:06:40Z","timestamp":1778987200774,"version":"3.51.4"},"publisher-location":"New York, NY, USA","reference-count":15,"publisher":"ACM","license":[{"start":{"date-parts":[[2020,12,25]],"date-time":"2020-12-25T00:00:00Z","timestamp":1608854400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2020,12,25]]},"DOI":"10.1145\/3446999.3447642","type":"proceedings-article","created":{"date-parts":[[2021,4,9]],"date-time":"2021-04-09T23:22:49Z","timestamp":1618010569000},"page":"257-261","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Modeling of Random Variations in a Switched Capacitor Circuit based Physically Unclonable Function"],"prefix":"10.1145","author":[{"given":"Zahoor","family":"Ahmad","sequence":"first","affiliation":[{"name":"University of Applied Sciences Offenburg, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lukas","family":"Zimmermann","sequence":"additional","affiliation":[{"name":"Institute of Reliable Embedded Systems and Communication Electronics 77652 Offenburg Germany and Hochschule Offenburg Germany, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kai-Uwe","family":"M\u00fcller","sequence":"additional","affiliation":[{"name":"Fraunhofer Institute for Microelectronic Circuits and Systems IMS 47057 Duisburg, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Axel","family":"Sikora","sequence":"additional","affiliation":[{"name":"Institute of Reliable Embedded Systems and Communication Electronics 77652 Offenburg, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2021,4,9]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-04223-7"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2702607"},{"key":"e_1_3_2_1_3_1","volume-title":"Towards hardware-intrinsic security: foundations and practice","author":"Tuyls Pim","year":"2010","unstructured":"Tuyls, Pim. Towards hardware-intrinsic security: foundations and practice. Springer Science & Business Media, 2010."},{"key":"e_1_3_2_1_4_1","volume-title":"Workshop on Fault Diagnosis and Tolerance in Cryptography. IEEE","author":"Nedospasov Dmitry","year":"2013","unstructured":"Nedospasov, Dmitry, \"Invasive PUF analysis.\"2013 Workshop on Fault Diagnosis and Tolerance in Cryptography. IEEE, 2013."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.3390\/app10030759"},{"key":"e_1_3_2_1_6_1","volume-title":"IEEE","author":"Majzoobi Mehrdad","year":"2012","unstructured":"Majzoobi, Mehrdad, \"Slender PUF protocol: A lightweight, robust, and secure authentication by substring matching.\"2012 IEEE Symposium on Security and Privacy Workshops. IEEE, 2012."},{"key":"e_1_3_2_1_7_1","volume-title":"IEEE","author":"Sedcole Pete","year":"2006","unstructured":"Sedcole, Pete, and Peter YK Cheung. \"Within-die delay variability in 90nm FPGAs and beyond.\"2006 IEEE International Conference on Field Programmable Technology. IEEE, 2006."},{"key":"e_1_3_2_1_8_1","volume-title":"IEEE","author":"Forte Domenic","year":"2012","unstructured":"Forte, Domenic, and Ankur Srivastava. \"Manipulating manufacturing variations for better silicon-based physically unclonable functions.\"2012 IEEE Computer Society Annual Symposium on VLSI. IEEE, 2012."},{"key":"e_1_3_2_1_9_1","volume-title":"Belgium","author":"Roel M. A. E. S.","year":"2012","unstructured":"Roel, M. A. E. S. \"Physically unclonable functions: Constructions, properties and applications.\" Katholieke Universiteit Leuven, Belgium (2012)."},{"key":"e_1_3_2_1_10_1","volume-title":"A regression-based entropy distiller for RO PUFs","author":"Yin Chi-En","year":"2011","unstructured":"Yin, Chi-En. A regression-based entropy distiller for RO PUFs. 2011."},{"key":"e_1_3_2_1_11_1","volume-title":"IEEE","author":"Maiti Abhranil","year":"2009","unstructured":"Maiti, Abhranil, and Patrick Schaumont. \"Improving the quality of a physical unclonable function using configurable ring oscillators.\"2009 International Conference on Field Programmable Logic and Applications. IEEE, 2009."},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"crossref","unstructured":"Yin Chi-En and Gang Qu. \"Improving PUF security with regression-based distiller.\" Proceedings of the 50th Annual Design Automation Conference. 2013.","DOI":"10.1145\/2463209.2488960"},{"key":"e_1_3_2_1_13_1","volume-title":"IEEE","author":"Lorenz Juergen","year":"2014","unstructured":"Lorenz, Juergen, \"Simultaneous simulation of systematic and stochastic process variations.\"2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD). IEEE, 2014."},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2015.2440739"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2806041"}],"event":{"name":"ICIT 2020: IoT and Smart City","location":"Xi'an China","acronym":"ICIT 2020"},"container-title":["Proceedings of the 2020 8th International Conference on Information Technology: IoT and Smart City"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3446999.3447642","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3446999.3447642","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,17]],"date-time":"2026-05-17T02:15:31Z","timestamp":1778984131000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3446999.3447642"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12,25]]},"references-count":15,"alternative-id":["10.1145\/3446999.3447642","10.1145\/3446999"],"URL":"https:\/\/doi.org\/10.1145\/3446999.3447642","relation":{},"subject":[],"published":{"date-parts":[[2020,12,25]]},"assertion":[{"value":"2021-04-09","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}