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Storage"],"published-print":{"date-parts":[[2021,8,31]]},"abstract":"<jats:p>\n            A recent ultra-large SSD (e.g., a 32-TB SSD) provides many benefits in building cost-efficient enterprise storage systems. Owing to its large capacity, however, when such SSDs fail in a RAID storage system, a long rebuild overhead is inevitable for RAID reconstruction that requires a huge amount of data copies among SSDs. Motivated by modern SSD failure characteristics, we propose a new recovery scheme, called\n            <jats:italic>\n              <jats:sans-serif>reparo<\/jats:sans-serif>\n            <\/jats:italic>\n            , for a RAID storage system with ultra-large SSDs. Unlike existing RAID recovery schemes,\n            <jats:sans-serif>reparo<\/jats:sans-serif>\n            repairs a failed SSD at the NAND die granularity without replacing it with a new SSD, thus avoiding most of the inter-SSD data copies during a RAID recovery step. When a NAND die of an SSD fails,\n            <jats:sans-serif>reparo<\/jats:sans-serif>\n            exploits a multi-core processor of the SSD controller in identifying failed LBAs from the failed NAND die and recovering data from the failed LBAs. Furthermore,\n            <jats:sans-serif>reparo<\/jats:sans-serif>\n            ensures no negative post-recovery impact on the performance and lifetime of the repaired SSD. Experimental results using 32-TB enterprise SSDs show that\n            <jats:sans-serif>reparo<\/jats:sans-serif>\n            can recover from a NAND die failure about 57 times faster than the existing rebuild method while little degradation on the SSD performance and lifetime is observed after recovery.\n          <\/jats:p>","DOI":"10.1145\/3450977","type":"journal-article","created":{"date-parts":[[2021,8,17]],"date-time":"2021-08-17T00:10:00Z","timestamp":1629159000000},"page":"1-24","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":3,"title":["Reparo: A Fast RAID Recovery Scheme for Ultra-large SSDs"],"prefix":"10.1145","volume":"17","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6954-6787","authenticated-orcid":false,"given":"Duwon","family":"Hong","sequence":"first","affiliation":[{"name":"Seoul National University, Gwanak-ro, Gwanak-gu, Seoul, Korea"}]},{"given":"Keonsoo","family":"Ha","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Samsungjeonja-ro, Hwaseong-si, Gyeonggi-do, Korea"}]},{"given":"Minseok","family":"Ko","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Samsungjeonja-ro, Hwaseong-si, Gyeonggi-do, Korea"}]},{"given":"Myoungjun","family":"Chun","sequence":"additional","affiliation":[{"name":"Seoul National University, Gwanak-ro, Gwanak-gu, Seoul, Korea"}]},{"given":"Yoona","family":"Kim","sequence":"additional","affiliation":[{"name":"Seoul National University, Gwanak-ro, Gwanak-gu, Seoul, Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9753-2286","authenticated-orcid":false,"given":"Sungjin","family":"Lee","sequence":"additional","affiliation":[{"name":"Daegu Gyeongbuk Institute of Science and Technology (DGIST), Daegu, Korea"}]},{"given":"Jihong","family":"Kim","sequence":"additional","affiliation":[{"name":"Seoul National University, Gwanak-ro, Gwanak-gu, Seoul, Korea"}]}],"member":"320","published-online":{"date-parts":[[2021,8,16]]},"reference":[{"key":"e_1_2_1_1_1","unstructured":"Samsung SSD. 2018. 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