{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,4]],"date-time":"2025-06-04T15:48:40Z","timestamp":1749052120058},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","isbn-type":[{"value":"9781450384599","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,7,11]]},"DOI":"10.1145\/3460319","type":"proceedings","created":{"date-parts":[[2021,7,8]],"date-time":"2021-07-08T22:18:43Z","timestamp":1625782723000},"source":"Crossref","is-referenced-by-count":2,"title":["Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis"],"prefix":"10.1145","member":"320","published-online":{"date-parts":[[2021,7,11]]},"event":{"name":"ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis","location":"Virtual Denmark","acronym":"ISSTA '21","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering"]},"container-title":[],"original-title":[],"deposited":{"date-parts":[[2023,8,14]],"date-time":"2023-08-14T16:30:50Z","timestamp":1692030650000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/proceedings\/10.1145\/3460319"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,7,11]]},"ISBN":["9781450384599"],"references-count":0,"alternative-id":["10.1145\/3460319"],"URL":"https:\/\/doi.org\/10.1145\/3460319","relation":{},"subject":[],"published":{"date-parts":[[2021,7,11]]}}}