{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T03:53:42Z","timestamp":1769918022536,"version":"3.49.0"},"publisher-location":"New York, NY, USA","reference-count":21,"publisher":"ACM","license":[{"start":{"date-parts":[[2022,4,25]],"date-time":"2022-04-25T00:00:00Z","timestamp":1650844800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2022,4,25]]},"DOI":"10.1145\/3477314.3507273","type":"proceedings-article","created":{"date-parts":[[2022,5,7]],"date-time":"2022-05-07T00:37:36Z","timestamp":1651883856000},"page":"926-932","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["An automatic approach to detect problems in Android builds through screenshot analysis"],"prefix":"10.1145","author":[{"given":"Lorena P.","family":"de Figueiredo","sequence":"first","affiliation":[{"name":"SIDIA R&D Institute, Manaus, Brazil"}]},{"given":"Jonathan P.","family":"Gomes","sequence":"additional","affiliation":[{"name":"SIDIA R&D Institute, Manaus, Brazil"}]},{"given":"Flavia","family":"de S. Santos","sequence":"additional","affiliation":[{"name":"SIDIA R&D Institute, Manaus, Brazil"}]},{"given":"Guilherme M.","family":"Queiroz","sequence":"additional","affiliation":[{"name":"SIDIA R&D Institute, Manaus, Brazil"}]},{"given":"Felipe T.","family":"Giuntini","sequence":"additional","affiliation":[{"name":"SIDIA R&D Institute, Manaus, Brazil"}]},{"given":"Juliano E.","family":"Sales","sequence":"additional","affiliation":[{"name":"SIDIA R&D Institute, Manaus, Brazil"}]}],"member":"320","published-online":{"date-parts":[[2022,5,6]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"Florian\u00f3polis","author":"Feij\u00f3 de Araujo Araujo Jos\u00e9 Victor","year":"2017","unstructured":"Jos\u00e9 Victor Feij\u00f3 de Araujo Araujo. 2017. An\u00e1lise e Classifica\u00e7\u00e3o de imagens para aplica\u00e7\u00e3o de OCR em cupons fiscais. Trabalho de Conclus\u00e3o de Curso(gradua\u00e7\u00e3o) - Universidade Federal de Santa Catarina. Centro Tecnol\u00f3gico. Ci\u00eancias da Computa\u00e7\u00e3o, Florian\u00f3polis (2017), 90."},{"key":"e_1_3_2_1_2_1","volume-title":"Efficient learning machines: theories, concepts, and applications for engineers and system designers","author":"Awad Mariette","unstructured":"Mariette Awad and Rahul Khanna. 2015. Efficient learning machines: theories, concepts, and applications for engineers and system designers. Springer nature."},{"key":"e_1_3_2_1_3_1","unstructured":"Michael Battat. 2019. What Is Visual Testing? https:\/\/applitools.com\/blog\/visual-testing\/"},{"key":"e_1_3_2_1_4_1","volume-title":"GUIdiff-A Regression Testing Tool for Graphical User Interfaces. In 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation. IEEE, 499--500","author":"Bauersfeld Sebastian","year":"2013","unstructured":"Sebastian Bauersfeld. 2013. GUIdiff-A Regression Testing Tool for Graphical User Interfaces. In 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation. IEEE, 499--500."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2021.3070271"},{"key":"e_1_3_2_1_7_1","volume-title":"Visual Testing: A Beginner's Guide. https:\/\/www.browserstack.com\/guide\/visual-testing-beginners-guide\/","author":"Bose Shreya","year":"2020","unstructured":"Shreya Bose. 2020. Visual Testing: A Beginner's Guide. https:\/\/www.browserstack.com\/guide\/visual-testing-beginners-guide\/"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/3266237.3266273"},{"key":"e_1_3_2_1_9_1","volume-title":"Snapshot Testing: Benefits and Drawbacks. https:\/\/www.sitepen.com\/blog\/snapshot-testing-benefits-and-drawbacks\/","author":"Cheatham Jason","year":"2020","unstructured":"Jason Cheatham. 2020. Snapshot Testing: Benefits and Drawbacks. https:\/\/www.sitepen.com\/blog\/snapshot-testing-benefits-and-drawbacks\/"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/3167132.3167236"},{"key":"e_1_3_2_1_11_1","volume-title":"Number of smartphones sold to end users worldwide from 2007 to","year":"2021","unstructured":"Gatner. 2021. Number of smartphones sold to end users worldwide from 2007 to 2021. https:\/\/www.statista.com\/statistics\/263437\/global-smartphone-sales-to-end-users-since-2007\/"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1002\/smr.2228"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1007\/BF02430364"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.5555\/1288165.1288167"},{"key":"e_1_3_2_1_15_1","volume-title":"Chiranjib Bhattacharyya, and Karuturi Radha Krishna Murthy.","author":"Keerthi S. Sathiya","year":"2001","unstructured":"S. Sathiya Keerthi, Shirish Krishnaj Shevade, Chiranjib Bhattacharyya, and Karuturi Radha Krishna Murthy. 2001. Improvements to Platt's SMO algorithm for SVM classifier design. Neural computation 13, 3 (2001), 637--649."},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-08245-5_19"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-38006-9_3"},{"key":"e_1_3_2_1_18_1","unstructured":"Ryan Reith Melissa Chau. 2020. Smartphone Market Share. https:\/\/idc.com\/promo\/smartphone-market-share"},{"key":"e_1_3_2_1_19_1","volume-title":"Number of smartphone users worldwide from 2016 to","year":"2023","unstructured":"Newzoo. 2020. Number of smartphone users worldwide from 2016 to 2023. https:\/\/www.statista.com\/statistics\/330695\/number-of-smartphone-users-worldwide\/"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-7234-0_4"},{"key":"e_1_3_2_1_21_1","unstructured":"Andrew S Tanenbaum and Herbert Bos. 2015. Modern operating systems. Pearson."},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/72.788640"}],"event":{"name":"SAC '22: The 37th ACM\/SIGAPP Symposium on Applied Computing","location":"Virtual Event","acronym":"SAC '22","sponsor":["SIGAPP ACM Special Interest Group on Applied Computing"]},"container-title":["Proceedings of the 37th ACM\/SIGAPP Symposium on Applied Computing"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3477314.3507273","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3477314.3507273","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T19:30:30Z","timestamp":1750188630000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3477314.3507273"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,4,25]]},"references-count":21,"alternative-id":["10.1145\/3477314.3507273","10.1145\/3477314"],"URL":"https:\/\/doi.org\/10.1145\/3477314.3507273","relation":{},"subject":[],"published":{"date-parts":[[2022,4,25]]},"assertion":[{"value":"2022-05-06","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}