{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T03:48:33Z","timestamp":1772164113598,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","license":[{"start":{"date-parts":[[2022,6,6]],"date-time":"2022-06-06T00:00:00Z","timestamp":1654473600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100002418","name":"Intel Corporation","doi-asserted-by":"publisher","award":["Rising Star Faculty Award"],"award-info":[{"award-number":["Rising Star Faculty Award"]}],"id":[{"id":"10.13039\/100002418","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"NSF (National Science Foundation)","doi-asserted-by":"publisher","award":["CNS-1955997, CCF-1948256"],"award-info":[{"award-number":["CNS-1955997, CCF-1948256"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2022,6,6]]},"DOI":"10.1145\/3489048.3530972","type":"proceedings-article","created":{"date-parts":[[2022,6,2]],"date-time":"2022-06-02T10:30:55Z","timestamp":1654165855000},"page":"73-74","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Tensor Completion with Nearly Linear Samples Given Weak Side Information"],"prefix":"10.1145","author":[{"given":"Christina Lee","family":"Yu","sequence":"first","affiliation":[{"name":"Cornell University, Ithaca, NY, USA"}]},{"given":"Xumei","family":"Xi","sequence":"additional","affiliation":[{"name":"Cornell University, Ithaca, NY, USA"}]}],"member":"320","published-online":{"date-parts":[[2022,6,6]]},"event":{"name":"SIGMETRICS\/PERFORMANCE '22: ACM SIGMETRICS\/IFIP PERFORMANCE Joint International Conference on Measurement and Modeling of Computer Systems","location":"Mumbai India","acronym":"SIGMETRICS\/PERFORMANCE '22","sponsor":["SIGMETRICS ACM Special Interest Group on Measurement and Evaluation"]},"container-title":["Abstract Proceedings of the 2022 ACM SIGMETRICS\/IFIP PERFORMANCE Joint International Conference on Measurement and Modeling of Computer Systems"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3489048.3530972","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/abs\/10.1145\/3489048.3530972","content-type":"text\/html","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3489048.3530972","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3489048.3530972","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T15:02:26Z","timestamp":1750172546000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3489048.3530972"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6,6]]},"references-count":0,"alternative-id":["10.1145\/3489048.3530972","10.1145\/3489048"],"URL":"https:\/\/doi.org\/10.1145\/3489048.3530972","relation":{"is-identical-to":[{"id-type":"doi","id":"10.1145\/3547353.3530972","asserted-by":"object"}]},"subject":[],"published":{"date-parts":[[2022,6,6]]},"assertion":[{"value":"2022-06-06","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}