{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T16:55:03Z","timestamp":1777568103596,"version":"3.51.4"},"publisher-location":"New York, NY, USA","reference-count":10,"publisher":"ACM","license":[{"start":{"date-parts":[[2022,7,10]],"date-time":"2022-07-10T00:00:00Z","timestamp":1657411200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2022,7,10]]},"DOI":"10.1145\/3489517.3530412","type":"proceedings-article","created":{"date-parts":[[2022,8,23]],"date-time":"2022-08-23T23:19:29Z","timestamp":1661296769000},"page":"73-78","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":18,"title":["DA PUF"],"prefix":"10.1145","author":[{"given":"Jiliang","family":"Zhang","sequence":"first","affiliation":[{"name":"Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lin","family":"Ding","sequence":"additional","affiliation":[{"name":"Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhuojun","family":"Chen","sequence":"additional","affiliation":[{"name":"Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenshang","family":"Li","sequence":"additional","affiliation":[{"name":"Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gang","family":"Qu","sequence":"additional","affiliation":[{"name":"University of Maryland"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2022,8,23]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2332291"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2011.72"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2506641"},{"key":"e_1_3_2_1_4_1","first-page":"146","article-title":"8.3 A 553F2 2-transistor amplifier-based Physically Unclonable Function (PUF) with 1.67% native instability","author":"Yang K.","year":"2017","unstructured":"K. Yang et al., \"8.3 A 553F2 2-transistor amplifier-based Physically Unclonable Function (PUF) with 1.67% native instability,\" in IEEE ISSCC, 2017, p. 146--147.","journal-title":"IEEE ISSCC"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2865584"},{"issue":"1","key":"e_1_3_2_1_6_1","first-page":"100","article-title":"A Multimode Configurable Physically Unclonable Function With Bit-Instability-Screening and Power-Gating Strategies","volume":"29","author":"Li G.","year":"2020","unstructured":"G. Li et al., \"A Multimode Configurable Physically Unclonable Function With Bit-Instability-Screening and Power-Gating Strategies,\" IEEE TVLSI, vol. 29, no. 1, pp. 100--111, 2020.","journal-title":"IEEE TVLSI"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3014386"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2938133"},{"key":"e_1_3_2_1_9_1","volume-title":"Machine-Learning Resistant 1028 Challenge-Response PUF in 14nm CMOS Featuring Stability-Aware Adversarial Challenge Selection,\" in IEEE\/ACM DAC","author":"Suresh V. B.","year":"2020","unstructured":"V. B. Suresh et al., \"INVITED: A 0.26% BER, Machine-Learning Resistant 1028 Challenge-Response PUF in 14nm CMOS Featuring Stability-Aware Adversarial Challenge Selection,\" in IEEE\/ACM DAC, 2020, p. 1--3"},{"key":"e_1_3_2_1_10_1","first-page":"1000","article-title":"Making Obfuscated PUFs Secure Against Power Side-Channel Based Modeling Attacks","author":"Kroeger T.","year":"2021","unstructured":"T. Kroeger et al., \"Making Obfuscated PUFs Secure Against Power Side-Channel Based Modeling Attacks,\" in IEEE\/ACM DATE, 2021, p. 1000--1005","journal-title":"IEEE\/ACM DATE"}],"event":{"name":"DAC '22: 59th ACM\/IEEE Design Automation Conference","location":"San Francisco California","acronym":"DAC '22","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CEDA"]},"container-title":["Proceedings of the 59th ACM\/IEEE Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3489517.3530412","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3489517.3530412","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T20:18:39Z","timestamp":1750191519000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3489517.3530412"}},"subtitle":["dual-state analog PUF"],"short-title":[],"issued":{"date-parts":[[2022,7,10]]},"references-count":10,"alternative-id":["10.1145\/3489517.3530412","10.1145\/3489517"],"URL":"https:\/\/doi.org\/10.1145\/3489517.3530412","relation":{},"subject":[],"published":{"date-parts":[[2022,7,10]]},"assertion":[{"value":"2022-08-23","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}