{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:19:59Z","timestamp":1750220399524,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":18,"publisher":"ACM","license":[{"start":{"date-parts":[[2021,11,26]],"date-time":"2021-11-26T00:00:00Z","timestamp":1637884800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"name":"Chinese National Science Foundation","award":["72001210"],"award-info":[{"award-number":["72001210"]}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2021,11,26]]},"DOI":"10.1145\/3503047.3503058","type":"proceedings-article","created":{"date-parts":[[2022,1,19]],"date-time":"2022-01-19T23:32:54Z","timestamp":1642635174000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["A Residual Life Prediction model for Bivariate Degraded Products Based on Copula and Particle Filtering"],"prefix":"10.1145","author":[{"given":"Tianyu","family":"Liu","sequence":"first","affiliation":[{"name":"College of Systems Engineering, National University of Defense Technology, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lei","family":"Yao","sequence":"additional","affiliation":[{"name":"College of Systems Engineering, National University of Defense Technology, China and China Aerospace and Technology Corporation, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bo","family":"Qiu","sequence":"additional","affiliation":[{"name":"College of Systems Engineering, National University of Defense Technology, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pengqizi","family":"Huang","sequence":"additional","affiliation":[{"name":"College of Systems Engineering, National University of Defense Technology, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2022,1,19]]},"reference":[{"volume-title":"Prognostics and Health Management of Electronics","author":"Pecht M.","key":"e_1_3_2_1_1_1","unstructured":"Pecht M. 2008. Prognostics and Health Management of Electronics , Wiley , Hoboken, NJ . Pecht M. 2008. Prognostics and Health Management of Electronics, Wiley, Hoboken, NJ."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1437\/1\/012025"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X15579322"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10050540"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.107675"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1022"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1080\/00949655.2012.658805"},{"key":"e_1_3_2_1_8_1","first-page":"1","article-title":"Reliability Modeling f or Systems with Multiple Degradation Processes Using Inverse Gaussian Process and Copulas. Mathematical Problems in Engineering","volume":"829597","author":"Liu ZY","year":"2014","unstructured":"Liu ZY , Ma XB , Yang J , Zhao Y. 2014 . Reliability Modeling f or Systems with Multiple Degradation Processes Using Inverse Gaussian Process and Copulas. Mathematical Problems in Engineering , Article ID 829597 : 1 - 10 . Liu ZY, Ma XB, Yang J, Zhao Y. 2014. Reliability Modeling f or Systems with Multiple Degradation Processes Using Inverse Gaussian Process and Copulas. Mathematical Problems in Engineering, Article ID 829597:1-10.","journal-title":"Article ID"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1080\/00949655.2012.719026"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"crossref","unstructured":"Pan G Li Y Li X Luo Q Wang C Hu X. 2020. A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function. Microelectronics Reliability 113758.  Pan G Li Y Li X Luo Q Wang C Hu X. 2020. A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function. Microelectronics Reliability 113758.","DOI":"10.1016\/j.microrel.2020.113758"},{"issue":"1","key":"e_1_3_2_1_11_1","first-page":"1","article-title":"Residual Life Estimation under Time-varying Conditions based on a Wiener Process [J]","volume":"87","author":"Liu Ty Q","year":"2017","unstructured":"Liu Ty , Sun Q , Feng J , Pan ZQ , Huang PQZ . 2017 . Residual Life Estimation under Time-varying Conditions based on a Wiener Process [J] . Journal of Statistical Computation and Simulation , 87 ( 1-3 ): 1 - 16 . Liu Ty, Sun Q, Feng J, Pan ZQ, Huang PQZ. 2017. Residual Life Estimation under Time-varying Conditions based on a Wiener Process [J]. Journal of Statistical Computation and Simulation, 87(1-3):1-16.","journal-title":"Journal of Statistical Computation and Simulation"},{"key":"e_1_3_2_1_12_1","volume-title":"2014 A Mutated Particle Filter Technique for System State Estimation and Battery Life Prediction","author":"Li DZ","year":"2034","unstructured":"Li DZ , Wang W , Ismail F. 2014 A Mutated Particle Filter Technique for System State Estimation and Battery Life Prediction . IEEE transactions on instrumentation and measurement, 63(8): 2034 -2043. Li DZ, Wang W, Ismail F. 2014 A Mutated Particle Filter Technique for System State Estimation and Battery Life Prediction. IEEE transactions on instrumentation and measurement, 63(8): 2034-2043."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/78.978374"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106646"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2021.116897"},{"key":"e_1_3_2_1_16_1","first-page":"2168","article-title":"A Health Indicator Extraction and Optimization Framework for Lithium-Ion Battery Degradation Modeling and Prognostics","volume":"2015","author":"Liu J.","year":"2015","unstructured":"Liu , J. Zhou , H. Liao , Y. Peng , and X. Peng . 2015 . A Health Indicator Extraction and Optimization Framework for Lithium-Ion Battery Degradation Modeling and Prognostics . IEEE Transactions on Systems, Man, and Cybernetics: Systems , 2015 : 2168 - 2216 . Liu, J. Zhou, H. Liao, Y. Peng, and X. Peng. 2015. A Health Indicator Extraction and Optimization Framework for Lithium-Ion Battery Degradation Modeling and Prognostics. IEEE Transactions on Systems, Man, and Cybernetics: Systems, 2015: 2168-2216.","journal-title":"IEEE Transactions on Systems, Man, and Cybernetics: Systems"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2016.04.014"},{"key":"e_1_3_2_1_18_1","volume-title":"NASA Ames Prognostics Data Repository, [http:\/\/ti.arc.nasa.gov\/project\/prognostic-data-repository], NASA Ames","author":"Data B.","year":"2007","unstructured":"Data \" B. Saha and K. Goebel ( 2007 ). \" Battery Data Set \", NASA Ames Prognostics Data Repository, [http:\/\/ti.arc.nasa.gov\/project\/prognostic-data-repository], NASA Ames , Moffett Field , CA \". Data \"B. Saha and K. Goebel (2007). \"Battery Data Set\", NASA Ames Prognostics Data Repository, [http:\/\/ti.arc.nasa.gov\/project\/prognostic-data-repository], NASA Ames, Moffett Field, CA\"."}],"event":{"name":"AISS 2021: 2021 3rd International Conference on Advanced Information Science and System","acronym":"AISS 2021","location":"Sanya China"},"container-title":["Proceedings of the 3rd International Conference on Advanced Information Science and System"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3503047.3503058","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3503047.3503058","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T20:18:48Z","timestamp":1750191528000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3503047.3503058"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,11,26]]},"references-count":18,"alternative-id":["10.1145\/3503047.3503058","10.1145\/3503047"],"URL":"https:\/\/doi.org\/10.1145\/3503047.3503058","relation":{},"subject":[],"published":{"date-parts":[[2021,11,26]]},"assertion":[{"value":"2022-01-19","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}