{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T06:04:03Z","timestamp":1781762643206,"version":"3.54.5"},"publisher-location":"New York, NY, USA","reference-count":40,"publisher":"ACM","license":[{"start":{"date-parts":[[2022,6,14]],"date-time":"2022-06-14T00:00:00Z","timestamp":1655164800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2022,6,14]]},"DOI":"10.1145\/3519941.3535070","type":"proceedings-article","created":{"date-parts":[[2022,6,10]],"date-time":"2022-06-10T18:27:39Z","timestamp":1654885659000},"page":"73-85","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["Trace-and-brace (TAB): bespoke software countermeasures against soft errors"],"prefix":"10.1145","author":[{"given":"Yousun","family":"Ko","sequence":"first","affiliation":[{"name":"Yonsei University, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Alex","family":"Bradbury","sequence":"additional","affiliation":[{"name":"lowRISC, UK"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bernd","family":"Burgstaller","sequence":"additional","affiliation":[{"name":"Yonsei University, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Robert","family":"Mullins","sequence":"additional","affiliation":[{"name":"University of Cambridge, UK"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2022,6,14]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"2019. Spike a RISC-V ISA Simulator. https:\/\/github.com\/riscv\/riscv-isa-sim  2019. Spike a RISC-V ISA Simulator. https:\/\/github.com\/riscv\/riscv-isa-sim"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCDCS.2002.1004088"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/CIT.2010.356"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1147\/rd.282.0124"},{"key":"e_1_3_2_1_6_1","volume-title":"Instruction Duplication: Leaky and Not Too Fault-Tolerant!","author":"Cojocar Lucian","year":"2018","unstructured":"Lucian Cojocar , Kostas Papagiannopoulos , and Niek Timmers . 2018 . Instruction Duplication: Leaky and Not Too Fault-Tolerant! . In Smart Card Research and Advanced Applications, Thomas Eisenbarth and Yannick Teglia (Eds.). Springer International Publishing , Cham . 160\u2013179. isbn:978-3-319-75208-2 Lucian Cojocar, Kostas Papagiannopoulos, and Niek Timmers. 2018. Instruction Duplication: Leaky and Not Too Fault-Tolerant!. In Smart Card Research and Advanced Applications, Thomas Eisenbarth and Yannick Teglia (Eds.). Springer International Publishing, Cham. 160\u2013179. isbn:978-3-319-75208-2"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/115372.115320"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898054"},{"key":"e_1_3_2_1_9_1","volume-title":"Proc. 2009 IEEE Workshop on Silicon Errors in Logic-System Effects (SELSE), March.","author":"Dixit Anand","year":"2009","unstructured":"Anand Dixit , Raymond Heald , and Alan Wood . 2009 . Trends from ten years of soft error experimentation . Proc. 2009 IEEE Workshop on Silicon Errors in Logic-System Effects (SELSE), March. Anand Dixit, Raymond Heald, and Alan Wood. 2009. Trends from ten years of soft error experimentation. Proc. 2009 IEEE Workshop on Silicon Errors in Logic-System Effects (SELSE), March."},{"key":"e_1_3_2_1_10_1","volume-title":"FISSC: A Fault Injection and Simulation Secure\u00a0Collection","author":"Dureuil Louis","year":"2016","unstructured":"Louis Dureuil , Guillaume Petiot , Marie-Laure Potet , Thanh-Ha Le , Aude Crohen , and Philippe de Choudens . 2016 . FISSC: A Fault Injection and Simulation Secure\u00a0Collection . In Computer Safety, Reliability, and Security, Amund Skavhaug, J\u00e9r\u00e9mie Guiochet, and Friedemann Bitsch (Eds.). Springer International Publishing , Cham . 3\u201311. isbn:978-3-319-45477-1 Louis Dureuil, Guillaume Petiot, Marie-Laure Potet, Thanh-Ha Le, Aude Crohen, and Philippe de Choudens. 2016. FISSC: A Fault Injection and Simulation Secure\u00a0Collection. In Computer Safety, Reliability, and Security, Amund Skavhaug, J\u00e9r\u00e9mie Guiochet, and Friedemann Bitsch (Eds.). Springer International Publishing, Cham. 3\u201311. isbn:978-3-319-45477-1"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED48828.2020.9137051"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/1736020.1736063"},{"key":"e_1_3_2_1_13_1","volume-title":"Commercially Representative Embedded Benchmark Suite. In Proceedings of the Workload Characterization, 2001. WWC-4. 2001 IEEE International Workshop (WWC \u201901)","author":"Guthaus M. R.","unstructured":"M. R. Guthaus , J. S. Ringenberg , D. Ernst , T. M. Austin , T. Mudge , and R. B. Brown . 2001. MiBench: A Free , Commercially Representative Embedded Benchmark Suite. In Proceedings of the Workload Characterization, 2001. WWC-4. 2001 IEEE International Workshop (WWC \u201901) . IEEE Computer Society, USA. 3\u201314. isbn:0780373154 M. R. Guthaus, J. S. Ringenberg, D. Ernst, T. M. Austin, T. Mudge, and R. B. Brown. 2001. MiBench: A Free, Commercially Representative Embedded Benchmark Suite. In Proceedings of the Workload Characterization, 2001. WWC-4. 2001 IEEE International Workshop (WWC \u201901). IEEE Computer Society, USA. 3\u201314. isbn:0780373154"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2012.6263960"},{"key":"e_1_3_2_1_15_1","unstructured":"SiFive Inc.. 2019. SiFive U54 Manual. http:\/\/www.sifive.com  SiFive Inc.. 2019. SiFive U54 Manual. http:\/\/www.sifive.com"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241927"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1145\/3320269.3384738"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2014.33"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715158"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2019.102862"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1982.1056489"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1145\/3014586"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/12.2145"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1979.19370"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/24.994913"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/24.994926"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1145\/3368826.3377920"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1999.802887"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/CGO.2005.34"},{"key":"e_1_3_2_1_30_1","volume-title":"Efficient fault-injection-based assessment of software-implemented hardware fault tolerance. Ph. D. Dissertation","author":"Schirmeier Horst","year":"2003","unstructured":"Horst Schirmeier . 2016. Efficient fault-injection-based assessment of software-implemented hardware fault tolerance. Ph. D. Dissertation . Technical University Dortmund , Germany. http:\/\/hdl.handle.net\/ 2003 \/35175 Horst Schirmeier. 2016. Efficient fault-injection-based assessment of software-implemented hardware fault tolerance. Ph. D. Dissertation. Technical University Dortmund, Germany. http:\/\/hdl.handle.net\/2003\/35175"},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2015.44"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1145\/1897816.1897844"},{"key":"e_1_3_2_1_33_1","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593195"},{"key":"e_1_3_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.23919\/DATE51398.2021.9473917"},{"key":"e_1_3_2_1_35_1","doi-asserted-by":"publisher","DOI":"10.1145\/2503210.2503257"},{"key":"e_1_3_2_1_36_1","doi-asserted-by":"publisher","DOI":"10.1145\/1366224.1366227"},{"key":"e_1_3_2_1_37_1","doi-asserted-by":"publisher","DOI":"10.1145\/3377555.3377897"},{"key":"e_1_3_2_1_38_1","unstructured":"Andrew Waterman and Krste Asanovic. 2019. The RISC-V Instruction Set Manual Volume I: User-Level ISA. https:\/\/five-embeddev.com\/riscv-isa-manual\/latest\/riscv-spec.html  Andrew Waterman and Krste Asanovic. 2019. The RISC-V Instruction Set Manual Volume I: User-Level ISA. https:\/\/five-embeddev.com\/riscv-isa-manual\/latest\/riscv-spec.html"},{"key":"e_1_3_2_1_39_1","doi-asserted-by":"publisher","DOI":"10.1109\/CGO.2009.14"},{"key":"e_1_3_2_1_40_1","doi-asserted-by":"publisher","DOI":"10.1145\/3372799.3394360"}],"event":{"name":"LCTES '22: 23rd ACM SIGPLAN\/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems","location":"San Diego CA USA","acronym":"LCTES '22","sponsor":["SIGPLAN ACM Special Interest Group on Programming Languages","SIGBED ACM Special Interest Group on Embedded Systems"]},"container-title":["Proceedings of the 23rd ACM SIGPLAN\/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3519941.3535070","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3519941.3535070","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T18:10:31Z","timestamp":1750183831000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3519941.3535070"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6,14]]},"references-count":40,"alternative-id":["10.1145\/3519941.3535070","10.1145\/3519941"],"URL":"https:\/\/doi.org\/10.1145\/3519941.3535070","relation":{},"subject":[],"published":{"date-parts":[[2022,6,14]]},"assertion":[{"value":"2022-06-14","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}