{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,7]],"date-time":"2026-10-07T22:29:47Z","timestamp":1791412187043,"version":"4.3.3"},"publisher-location":"New York, NY, USA","reference-count":29,"publisher":"ACM","license":[{"start":{"date-parts":[[2022,5,17]],"date-time":"2022-05-17T00:00:00Z","timestamp":1652745600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2022,5,17]]},"DOI":"10.1145\/3524481.3527216","type":"proceedings-article","created":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T16:51:53Z","timestamp":1658249513000},"page":"6-16","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":10,"title":["Checked coverage for test suite reduction"],"prefix":"10.1145","author":[{"given":"Roxane","family":"Koitz-Hristov","sequence":"first","affiliation":[{"name":"Graz University of Technology, Graz, Austria"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lukas","family":"Stracke","sequence":"additional","affiliation":[{"name":"Graz University of Technology, Graz, Austria"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Franz","family":"Wotawa","sequence":"additional","affiliation":[{"name":"Graz University of Technology, Graz, Austria"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2022,7,19]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/3468264.3473123"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2014.2372785"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2017.45"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW50294.2020.00068"},{"key":"e_1_3_2_1_5_1","volume-title":"CUTER: ClUstering-based TEst Suite Reduction. In 2018 IEEE\/ACM 40th International Conference on Software Engineering: Companion (ICSE-Companion). 306--307","author":"Coviello Carmen","year":"2018","unstructured":"Carmen Coviello , Simone Romano , and Giuseppe Scanniello . 2018 . CUTER: ClUstering-based TEst Suite Reduction. In 2018 IEEE\/ACM 40th International Conference on Software Engineering: Companion (ICSE-Companion). 306--307 . Carmen Coviello, Simone Romano, and Giuseppe Scanniello. 2018. CUTER: ClUstering-based TEst Suite Reduction. In 2018 IEEE\/ACM 40th International Conference on Software Engineering: Companion (ICSE-Companion). 306--307."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/3239235.3240497"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/3382494.3422157"},{"key":"e_1_3_2_1_8_1","volume-title":"Design Patterns: Elements of Reusable Object-Oriented Software","author":"Gamma Erich","year":"1995","unstructured":"Erich Gamma , Richard Helm , Ralph Johnson , and John Vlissides . 1995 . Design Patterns: Elements of Reusable Object-Oriented Software . Addison-Wesley Longman Publishing Co., Inc. , USA. Erich Gamma, Richard Helm, Ralph Johnson, and John Vlissides. 1995. Design Patterns: Elements of Reusable Object-Oriented Software. Addison-Wesley Longman Publishing Co., Inc., USA."},{"key":"e_1_3_2_1_9_1","volume-title":"Genetic Algorithms in Search, Optimization and Machine Learning","author":"Goldberg David E.","unstructured":"David E. Goldberg . 1989. Genetic Algorithms in Search, Optimization and Machine Learning ( 1 st ed.). Addison-Wesley Longman Publishing Co., Inc. , USA. David E. Goldberg. 1989. Genetic Algorithms in Search, Optimization and Machine Learning (1st ed.). Addison-Wesley Longman Publishing Co., Inc., USA.","edition":"1"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/152388.152391"},{"key":"e_1_3_2_1_11_1","volume-title":"2005 IEEE International Conference on Systems, Man and Cybernetics","volume":"1","year":"2005","unstructured":"Zhen-feng He, Bin-kui Sheng, Cheng-qing Ye, 2005 . A genetic algorithm for test-suite reduction . In 2005 IEEE International Conference on Systems, Man and Cybernetics , Vol. 1 . IEEE, 133--139. Zhen-feng He, Bin-kui Sheng, Cheng-qing Ye, et al. 2005. A genetic algorithm for test-suite reduction. In 2005 IEEE International Conference on Systems, Man and Cybernetics, Vol. 1. IEEE, 133--139."},{"key":"e_1_3_2_1_12_1","volume-title":"An analysis and survey of the development of mutation testing","author":"Jia Yue","year":"2010","unstructured":"Yue Jia and Mark Harman . 2010. An analysis and survey of the development of mutation testing . IEEE transactions on software engineering 37, 5 ( 2010 ), 649--678. Yue Jia and Mark Harman. 2010. An analysis and survey of the development of mutation testing. IEEE transactions on software engineering 37, 5 (2010), 649--678."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2628055"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2809600"},{"key":"e_1_3_2_1_15_1","volume-title":"Dynamic program slicing. Information processing letters 29, 3","author":"Korel Bogdan","year":"1988","unstructured":"Bogdan Korel and Janusz Laski . 1988. Dynamic program slicing. Information processing letters 29, 3 ( 1988 ), 155--163. Bogdan Korel and Janusz Laski. 1988. Dynamic program slicing. Information processing letters 29, 3 (1988), 155--163."},{"key":"e_1_3_2_1_16_1","volume-title":"Advanced Parallel Processing Technologies","author":"Ye.","unstructured":"Xue-ying Ma, Bin-kui Sheng, and Cheng-qing Ye. 2005. Test-Suite Reduction Using Genetic Algorithm . In Advanced Parallel Processing Technologies , Jiannong Cao, Wolfgang Nejdl, and Ming Xu (Eds.). Springer Berlin Heidelberg , Berlin, Heidelberg , 253--262. Xue-ying Ma, Bin-kui Sheng, and Cheng-qing Ye. 2005. Test-Suite Reduction Using Genetic Algorithm. In Advanced Parallel Processing Technologies, Jiannong Cao, Wolfgang Nejdl, and Ming Xu (Eds.). Springer Berlin Heidelberg, Berlin, Heidelberg, 253--262."},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2777831"},{"key":"e_1_3_2_1_18_1","volume-title":"Papadimitriou and Kenneth Steiglitz","author":"Christos","year":"1981","unstructured":"Christos H. Papadimitriou and Kenneth Steiglitz . 1981 . Combinatorial Optimization : Algorithms and Complexity . Christos H. Papadimitriou and Kenneth Steiglitz. 1981. Combinatorial Optimization: Algorithms and Complexity."},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.256"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2011.32"},{"key":"e_1_3_2_1_21_1","volume-title":"Checked coverage: an indicator for oracle quality. Software testing, verification and reliability 23, 7","author":"Schuler David","year":"2013","unstructured":"David Schuler and Andreas Zeller . 2013. Checked coverage: an indicator for oracle quality. Software testing, verification and reliability 23, 7 ( 2013 ), 531--551. David Schuler and Andreas Zeller. 2013. Checked coverage: an indicator for oracle quality. Software testing, verification and reliability 23, 7 (2013), 531--551."},{"key":"e_1_3_2_1_22_1","volume-title":"Test Suite Reduction with Checked Coverage. Master's thesis","author":"Stracke Lukas","unstructured":"Lukas Stracke . 2022. Test Suite Reduction with Checked Coverage. Master's thesis . Graz University of Technology . Lukas Stracke. 2022. Test Suite Reduction with Checked Coverage. Master's thesis. Graz University of Technology."},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1145\/1108792.1108802"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.5555\/2349018"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.5555\/279852.279853"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0164-1212(99)00048-5"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1093\/comjnl\/bxm021"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1002\/stv.430"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786858"}],"event":{"name":"AST '22: IEEE\/ACM 3rd International Conference on Automation of Software Test","location":"Pittsburgh Pennsylvania","acronym":"AST '22","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","IEEE TCSC IEEE Technical Committee on Scalable Computing"]},"container-title":["Proceedings of the 3rd ACM\/IEEE International Conference on Automation of Software Test"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3524481.3527216","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3524481.3527216","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T17:50:59Z","timestamp":1750182659000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3524481.3527216"}},"subtitle":["is it worth the effort?"],"short-title":[],"issued":{"date-parts":[[2022,5,17]]},"references-count":29,"alternative-id":["10.1145\/3524481.3527216","10.1145\/3524481"],"URL":"https:\/\/doi.org\/10.1145\/3524481.3527216","relation":{},"subject":[],"published":{"date-parts":[[2022,5,17]]},"assertion":[{"value":"2022-07-19","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}