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Fault attacks work by forcing a device to work under non-ideal environmental conditions (such as high temperature) or external disturbances (such as glitch in the power supply) while performing a cryptographic operation. The recent trend shows that the amount of research in this direction\u2014which ranges from attacking a particular primitive, proposing a fault countermeasure, to attacking countermeasures\u2014has grown up substantially and is going to stay as an active research interest for the foreseeable future. Hence, it becomes apparent to have a comprehensive yet compact study of the (major) works. This work, which covers a wide spectrum in the present-day research on fault attacks that fall under the purview of the symmetric key cryptography, aims at fulfilling the absence of an up-to-date survey. We present mostly all aspects of the topic in a way that is not only understandable for a non-expert reader, but also helpful for an expert as a reference.<\/jats:p>","DOI":"10.1145\/3530054","type":"journal-article","created":{"date-parts":[[2022,4,12]],"date-time":"2022-04-12T11:00:46Z","timestamp":1649761246000},"page":"1-34","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":50,"title":["A Survey on Fault Attacks on Symmetric Key Cryptosystems"],"prefix":"10.1145","volume":"55","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5639-7372","authenticated-orcid":false,"given":"Anubhab","family":"Baksi","sequence":"first","affiliation":[{"name":"Temasek Laboratories, Nanyang Technological University, Singapore, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6903-5127","authenticated-orcid":false,"given":"Shivam","family":"Bhasin","sequence":"additional","affiliation":[{"name":"Temasek Laboratories, Nanyang Technological University, Singapore, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7844-5267","authenticated-orcid":false,"given":"Jakub","family":"Breier","sequence":"additional","affiliation":[{"name":"Silicon Austria Labs, Graz, Austria"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3149-9401","authenticated-orcid":false,"given":"Dirmanto","family":"Jap","sequence":"additional","affiliation":[{"name":"Temasek Laboratories, Nanyang Technological University, Singapore, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4668-073X","authenticated-orcid":false,"given":"Dhiman","family":"Saha","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering &amp; Computer Science, Indian Institute of Technology, Bhilai, India"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2022,11,21]]},"reference":[{"key":"e_1_3_2_2_2","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2011.10"},{"key":"e_1_3_2_3_2","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2013.11"},{"key":"e_1_3_2_4_2","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-012-0046-y"},{"key":"e_1_3_2_5_2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-38519-3_2"},{"key":"e_1_3_2_6_2","article-title":"Fault Analysis of Kuznyechik","author":"AlTawy Riham","year":"2015","unstructured":"Riham AlTawy, Onur Duman, and Amr M. 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