{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,28]],"date-time":"2023-09-28T10:42:40Z","timestamp":1695897760605},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","isbn-type":[{"value":"9781450394277","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,19]]},"DOI":"10.1145\/3544902","type":"proceedings","created":{"date-parts":[[2022,9,7]],"date-time":"2022-09-07T04:07:45Z","timestamp":1662523665000},"source":"Crossref","is-referenced-by-count":0,"title":["Proceedings of the 16th ACM \/ IEEE International Symposium on Empirical Software Engineering and Measurement"],"prefix":"10.1145","member":"320","published-online":{"date-parts":[[2022,9,19]]},"event":{"name":"ESEM '22: ACM \/ IEEE International Symposium on Empirical Software Engineering and Measurement","location":"Helsinki Finland","acronym":"ESEM '22","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering"]},"container-title":[],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3544902","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,27]],"date-time":"2023-09-27T22:25:27Z","timestamp":1695853527000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/proceedings\/10.1145\/3544902"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,19]]},"ISBN":["9781450394277"],"references-count":0,"alternative-id":["10.1145\/3544902"],"URL":"https:\/\/doi.org\/10.1145\/3544902","relation":{},"subject":[],"published":{"date-parts":[[2022,9,19]]}}}