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Syst."],"published-print":{"date-parts":[[2023,3,31]]},"abstract":"<jats:p>This article presents a study of two types of on-chip FPGA voltage sensors based on ring oscillators (ROs) and time-to-digital converter (TDCs), respectively. It has previously been shown that these sensors are often used to extract side-channel information from FPGAs without physical access. The performance of the sensors is evaluated in the presence of circuits that deliberately waste power, resulting in localized voltage drops. The effects of FPGA power supply features and sensor sensitivity in detecting voltage drops in an FPGA power distribution network (PDN) are evaluated for Xilinx Artix-7, Zynq 7000, and Zynq UltraScale+ FPGAs. We show that both sensor types are able to detect supply voltage drops, and that their measurements are consistent with each other. Our findings show that TDC-based sensors are more sensitive and can detect voltage drops that are shorter in duration, while RO sensors are easier to implement because calibration is not required. Furthermore, we present a new time-interleaved TDC design that sweeps the sensor phase. The new sensor generates data that can reconstruct voltage transients on the order of tens of picoseconds.<\/jats:p>","DOI":"10.1145\/3555048","type":"journal-article","created":{"date-parts":[[2022,8,8]],"date-time":"2022-08-08T12:06:31Z","timestamp":1659960391000},"page":"1-21","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":24,"title":["Voltage Sensor Implementations for Remote Power Attacks on FPGAs"],"prefix":"10.1145","volume":"16","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7981-9649","authenticated-orcid":false,"given":"Shayan","family":"Moini","sequence":"first","affiliation":[{"name":"University of Massachusetts Amherst, Amherst, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0967-9545","authenticated-orcid":false,"given":"Aleksa","family":"Deric","sequence":"additional","affiliation":[{"name":"University of Massachusetts Amherst, Amherst, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3933-2099","authenticated-orcid":false,"given":"Xiang","family":"Li","sequence":"additional","affiliation":[{"name":"University of Massachusetts Amherst, Amherst, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7344-2334","authenticated-orcid":false,"given":"George","family":"Provelengios","sequence":"additional","affiliation":[{"name":"University of Massachusetts Amherst, Amherst, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7068-4351","authenticated-orcid":false,"given":"Wayne","family":"Burleson","sequence":"additional","affiliation":[{"name":"University of Massachusetts Amherst, Amherst, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0591-7566","authenticated-orcid":false,"given":"Russell","family":"Tessier","sequence":"additional","affiliation":[{"name":"University of Massachusetts Amherst, Amherst, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2052-9820","authenticated-orcid":false,"given":"Daniel","family":"Holcomb","sequence":"additional","affiliation":[{"name":"University of Massachusetts Amherst, Amherst, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2022,12,22]]},"reference":[{"key":"e_1_3_1_2_2","first-page":"48","volume-title":"Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC\u201919)","author":"Alam Md Mahbub","year":"2019","unstructured":"Md Mahbub Alam, Shahin Tajik, Fatemeh Ganji, Mark Tehranipoor, and Domenic Forte. 2019. 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