{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:16:03Z","timestamp":1750220163177,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":5,"publisher":"ACM","license":[{"start":{"date-parts":[[2022,9,23]],"date-time":"2022-09-23T00:00:00Z","timestamp":1663891200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2022,9,23]]},"DOI":"10.1145\/3558819.3565085","type":"proceedings-article","created":{"date-parts":[[2022,10,27]],"date-time":"2022-10-27T01:37:33Z","timestamp":1666834653000},"page":"236-239","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Wood defect recognition based on wavelet transform data fusion edge detection algorithm"],"prefix":"10.1145","author":[{"given":"Yuanmin","family":"Huang","sequence":"first","affiliation":[{"name":"Intelligent manufacturing Institute, Foshan Polytechnic, China"}]},{"given":"Ming","family":"Yi","sequence":"additional","affiliation":[{"name":"Intelligent manufacturing Institute, Foshan Polytechnic, China"}]},{"given":"Weihang","family":"Yang","sequence":"additional","affiliation":[{"name":"Intelligent manufacturing Institute, Foshan Polytechnic, China"}]},{"given":"Man","family":"Yang","sequence":"additional","affiliation":[{"name":"Intelligent manufacturing Institute, Foshan Polytechnic, China"}]}],"member":"320","published-online":{"date-parts":[[2022,10,26]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"IOP Conference Series: Earth and Environmental Science 769 (2021)","author":"Huang Yuanmin","year":"2007","unstructured":"Yuanmin Huang , Ming Yi , Weihang Yang , Man Yang . \" A Technology of Surface Defects for the Solar Wafer by Dual Vision\"[J] , IOP Conference Series: Earth and Environmental Science 769 (2021) 04 2007 Yuanmin Huang, Ming Yi, Weihang Yang, Man Yang. \"A Technology of Surface Defects for the Solar Wafer by Dual Vision\"[J], IOP Conference Series: Earth and Environmental Science 769 (2021) 042007"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"crossref","unstructured":"Xie W. Wang F. & Yang D. Research on carrot surface defect detection methods based on machine vision. 52(30) (2019) 24-29.  Xie W. Wang F. & Yang D. Research on carrot surface defect detection methods based on machine vision. 52(30) (2019) 24-29.","DOI":"10.1016\/j.ifacol.2019.12.484"},{"volume-title":"2008 International Conference on Machine Learning and Cybernetics, 07\/2008","author":"Zhou Long","key":"e_1_3_2_1_3_1","unstructured":"Long Zhou . \"Application of two-dimension wavelet transform in image process of pets in stored grain \", 2008 International Conference on Machine Learning and Cybernetics, 07\/2008 . Long Zhou. \"Application of two-dimension wavelet transform in image process of pets in stored grain\", 2008 International Conference on Machine Learning and Cybernetics, 07\/2008."},{"key":"e_1_3_2_1_4_1","volume-title":"2011 International Conference on Electric Information and Control Engineering","author":"Li Jing","year":"2011","unstructured":"Jing Li , , and Zhiyong Lei . \"Adaptive thresholds edge detection for defective parts images based on wavelet transform \", 2011 International Conference on Electric Information and Control Engineering , 2011 . Jing Li, , and Zhiyong Lei. \"Adaptive thresholds edge detection for defective parts images based on wavelet transform\", 2011 International Conference on Electric Information and Control Engineering, 2011."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/3408127.3408133"}],"event":{"name":"ICCSIE2022: 7th International Conference on Cyber Security and Information Engineering","acronym":"ICCSIE2022","location":"Brisbane QLD Australia"},"container-title":["Proceedings of the 7th International Conference on Cyber Security and Information Engineering"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3558819.3565085","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3558819.3565085","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T19:00:28Z","timestamp":1750186828000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3558819.3565085"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,23]]},"references-count":5,"alternative-id":["10.1145\/3558819.3565085","10.1145\/3558819"],"URL":"https:\/\/doi.org\/10.1145\/3558819.3565085","relation":{},"subject":[],"published":{"date-parts":[[2022,9,23]]},"assertion":[{"value":"2022-10-26","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}