{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T18:28:31Z","timestamp":1767810511325,"version":"3.49.0"},"publisher-location":"New York, NY, USA","reference-count":21,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,1,16]],"date-time":"2023-01-16T00:00:00Z","timestamp":1673827200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"name":"JSPS KAKENHI Grant","award":["22K11954"],"award-info":[{"award-number":["22K11954"]}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,1,16]]},"DOI":"10.1145\/3566097.3567915","type":"proceedings-article","created":{"date-parts":[[2023,1,31]],"date-time":"2023-01-31T18:40:49Z","timestamp":1675190449000},"page":"442-448","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":3,"title":["Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects"],"prefix":"10.1145","author":[{"given":"Takuma","family":"Nagao","sequence":"first","affiliation":[{"name":"Nara Institute of Science and Technology, Ikoma, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tomoki","family":"Nakamura","sequence":"additional","affiliation":[{"name":"Sony Semiconductor Manufacturing Corporation, Isahaya, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Masuo","family":"Kajiyama","sequence":"additional","affiliation":[{"name":"Sony Semiconductor Manufacturing Corporation, Isahaya, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Makoto","family":"Eiki","sequence":"additional","affiliation":[{"name":"Sony Semiconductor Manufacturing Corporation, Isahaya, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michiko","family":"Inoue","sequence":"additional","affiliation":[{"name":"Nara Institute of Science and Technology, Ikoma, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michihiro","family":"Shintani","sequence":"additional","affiliation":[{"name":"Kyoto Institute of Technology, Kyoto, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2023,1,31]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2621883"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624821"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2164536"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429390"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.5555\/2485288.2485425"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035325"},{"key":"e_1_3_2_1_7_1","first-page":"103","volume-title":"Proceedings of IEEE International Test Conference","author":"Shintani Michihiro","year":"2021","unstructured":"Michihiro Shintani, Riaz-Ul-Haque Mian, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, and Michiko Inoue. Wafer-level variation modeling for multi-site RFIC testing via hierarchical Gaussian process. In Proceedings of IEEE International Test Conference, pp. 103--112, 2021."},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.871582"},{"key":"e_1_3_2_1_9_1","volume-title":"Gaussian Processes for Machine Learning","author":"Rasmussen Carl Edward","year":"2006","unstructured":"Carl Edward Rasmussen and Christopher K. I. Williams. Gaussian Processes for Machine Learning. MIT Press, 2006."},{"key":"e_1_3_2_1_10_1","first-page":"1027","volume-title":"Proceedings of ACM-SIAM Symposium on Discrete Algorithms","author":"Arthur David","year":"2007","unstructured":"David Arthur and Sergei Vassilvitskii. k-means++: The advantages of careful seeding. In Proceedings of ACM-SIAM Symposium on Discrete Algorithms, pp. 1027--1035, 2007."},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2121913"},{"key":"e_1_3_2_1_12_1","unstructured":"David Duvenaud. The kernel cookbook. [Online]. Available: https:\/\/www.cs.toronto.edu\/~duvenaud\/cookbook\/."},{"key":"e_1_3_2_1_13_1","first-page":"299","article-title":"Classes of kernels for machine learning: A statistics perspective","volume":"2","author":"Genton Marc G.","year":"2001","unstructured":"Marc G. Genton. Classes of kernels for machine learning: A statistics perspective. The Journal of Machine Learning Research, Vol. 2, pp. 299--312, 2001.","journal-title":"The Journal of Machine Learning Research"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2004.827001"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.911351"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651901"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2020.2994291"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-59802-9_4"},{"key":"e_1_3_2_1_19_1","unstructured":"GPy. GPy: A gaussian process framework in python. http:\/\/github.com\/SheffieldML\/GPy since 2012."},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.5555\/1953048.2078195"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1006\/nimg.1998.0391"}],"event":{"name":"ASPDAC '23: 28th Asia and South Pacific Design Automation Conference","location":"Tokyo Japan","acronym":"ASPDAC '23","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CEDA","IEICE","IEEE CAS","IPSJ"]},"container-title":["Proceedings of the 28th Asia and South Pacific Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3566097.3567915","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3566097.3567915","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T17:34:41Z","timestamp":1767807281000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3566097.3567915"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,1,16]]},"references-count":21,"alternative-id":["10.1145\/3566097.3567915","10.1145\/3566097"],"URL":"https:\/\/doi.org\/10.1145\/3566097.3567915","relation":{},"subject":[],"published":{"date-parts":[[2023,1,16]]},"assertion":[{"value":"2023-01-31","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}