{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T00:05:44Z","timestamp":1755907544563,"version":"3.44.0"},"publisher-location":"New York, NY, USA","reference-count":12,"publisher":"ACM","license":[{"start":{"date-parts":[[2022,12,17]],"date-time":"2022-12-17T00:00:00Z","timestamp":1671235200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2022,12,17]]},"DOI":"10.1145\/3582099.3582126","type":"proceedings-article","created":{"date-parts":[[2023,4,20]],"date-time":"2023-04-20T13:11:59Z","timestamp":1681996319000},"page":"171-174","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["An evaluation of classifiers for reading resistor colors"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0519-6511","authenticated-orcid":false,"given":"Yoshihiro","family":"Mitani","sequence":"first","affiliation":[{"name":"National Institute of Technology, Japan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0881-2340","authenticated-orcid":false,"given":"Wataru","family":"Yoshimura","sequence":"additional","affiliation":[{"name":"National Institute of Technology, Japan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4826-3507","authenticated-orcid":false,"given":"Yoshihiko","family":"Hamamoto","sequence":"additional","affiliation":[{"name":"Yamaguchi University, Japan"}]}],"member":"320","published-online":{"date-parts":[[2023,4,20]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-04186-4"},{"key":"e_1_3_2_1_2_1","first-page":"2850","volume-title":"Proc. Society of Instrument and Control Engineers Annual Conference","author":"Mitani Y.","year":"2010","unstructured":"Y. Mitani and Y. Hamamoto, \u201cA study of color features for reading a resistor,\u201d Proc. Society of Instrument and Control Engineers Annual Conference, pp. 2850-2851, 2010."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICAT47117.2019.8939034"},{"volume-title":"Last accessed on 2022-03-03 https:\/\/scikit-learn.org\/stable\/supervised_learning.html","year":"2022","key":"e_1_3_2_1_4_1","unstructured":"Supervised learning. Last accessed on 2022-03-03 https:\/\/scikit-learn.org\/stable\/supervised_learning.html , 2022."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1967.1053964"},{"key":"e_1_3_2_1_6_1","volume-title":"Introduction to statistical pattern recognition","author":"Fukunaga K.","year":"1990","unstructured":"K. Fukunaga, Introduction to statistical pattern recognition, Second Edition, Academic Press, 1990."},{"key":"e_1_3_2_1_7_1","volume-title":"Pattern classification","author":"Duda R. O.","year":"2001","unstructured":"R. O. Duda, P. E. Hart, and D. G. Stork, Pattern classification, Second Edition, Wiley-Interscience, 2001."},{"key":"e_1_3_2_1_8_1","first-page":"14","article-title":"Classification and regression trees","volume":"1","author":"Loh W.-Y.","year":"2011","unstructured":"W.-Y. Loh, \u201cClassification and regression trees,\u201d John Wiley & Sons, Inc., 1, pp. 14-23, 2011.","journal-title":"John Wiley & Sons, Inc."},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1023\/A:1022627411411"},{"key":"e_1_3_2_1_10_1","volume-title":"Proc. FLAIRS","author":"Zhang H.","year":"2004","unstructured":"H. Zhang, \u201cThe optimality of Na\u00efve Bayes,\u201d Proc. FLAIRS, 2004."},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1038\/323533a0"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"}],"event":{"name":"AICCC 2022: 2022 5th Artificial Intelligence and Cloud Computing Conference","acronym":"AICCC 2022","location":"Osaka Japan"},"container-title":["Proceedings of the 2022 5th Artificial Intelligence and Cloud Computing Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3582099.3582126","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3582099.3582126","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,22]],"date-time":"2025-08-22T06:53:19Z","timestamp":1755845599000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3582099.3582126"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12,17]]},"references-count":12,"alternative-id":["10.1145\/3582099.3582126","10.1145\/3582099"],"URL":"https:\/\/doi.org\/10.1145\/3582099.3582126","relation":{},"subject":[],"published":{"date-parts":[[2022,12,17]]},"assertion":[{"value":"2023-04-20","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}