{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,11]],"date-time":"2026-02-11T14:05:16Z","timestamp":1770818716385,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":16,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,7,12]],"date-time":"2023-07-12T00:00:00Z","timestamp":1689120000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/100000001","name":"NSF (National Science Foundation)","doi-asserted-by":"publisher","award":["1911017"],"award-info":[{"award-number":["1911017"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100014600","name":"MathWorks","doi-asserted-by":"publisher","award":[""],"award-info":[{"award-number":[""]}],"id":[{"id":"10.13039\/100014600","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,7,12]]},"DOI":"10.1145\/3597926.3605233","type":"proceedings-article","created":{"date-parts":[[2023,7,13]],"date-time":"2023-07-13T20:12:53Z","timestamp":1689279173000},"page":"1541-1545","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":6,"title":["Harnessing Large Language Models for Simulink Toolchain Testing and Developing Diverse Open-Source Corpora of Simulink Models for Metric and Evolution Analysis"],"prefix":"10.1145","author":[{"given":"Sohil Lal","family":"Shrestha","sequence":"first","affiliation":[{"name":"University of Texas at Arlington, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2023,7,13]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"Bernhard Rumpe, and Michael von Wenckstern.","author":"Bertram Vincent","year":"2017","unstructured":"Vincent Bertram , Shahar Maoz , Jan Oliver Ringert , Bernhard Rumpe, and Michael von Wenckstern. 2017 . Component and Connector Views in Practice : An Experience Report. In MODELS. IEEE Computer Society , 167\u2013177. Vincent Bertram, Shahar Maoz, Jan Oliver Ringert, Bernhard Rumpe, and Michael von Wenckstern. 2017. Component and Connector Views in Practice: An Experience Report. In MODELS. IEEE Computer Society, 167\u2013177."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10270-021-00883-0"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/2491956.2462173"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/3180155.3180231"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/3180155.3180231"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/3377811.3380381"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/3377812.3382147"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/3196478.3196484"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/QRS-C.2017.67"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786818"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSA.2017.10"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/3377812.3382163"},{"key":"e_1_3_2_1_13_1","volume-title":"Shafiul Azam Chowdhury, and Christoph Csallner","author":"Shrestha Sohil Lal","year":"2020","unstructured":"Sohil Lal Shrestha , Shafiul Azam Chowdhury, and Christoph Csallner . 2020 . DeepFuzzSL: Generating models with deep learning to find bugs in the Simulink toolchain. In DeepTest 2020. ACM. Sohil Lal Shrestha, Shafiul Azam Chowdhury, and Christoph Csallner. 2020. DeepFuzzSL: Generating models with deep learning to find bugs in the Simulink toolchain. In DeepTest 2020. ACM."},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1145\/3524842.3528001"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/3463274.3463806"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1145\/3194104.3194111"}],"event":{"name":"ISSTA '23: 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis","location":"Seattle WA USA","acronym":"ISSTA '23","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","AITO"]},"container-title":["Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3597926.3605233","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3597926.3605233","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T16:37:59Z","timestamp":1750178279000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3597926.3605233"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7,12]]},"references-count":16,"alternative-id":["10.1145\/3597926.3605233","10.1145\/3597926"],"URL":"https:\/\/doi.org\/10.1145\/3597926.3605233","relation":{},"subject":[],"published":{"date-parts":[[2023,7,12]]},"assertion":[{"value":"2023-07-13","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}