{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,11]],"date-time":"2026-04-11T13:57:42Z","timestamp":1775915862394,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":23,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,8,29]],"date-time":"2023-08-29T00:00:00Z","timestamp":1693267200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,8,29]]},"DOI":"10.1145\/3600160.3605061","type":"proceedings-article","created":{"date-parts":[[2023,8,9]],"date-time":"2023-08-09T22:54:41Z","timestamp":1691621681000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":6,"title":["Automatic Test Generation to Improve Scrum for Safety Agile Methodology"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1417-6328","authenticated-orcid":false,"given":"Mario","family":"Barbareschi","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2007-3744","authenticated-orcid":false,"given":"Salvatore","family":"Barone","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0964-7014","authenticated-orcid":false,"given":"Valentina","family":"Casola","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5489-5370","authenticated-orcid":false,"given":"Salvatore","family":"Della Torca","sequence":"additional","affiliation":[{"name":"Department of Management, Information and Production Engineering, University of Bergamo, Italy and Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4456-1793","authenticated-orcid":false,"given":"Daniele","family":"Lombardi","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2023,8,29]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"ARM Limited. 2013. CoreSight Architecture Specification v2.0 issue D. Technical Report. ARM Limited. https:\/\/documentation-service.arm.com\/static\/5f9009d5f86e16515cdc0417?token="},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-022-09593-2"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSRS56243.2022.10067350"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-85347-1_22"},{"key":"e_1_3_2_1_5_1","volume-title":"Short-circuit logic. arXiv:1010.3674 [cs, math] (March","author":"Bergstra A.","year":"2013","unstructured":"Jan\u00a0A. Bergstra, A. Ponse, and D.\u00a0J.\u00a0C. Staudt. 2013. Short-circuit logic. arXiv:1010.3674 [cs, math] (March 2013). http:\/\/arxiv.org\/abs\/1010.3674 arXiv:1010.3674."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-85347-1_10"},{"key":"e_1_3_2_1_8_1","unstructured":"Cyrille Comar Jerome Guitton Olivier Hainque and Thomas Quinot. 2012. Formalization and comparison of MCDC and object branch coverage criteria. In Embedded Real Time Software and Systems (ERTS2012)."},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-03769-7_5"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342124"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606635"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/2699688"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-99334-8"},{"key":"e_1_3_2_1_15_1","volume-title":"A Practical Tutorial on Modified Condition\/Decision Coverage","author":"Hayhurst J","unstructured":"Kelly\u00a0J Hayhurst. 2001. A Practical Tutorial on Modified Condition\/Decision Coverage. DIANE Publishing. Google-Books-ID: aqMz3xtU6HsC."},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00607-014-0418-5"},{"key":"e_1_3_2_1_19_1","volume-title":"Testing Computer Software","author":"Kaner Cem","unstructured":"Cem Kaner, Jack Falk, and Hung\u00a0Quoc Nguyen. 1999. Testing Computer Software. John Wiley & Sons."},{"key":"e_1_3_2_1_20_1","unstructured":"Lauterbach Development Tools. 2021. ARM Debugger. Technical Report. Lauterbach GmbH. https:\/\/www2.lauterbach.com\/pdf\/debugger_arm.pdf"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-38980-6_30"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2017.8115691"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2019.2921767"},{"key":"e_1_3_2_1_24_1","first-page":"4","article-title":"Non-intrusive Runtime Veri\ufb01cation within a System-on-Chip","volume":"39","author":"Ru\ufb01no Jos\u00e9","year":"2018","unstructured":"Jos\u00e9 Ru\ufb01no, Ant\u00f3nio Casimiro, Felix\u00a0Dino Lange, Martin Leucker, Torben Scheffel, Malte Schmitz, and Daniel Thoma. 2018. Non-intrusive Runtime Veri\ufb01cation within a System-on-Chip. Ada User Journal 39, 4 (2018), 4.","journal-title":"Ada User Journal"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1145\/2338965.2336776"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2018.00013"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2013.29"}],"event":{"name":"ARES 2023: The 18th International Conference on Availability, Reliability and Security","location":"Benevento Italy","acronym":"ARES 2023"},"container-title":["Proceedings of the 18th International Conference on Availability, Reliability and Security"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3600160.3605061","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3600160.3605061","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T17:49:16Z","timestamp":1750182556000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3600160.3605061"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,8,29]]},"references-count":23,"alternative-id":["10.1145\/3600160.3605061","10.1145\/3600160"],"URL":"https:\/\/doi.org\/10.1145\/3600160.3605061","relation":{},"subject":[],"published":{"date-parts":[[2023,8,29]]},"assertion":[{"value":"2023-08-29","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}