{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,2]],"date-time":"2025-12-02T15:08:05Z","timestamp":1764688085203,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":20,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,11,26]],"date-time":"2023-11-26T00:00:00Z","timestamp":1700956800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/501100001863","name":"New Energy and Industrial Technology Development Organization","doi-asserted-by":"publisher","award":["JPNP23013"],"award-info":[{"award-number":["JPNP23013"]}],"id":[{"id":"10.13039\/501100001863","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,11,30]]},"DOI":"10.1145\/3605769.3623995","type":"proceedings-article","created":{"date-parts":[[2023,11,23]],"date-time":"2023-11-23T08:31:21Z","timestamp":1700728281000},"page":"103-112","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":2,"title":["Effective Layout Design for Laser Fault Sensor on FPGA"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-2511-1486","authenticated-orcid":false,"given":"Shungo","family":"Hayashi","sequence":"first","affiliation":[{"name":"National Institute of Advanced Industrial Science and Technology & Yokohama National University, Koto-ku, Yokohama, Japan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5316-7555","authenticated-orcid":false,"given":"Junichi","family":"Sakamoto","sequence":"additional","affiliation":[{"name":"National Institute of Advanced Industrial Science and Technology & Yokohama National University, Koto-ku, Yokohama, Japan"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-2237-3518","authenticated-orcid":false,"given":"Masaki","family":"Chikano","sequence":"additional","affiliation":[{"name":"Yokohama National University, Yokohama, Japan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7965-4888","authenticated-orcid":false,"given":"Tsutomu","family":"Matsumoto","sequence":"additional","affiliation":[{"name":"National Institute of Advanced Industrial Science and Technology & Yokohama National University, Koto-ku, Yokohama, Japan"}]}],"member":"320","published-online":{"date-parts":[[2023,11,26]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1007\/BFb0052259"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/2732198.2732206"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2019.8741030"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2017.18"},{"key":"e_1_3_2_1_5_1","first-page":"28","volume-title":"IACR Transactions on Cryptographic Hardware and Embedded Systems","author":"Nashimoto Shoei","year":"2022","unstructured":"Shoei Nashimoto , Daisuke Suzuki , Rei Ueno , and Naofumi Homma . Bypassing isolated execution on risc-v using side-channel-assisted fault-injection and its countermeasure . IACR Transactions on Cryptographic Hardware and Embedded Systems , pages 28 -- 68 , 2022 . Shoei Nashimoto, Daisuke Suzuki, Rei Ueno, and Naofumi Homma. Bypassing isolated execution on risc-v using side-channel-assisted fault-injection and its countermeasure. IACR Transactions on Cryptographic Hardware and Embedded Systems, pages 28--68, 2022."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00145-010-9083-9"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2018.i3.44-68"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2005.862424"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2018.i3.547-572"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2018.i3.150-172"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"crossref","unstructured":"Kohei Matsuda Sho Tada Makoto Nagata Yuichi Komano Yang Li Takeshi Sugawara Mitsugu Iwamoto Kazuo Ohta Kazuo Sakiyama and Noriyuki Miura. An ic-level countermeasure against laser fault injection attack by information leakage sensing based on laser-induced opto-electric bulk current density. Japanese Journal of Applied Physics 59(SG):SGGL02 2020.  Kohei Matsuda Sho Tada Makoto Nagata Yuichi Komano Yang Li Takeshi Sugawara Mitsugu Iwamoto Kazuo Ohta Kazuo Sakiyama and Noriyuki Miura. An ic-level countermeasure against laser fault injection attack by information leakage sensing based on laser-induced opto-electric bulk current density. Japanese Journal of Applied Physics 59(SG):SGGL02 2020.","DOI":"10.7567\/1347-4065\/ab65d3"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2016.13"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/HOST54066.2022.9840177"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-49445-6_2"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/HOST54066.2022.9840318"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2928972"},{"key":"e_1_3_2_1_17_1","first-page":"1171","volume-title":"Automation & Test in Europe Conference & Exhibition (DATE)","author":"Khairallah Mustafa","year":"2018","unstructured":"Mustafa Khairallah , Rajat Sadhukhan , Radhamanjari Samanta , Jakub Breier , Shivam Bhasin , Rajat Subhra Chakraborty , Anupam Chattopadhyay , and Debdeep Mukhopadhyay . Dfarpa : Differential fault attack resistant physical design automation. In 2018 Design , Automation & Test in Europe Conference & Exhibition (DATE) , pages 1171 -- 1174 . IEEE, 2018 . Mustafa Khairallah, Rajat Sadhukhan, Radhamanjari Samanta, Jakub Breier, Shivam Bhasin, Rajat Subhra Chakraborty, Anupam Chattopadhyay, and Debdeep Mukhopadhyay. Dfarpa: Differential fault attack resistant physical design automation. In 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), pages 1171--1174. IEEE, 2018."},{"key":"e_1_3_2_1_18_1","first-page":"2","volume-title":"International workshop on cryptographic hardware and embedded systems","author":"Skorobogatov Sergei P","year":"2002","unstructured":"Sergei P Skorobogatov and Ross J Anderson . Optical fault induction attacks . In International workshop on cryptographic hardware and embedded systems , pages 2 -- 12 . Springer , 2002 . Sergei P Skorobogatov and Ross J Anderson. Optical fault induction attacks. In International workshop on cryptographic hardware and embedded systems, pages 2--12. Springer, 2002."},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2013.17"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2018.00049"}],"event":{"name":"CCS '23: ACM SIGSAC Conference on Computer and Communications Security","sponsor":["SIGSAC ACM Special Interest Group on Security, Audit, and Control"],"location":"Copenhagen Denmark","acronym":"CCS '23"},"container-title":["Proceedings of the 2023 Workshop on Attacks and Solutions in Hardware Security"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3605769.3623995","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3605769.3623995","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T16:46:12Z","timestamp":1750178772000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3605769.3623995"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11,26]]},"references-count":20,"alternative-id":["10.1145\/3605769.3623995","10.1145\/3605769"],"URL":"https:\/\/doi.org\/10.1145\/3605769.3623995","relation":{},"subject":[],"published":{"date-parts":[[2023,11,26]]},"assertion":[{"value":"2023-11-26","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}