{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,24]],"date-time":"2025-08-24T01:30:54Z","timestamp":1755999054284,"version":"3.44.0"},"publisher-location":"New York, NY, USA","reference-count":31,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,6,16]],"date-time":"2023-06-16T00:00:00Z","timestamp":1686873600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,6,16]]},"DOI":"10.1145\/3608251.3608291","type":"proceedings-article","created":{"date-parts":[[2023,8,17]],"date-time":"2023-08-17T12:15:01Z","timestamp":1692274501000},"page":"119-125","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":2,"title":["Digital Defect Simulation-based Data Generation for Visual Quality Inspection"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-5015-8806","authenticated-orcid":false,"given":"Xiaohui","family":"Wang","sequence":"first","affiliation":[{"name":"School of Computer and Communication Engineering, University of Science and Technology Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0764-6579","authenticated-orcid":false,"given":"Yulai","family":"Xie","sequence":"additional","affiliation":[{"name":"DT, Hitachi China Research Laboratory, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0523-8478","authenticated-orcid":false,"given":"Yang","family":"Zhang","sequence":"additional","affiliation":[{"name":"DT, Hitachi China Research Laboratory, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3559-0032","authenticated-orcid":false,"given":"Xiaoning","family":"Pi","sequence":"additional","affiliation":[{"name":"School of Computer and Communication Engineering, University of Science and Technology Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2251-9220","authenticated-orcid":false,"given":"Fang","family":"Ren","sequence":"additional","affiliation":[{"name":"School of Computer and Communication Engineering, University of Science and Technology Beijing, China"}]}],"member":"320","published-online":{"date-parts":[[2023,8,17]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.3390\/app11167657"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1177\/0040517519862880"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-10602-1_48"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2007.07.009"},{"key":"e_1_3_2_1_5_1","volume-title":"Automated Dataset Generation with Blender for Deep Learning-based Object Segmentation[C]\/\/2022 IEEE 20th Jubilee World Symposium on Applied Machine Intelligence and Informatics (SAMI)","author":"K\u00e1roly A I","year":"2022","unstructured":"K\u00e1roly A I, Galambos P. Automated Dataset Generation with Blender for Deep Learning-based Object Segmentation[C]\/\/2022 IEEE 20th Jubilee World Symposium on Applied Machine Intelligence and Informatics (SAMI). IEEE, 2022: 000329-000334."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-017-0882-0"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1061\/9780784480823.036"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2017.2775345"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2013.09.002"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/icsmc.2007.4413770"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.3390\/s22093467"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/access.2019.2894420"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.3390\/app8091575"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.12700\/aph.17.8.2020.8.7"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","unstructured":"Ros G Sellart L Materzynska J The synthia dataset: A large collection of synthetic images for semantic segmentation of urban scenes[C]\/\/Proceedings of the IEEE conference on computer vision and pattern recognition. 2016: 3234-3243. https:\/\/doi.org\/10.1109\/cvpr.2016.352","DOI":"10.1109\/cvpr.2016.352"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","unstructured":"Tremblay J Prakash A Acuna D Training deep networks with synthetic data: Bridging the reality gap by domain randomization[C]\/\/Proceedings of the IEEE conference on computer vision and pattern recognition workshops. 2018: 969-977. https:\/\/doi.org\/10.1109\/cvprw.2018.00143","DOI":"10.1109\/cvprw.2018.00143"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","unstructured":"Bergmann P Fauser M Sattlegger D MVTec AD\u2013A comprehensive real-world dataset for unsupervised anomaly detection[C]\/\/Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. 2019: 9592-9600. https:\/\/doi.org\/10.1109\/cvpr.2019.00982","DOI":"10.1109\/cvpr.2019.00982"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.3390\/app12020834"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.3390\/s20061562"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-019-01476-x"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.3390\/su14106009"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.promfg.2019.03.042"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksuci.2010.03.003"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/ias.2000.881960"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.compag.2018.08.001"},{"key":"e_1_3_2_1_26_1","first-page":"387","volume-title":"DEXA 2018, Regensburg, Germany, September 3\u20136, 2018, Proceedings, Part II 29","author":"Dandekar A","year":"2018","unstructured":"Dandekar A, Zen R A M, Bressan S. A comparative study of synthetic dataset generation techniques[C]\/\/Database and Expert Systems Applications: 29th International Conference, DEXA 2018, Regensburg, Germany, September 3\u20136, 2018, Proceedings, Part II 29. Springer International Publishing, 2018: 387-395."},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1177\/00405175221130773"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.2982115"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.compag.2021.106067"},{"key":"e_1_3_2_1_30_1","volume-title":"A survey of surface defect detection of industrial products based on a small number of labeled data[J]. arXiv preprint arXiv:2203.05733","author":"Jin Q","year":"2022","unstructured":"Jin Q, Chen L. A survey of surface defect detection of industrial products based on a small number of labeled data[J]. arXiv preprint arXiv:2203.05733, 2022."},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.09.081"}],"event":{"name":"ICCMS 2023: 2023 The 15th International Conference on Computer Modeling and Simulation","acronym":"ICCMS 2023","location":"Dalian China"},"container-title":["2023 The 15th International Conference on Computer Modeling and Simulation"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3608251.3608291","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3608251.3608291","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,22]],"date-time":"2025-08-22T19:04:10Z","timestamp":1755889450000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3608251.3608291"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,16]]},"references-count":31,"alternative-id":["10.1145\/3608251.3608291","10.1145\/3608251"],"URL":"https:\/\/doi.org\/10.1145\/3608251.3608291","relation":{},"subject":[],"published":{"date-parts":[[2023,6,16]]},"assertion":[{"value":"2023-08-17","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}