{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:10:11Z","timestamp":1750219811981,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":19,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,12,8]],"date-time":"2023-12-08T00:00:00Z","timestamp":1701993600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,12,8]]},"DOI":"10.1145\/3617572.3617880","type":"proceedings-article","created":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T03:27:12Z","timestamp":1701401232000},"page":"6-10","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Towards Assessing the Real-World Impact of Defects in Blockchain-Based Smart Contracts"],"prefix":"10.1145","author":[{"given":"Michael","family":"Hettmer","sequence":"first","affiliation":[{"name":"University of Duisburg-Essen, Essen, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benedikt","family":"Severin","sequence":"additional","affiliation":[{"name":"University of Duisburg-Essen, Essen, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Florian","family":"Blum","sequence":"additional","affiliation":[{"name":"University of Duisburg-Essen, Essen, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Volker","family":"Gruhn","sequence":"additional","affiliation":[{"name":"University of Duisburg-Essen, Essen, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2023,12,8]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"IEEE Std 610.12-1990. 1990. IEEE Standard Glossary of Software Engineering Terminology. \t\t\t\t  IEEE Std 610.12-1990. 1990. IEEE Standard Glossary of Software Engineering Terminology."},{"key":"e_1_3_2_1_2_1","volume-title":"Mastering Ethereum: Building Smart Contracts and Dapps. O\u2019reilly Media.","author":"Antonopoulos Andreas M","year":"2018","unstructured":"Andreas M Antonopoulos and Gavin Wood . 2018 . Mastering Ethereum: Building Smart Contracts and Dapps. O\u2019reilly Media. Andreas M Antonopoulos and Gavin Wood. 2018. Mastering Ethereum: Building Smart Contracts and Dapps. O\u2019reilly Media."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/3457337.3457841"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/3391195"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2020.2989002"},{"key":"e_1_3_2_1_6_1","unstructured":"Ram Chillarege. 1996. Orthogonal Defect Classification. Handbook of Software Reliability Engineering 359\u2013399. \t\t\t\t  Ram Chillarege. 1996. Orthogonal Defect Classification. Handbook of Software Reliability Engineering 359\u2013399."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2304.11624"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/3377811.3380364"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/WETSEB.2019.00008"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-51280-4_35"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.5281\/zenodo.8309220"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2023.3233999"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2022.3207428"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-020-09852-5"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2019.00133"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME55016.2022.00034"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1145\/3274694.3274737"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-03035-3"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2305.08456"}],"event":{"name":"SDD '23: 1st International Workshop on Software Defect Datasets","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering"],"location":"San Francisco CA USA","acronym":"SDD '23"},"container-title":["Proceedings of the 1st International Workshop on Software Defect Datasets"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3617572.3617880","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T16:45:59Z","timestamp":1750178759000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3617572.3617880"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,8]]},"references-count":19,"alternative-id":["10.1145\/3617572.3617880","10.1145\/3617572"],"URL":"https:\/\/doi.org\/10.1145\/3617572.3617880","relation":{},"subject":[],"published":{"date-parts":[[2023,12,8]]},"assertion":[{"value":"2023-12-08","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}