{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:08:33Z","timestamp":1750219713218,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":9,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,9,25]],"date-time":"2023-09-25T00:00:00Z","timestamp":1695600000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,9,25]]},"DOI":"10.1145\/3624032.3624033","type":"proceedings-article","created":{"date-parts":[[2023,10,17]],"date-time":"2023-10-17T18:15:18Z","timestamp":1697566518000},"page":"1-4","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":2,"title":["Test volume mitigation for mobile devices software development: An improvement approach considering shared requirements"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7597-3817","authenticated-orcid":false,"given":"Paulo","family":"Andrade","sequence":"first","affiliation":[{"name":"Sidia Instituto de Ci\u00eancia e Tecnologia, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-6851-5698","authenticated-orcid":false,"given":"Kathrian","family":"Marques","sequence":"additional","affiliation":[{"name":"Sidia Instituto de Ci\u00eancia e Tecnologia, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-2232-8834","authenticated-orcid":false,"given":"Luiz","family":"Ribeiro","sequence":"additional","affiliation":[{"name":"Sidia Instituto de Ci\u00eancia e Tecnologia, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-3314-3104","authenticated-orcid":false,"given":"Marcelo","family":"da Silva","sequence":"additional","affiliation":[{"name":"Sidia Instituto de Ci\u00eancia e Tecnologia, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-8582-9613","authenticated-orcid":false,"given":"Hendria","family":"Fragata","sequence":"additional","affiliation":[{"name":"Sidia Instituto de Ci\u00eancia e Tecnologia, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-6854-0707","authenticated-orcid":false,"given":"Adriano","family":"Oliveira","sequence":"additional","affiliation":[{"name":"Sidia Instituto de Ci\u00eancia e Tecnologia, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-6944-129X","authenticated-orcid":false,"given":"Juan","family":"Nogueira","sequence":"additional","affiliation":[{"name":"Sidia Instituto de Ci\u00eancia e Tecnologia, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2023,10,17]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1017\/pds.2021.422"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/3482909.3482917"},{"volume-title":"Vol.\u00a01","author":"Ekwoge Oswald\u00a0Mesumbe","key":"e_1_3_2_1_3_1","unstructured":"Oswald\u00a0Mesumbe Ekwoge , Awdren Font\u00e3o , and Arilo\u00a0 C Dias-Neto . 2017. Tester Experience: concept, issues and definition. In 2017 IEEE 41st annual computer software and applications conference (COMPSAC) , Vol.\u00a01 . IEEE , 208\u2013213. Oswald\u00a0Mesumbe Ekwoge, Awdren Font\u00e3o, and Arilo\u00a0C Dias-Neto. 2017. Tester Experience: concept, issues and definition. In 2017 IEEE 41st annual computer software and applications conference (COMPSAC), Vol.\u00a01. IEEE, 208\u2013213."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115446"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/3387905.3388598"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jretconser.2018.11.014"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/3524842.3527963"},{"key":"e_1_3_2_1_8_1","volume-title":"FGVcia.","author":"Meirelles S","year":"2023","unstructured":"Fernando\u00a0 S Meirelles . 2023. Pesquisa do Uso da TI-Tecnologia de Informa\u00e7\u00e3o nas Empresas , FGVcia. ( 2023 ). Fernando\u00a0S Meirelles. 2023. Pesquisa do Uso da TI-Tecnologia de Informa\u00e7\u00e3o nas Empresas, FGVcia. (2023)."},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2022.07.116"}],"event":{"name":"SAST 2023: 8th Brazilian Symposium on Systematic and Automated Software Testing","acronym":"SAST 2023","location":"Campo Grande, MS Brazil"},"container-title":["8th Brazilian Symposium on Systematic and Automated Software Testing"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3624032.3624033","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3624032.3624033","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T16:36:06Z","timestamp":1750178166000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3624032.3624033"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,25]]},"references-count":9,"alternative-id":["10.1145\/3624032.3624033","10.1145\/3624032"],"URL":"https:\/\/doi.org\/10.1145\/3624032.3624033","relation":{},"subject":[],"published":{"date-parts":[[2023,9,25]]},"assertion":[{"value":"2023-10-17","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}