{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,20]],"date-time":"2026-01-20T08:04:00Z","timestamp":1768896240471,"version":"3.49.0"},"publisher-location":"New York, NY, USA","reference-count":27,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,10,2]],"date-time":"2023-10-02T00:00:00Z","timestamp":1696204800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/501100006374","name":"Israel Science Foundation","doi-asserted-by":"publisher","award":["2525\/19"],"award-info":[{"award-number":["2525\/19"]}],"id":[{"id":"10.13039\/501100006374","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,10,2]]},"DOI":"10.1145\/3631882.3631887","type":"proceedings-article","created":{"date-parts":[[2024,4,8]],"date-time":"2024-04-08T12:06:58Z","timestamp":1712578018000},"page":"1-12","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["ECC-Map: A Resilient Wear-Leveled Memory-Device Architecture with Low Mapping Overhead"],"prefix":"10.1145","author":[{"given":"Natan","family":"Peled","sequence":"first","affiliation":[{"name":"Technion, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuval","family":"Cassuto","sequence":"additional","affiliation":[{"name":"Technion, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2024,4,8]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/2463585.2463589"},{"key":"e_1_3_2_1_2_1","volume-title":"Built-in Test for VLSI: Pseudorandom Techniques","author":"Bardell H.","unstructured":"Paul\u00a0H. Bardell, William\u00a0H. McAnney, and Jacob Savir. 1987. Built-in Test for VLSI: Pseudorandom Techniques. Wiley-Interscience."},{"key":"e_1_3_2_1_3_1","article-title":"Improving PCM Endurance with a Constant-Cost Wear Leveling Design","volume":"22","author":"Chang Yu-Ming","year":"2016","unstructured":"Yu-Ming Chang, Pi-Cheng Hsiu, Yuan-Hao Chang, Chi-Hao Chen, Tei-Wei Kuo, and Cheng-Yuan\u00a0Michael Wang. 2016. Improving PCM Endurance with a Constant-Cost Wear Leveling Design. ACM Trans. Des. Autom. Electron. Syst. 22, 1, Article 9 (jun 2016), 27\u00a0pages.","journal-title":"ACM Trans. Des. Autom. Electron. Syst."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228439"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2511147"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669157"},{"key":"e_1_3_2_1_7_1","volume-title":"Error-correction coding for digital communications","author":"Clark C.","unstructured":"George\u00a0C. Clark and J.\u00a0Bibb. Cain. 1981. Error-correction coding for digital communications. Plenum Press New York."},{"key":"e_1_3_2_1_8_1","volume-title":"Automation & Test in Europe Conference & Exhibition (DATE","author":"Joo Yongsoo","year":"2010","unstructured":"Yongsoo Joo, Dimin Niu, Xiangyu Dong, Guangyu Sun, Naehyuck Chang, and Yuan Xie. 2010. Energy-and endurance-aware design of phase change memory caches. In 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010). IEEE, 136\u2013141."},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0115-z"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/1555815.1555758"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/2512961"},{"key":"e_1_3_2_1_12_1","volume-title":"Mathematics of CRC, Error Detection and Correction, Cyclic Code, List of Hash Functions, Parity Bit, Information... Cksum, Adler- 32, Fletcher\u2019s Checksum","author":"Miller P.","unstructured":"Frederic\u00a0P. Miller, Agnes\u00a0F. Vandome, and John McBrewster. 2009. Cyclic Redundancy Check: Computation of CRC, Mathematics of CRC, Error Detection and Correction, Cyclic Code, List of Hash Functions, Parity Bit, Information... Cksum, Adler- 32, Fletcher\u2019s Checksum. Alpha Press."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2016.2573586"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669117"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/L-CA.2010.2"},{"key":"e_1_3_2_1_16_1","volume-title":"Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 1241\u20131246","author":"Shi Xin","year":"2018","unstructured":"Xin Shi, Fei Wu, Shunzhuo Wang, Changsheng Xie, and Zhonghai Lu. 2018. Program error rate-based wear leveling for NAND flash memory. In 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 1241\u20131246."},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2009.03.005"},{"key":"e_1_3_2_1_18_1","volume-title":"Cryptographic Hardware and Embedded Systems - CHES","author":"Tkacik E.","year":"2002","unstructured":"Thomas\u00a0E. Tkacik. 2003. A Hardware Random Number Generator. In Cryptographic Hardware and Embedded Systems - CHES 2002, Burton\u00a0S. Kaliski, \u00e7etin\u00a0K. Ko\u00e7, and Christof Paar (Eds.). Springer Berlin Heidelberg, Berlin, Heidelberg, 450\u2013453."},{"key":"e_1_3_2_1_19_1","volume-title":"30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis.","author":"Wei Debao","year":"2019","unstructured":"Debao Wei, Liyan Qiao, Xiaoyu Chen, Mengqi Hao, and Xiyuan Peng. 2019. SREA: A self-recovery effect aware wear-leveling strategy for the reliability extension of NAND flash memory. Microelectronics Reliability 100-101 (2019), 113433. 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis."},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2070050"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/SMARTCOMP.2014.7043841"},{"key":"e_1_3_2_1_22_1","first-page":"3131","article-title":"WLVT: A Static Wear-Leveling Algorithm with Variable Threshold. In Advanced Materials Research, Vol.\u00a0756","author":"Yang Yuan\u00a0Hua","year":"2013","unstructured":"Yuan\u00a0Hua Yang, Xian\u00a0Bin Xu, Shui\u00a0Bing He, Fang Zhen, and Yu\u00a0Ping Zhang. 2013. WLVT: A Static Wear-Leveling Algorithm with Variable Threshold. In Advanced Materials Research, Vol.\u00a0756. Trans Tech Publ, 3131\u20133135.","journal-title":"Trans Tech Publ"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD50377.2020.00044"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2012.6378661"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669116"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1145\/1555815.1555759"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICPADS.2016.0116"}],"event":{"name":"MEMSYS '23: The International Symposium on Memory Systems","location":"Alexandria VA USA","acronym":"MEMSYS '23"},"container-title":["Proceedings of the International Symposium on Memory Systems"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3631882.3631887","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3631882.3631887","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T01:35:28Z","timestamp":1755912928000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3631882.3631887"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,2]]},"references-count":27,"alternative-id":["10.1145\/3631882.3631887","10.1145\/3631882"],"URL":"https:\/\/doi.org\/10.1145\/3631882.3631887","relation":{},"subject":[],"published":{"date-parts":[[2023,10,2]]},"assertion":[{"value":"2024-04-08","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}