{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T15:21:24Z","timestamp":1772205684851,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":45,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,5,7]],"date-time":"2024-05-07T00:00:00Z","timestamp":1715040000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,5,7]]},"DOI":"10.1145\/3637543.3654657","type":"proceedings-article","created":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T06:19:21Z","timestamp":1719814761000},"page":"25-34","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":3,"title":["X-Factor: Deep Learning-based PCB Counterfeit Detection using X-Ray CT Techniques for Hardware Assurance"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-1834-1303","authenticated-orcid":false,"given":"Tishya Sarma","family":"Sarkar","sequence":"first","affiliation":[{"name":"Indian Institute of Technology, Kharagpur, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6418-0763","authenticated-orcid":false,"given":"Shuvodip","family":"Maitra","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology, Kharagpur, India"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-5188-9922","authenticated-orcid":false,"given":"Abhishek","family":"Chakraborty","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology, Kharagpur, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2060-2773","authenticated-orcid":false,"given":"Akashdeep","family":"Saha","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology, Kharagpur, India"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-1071-0075","authenticated-orcid":false,"given":"Joydeep","family":"Chowdhury","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology, Kharagpur, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6499-8346","authenticated-orcid":false,"given":"Debdeep","family":"Mukhopadhyay","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology, Kharagpur, India"}]}],"member":"320","published-online":{"date-parts":[[2024,7]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"Muthana Al-Amidie, and Laith Farhan.","author":"Alzubaidi Laith","year":"2021","unstructured":"Laith Alzubaidi, Jinglan Zhang, Amjad J. Humaidi, Ayad Al-dujaili, Ye Duan, Omran Al-Shamma, Jos\u00e9 I. Santamar\u00eda, Mohammed Abdulraheem Fadhel, Muthana Al-Amidie, and Laith Farhan. 2021. Review of deep learning: concepts, CNN architectures, challenges, applications, future directions. Journal of Big Data 8 (2021). https:\/\/api.semanticscholar.org\/CorpusID:232434552"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","unstructured":"Navid Asadizanjani Sina Shahbazmohamadi Mark Tehranipoor and Domenic Forte. 2015. Non-Destructive PCB Reverse Engineering Using X-Ray Micro Computed Tomography. 164--172. https:\/\/doi.org\/10.31399\/asm.cp.istfa2015p0164","DOI":"10.31399\/asm.cp.istfa2015p0164"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2019.11.013"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.2217\/iim.12.13"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"crossref","unstructured":"Ulbert J. Botero Navid Asadizanjani D. Woodard and Domenic Forte. 2020. A Framework for Automated Alignment and Layer Identification of X-Ray Tomography Imaged PCBs. https:\/\/api.semanticscholar.org\/CorpusID:225093453","DOI":"10.1109\/PAINE49178.2020.9337738"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","unstructured":"Ulbert J. Botero Fatemeh Ganji Navid Asadizanjani Damon L. Woodard and Domenic Forte. 2020. Semi-Supervised Automated Layer Identification of X-ray Tomography Imaged PCBs. In 2020 IEEE Physical Assurance and Inspection of Electronics (PAINE). 1--6. https:\/\/doi.org\/10.1109\/PAINE49178.2020.9337738","DOI":"10.1109\/PAINE49178.2020.9337738"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","unstructured":"Siyu Chen Xiaoqi Xi Lei Li Leifei Luo Yu Han and Jingyu Wang. 2016. A filter design method for beam hardening correction in middle-energy x-ray computed tomography. 1003352. https:\/\/doi.org\/10.1117\/12.2245152","DOI":"10.1117\/12.2245152"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","unstructured":"Deruo Cheng Yiqiong Shi Yee-Yang Tee Jingsi Song Xue Wang Bihan Wen and Bah-Hwee Gwee. 2023. Deep-learning-based X-ray CT Slice Analysis for Layout Verification in Printed Circuit Boards. In 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS). 1--5. https:\/\/doi.org\/10.1109\/AICAS57966.2023.10168608","DOI":"10.1109\/AICAS57966.2023.10168608"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.195"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1080\/00107514.2011.589662"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"crossref","unstructured":"Ulbert J. Botero; David Koblah; Daniel E. Capecci; Fatemeh Ganji; Navid Asadizanjani; Damon L. Woodard; Domenic Forte. 2020. Automated Via Detection for PCB Reverse Engineering.","DOI":"10.31399\/asm.cp.istfa2020p0157"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2014.2347918"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2017.10.013"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2021.03.002"},{"key":"e_1_3_2_1_15_1","volume-title":"Cascaded Structure Tensor Framework for Robust Identification of Heavily Occluded Baggage Items from X-ray Scans. (04","author":"Hassan Taimur","year":"2020","unstructured":"Taimur Hassan, Samet Akcay, Mohammed Bennamoun, Salman Khan, and Naoufel Werghi. 2020. Cascaded Structure Tensor Framework for Robust Identification of Heavily Occluded Baggage Items from X-ray Scans. (04 2020)."},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP40778.2020.9190711"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"e_1_3_2_1_18_1","volume-title":"Jasmin A. Holz, David Maintz, and Stefan Haneder.","author":"Hokamp Nils Gro\u00dfe","year":"2020","unstructured":"Nils Gro\u00dfe Hokamp, Brendan Eck, Florian Siedek, Daniel Pinto dos Santos, Jasmin A. Holz, David Maintz, and Stefan Haneder. 2020. Quantification of metal artifacts in computed tomography: methodological considerations. Quantitative imaging in medicine and surgery (2020)."},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/933\/1\/012006"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.243"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.chaos.2020.110495"},{"key":"e_1_3_2_1_22_1","volume-title":"Yong Eun Chung","author":"Seo Hyoung Suk Park Jin Keun","year":"2015","unstructured":"Jin Keun Seo Hyoung Suk Park, Yong Eun Chung. 2015. Computed tomographic beam-hardening artefacts: mathematical characterization and analysis. Phylosophical transactions of the royal society A:Mathematical, Physical and Engineering Sciences (2015)."},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cmpb.2020.105581"},{"key":"e_1_3_2_1_24_1","volume-title":"Adam: A Method for Stochastic Optimization. International Conference on Learning Representations (12","author":"Kingma Diederik","year":"2014","unstructured":"Diederik Kingma and Jimmy Ba. 2014. Adam: A Method for Stochastic Optimization. International Conference on Learning Representations (12 2014)."},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1145\/3606948"},{"key":"e_1_3_2_1_26_1","unstructured":"Dhwani Mehta John True Olivia P. Dizon-Paradis Nathan Jessurun Damon L. Woodard Navid Asadizanjani and Mark Tehranipoor. 2022. FICS PCB X-ray: A dataset for automated printed circuit board inter-layers inspection. Cryptology ePrint Archive Paper 2022\/924. https:\/\/eprint.iacr.org\/2022\/924 https:\/\/eprint.iacr.org\/2022\/924."},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.3389\/fonc.2017.00315"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6560\/aacdd4"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","unstructured":"B.L. Pierce D.J. Shelton H.G. Longbotham S. Baddipudi and P. Yan. 1993. Automated inspection of through hole solder joints utilizing X-ray imaging. In AUTOTESTCON 93. 191--196. https:\/\/doi.org\/10.1109\/AUTEST.1993.396350","DOI":"10.1109\/AUTEST.1993.396350"},{"key":"e_1_3_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1002\/acm2.13255"},{"key":"e_1_3_2_1_31_1","volume-title":"Water calibration for CT scanners with tube voltage modulation. Physics in medicine and biology","author":"Ritschl Ludwig","year":"2010","unstructured":"Ludwig Ritschl, Frank Bergner, Christof Fleischmann, and Marc Kachelriess. 2010. Water calibration for CT scanners with tube voltage modulation. Physics in medicine and biology (2010)."},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1109\/CASE49439.2021.9551671"},{"key":"e_1_3_2_1_33_1","doi-asserted-by":"publisher","DOI":"10.1109\/SIITME50350.2020.9292292"},{"key":"e_1_3_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-023-27627-y"},{"key":"e_1_3_2_1_35_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6560\/ac530e"},{"key":"e_1_3_2_1_36_1","volume-title":"Very Deep Convolutional Networks for Large-Scale Image Recognition. arXiv 1409.1556 (09","author":"Simonyan Karen","year":"2014","unstructured":"Karen Simonyan and Andrew Zisserman. 2014. Very Deep Convolutional Networks for Large-Scale Image Recognition. arXiv 1409.1556 (09 2014)."},{"key":"e_1_3_2_1_37_1","volume-title":"Using Deep Learning for Classification of Lung Nodules on Computed Tomography Images. Journal of healthcare engineering","author":"Song QingZeng","year":"2017","unstructured":"QingZeng Song, Lei Zhao, XingKe Luo, and XueChen Dou. 2017. Using Deep Learning for Classification of Lung Nodules on Computed Tomography Images. Journal of healthcare engineering (2017)."},{"key":"e_1_3_2_1_38_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.compstruct.2018.02.096"},{"key":"e_1_3_2_1_39_1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"e_1_3_2_1_40_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.micron.2020.102826"},{"key":"e_1_3_2_1_41_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00330-012-2765-y"},{"key":"e_1_3_2_1_42_1","doi-asserted-by":"publisher","DOI":"10.1038\/s43586-021-00015-4"},{"key":"e_1_3_2_1_43_1","volume-title":"Dangerous goods detection based on transfer learning in X-ray images. Neural computing and applications","author":"Yuanxi Wei Xiaoping Liu","year":"2020","unstructured":"Xiaoping Liu Yuanxi Wei. 2020. Dangerous goods detection based on transfer learning in X-ray images. Neural computing and applications (2020)."},{"key":"e_1_3_2_1_44_1","doi-asserted-by":"publisher","DOI":"10.1007\/s40747-021-00600-w"},{"key":"e_1_3_2_1_45_1","doi-asserted-by":"publisher","DOI":"10.1101\/392969"}],"event":{"name":"CF '24: 21st ACM International Conference on Computing Frontiers","location":"Ischia Italy","acronym":"CF '24","sponsor":["SIGMICRO ACM Special Interest Group on Microarchitectural Research and Processing"]},"container-title":["Proceedings of the 21st ACM International Conference on Computing Frontiers: Workshops and Special Sessions"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3637543.3654657","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3637543.3654657","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T01:46:47Z","timestamp":1755913607000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3637543.3654657"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,7]]},"references-count":45,"alternative-id":["10.1145\/3637543.3654657","10.1145\/3637543"],"URL":"https:\/\/doi.org\/10.1145\/3637543.3654657","relation":{},"subject":[],"published":{"date-parts":[[2024,5,7]]},"assertion":[{"value":"2024-07-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}