{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,31]],"date-time":"2025-08-31T10:26:25Z","timestamp":1756635985790,"version":"3.44.0"},"publisher-location":"New York, NY, USA","reference-count":16,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,12,8]],"date-time":"2023-12-08T00:00:00Z","timestamp":1701993600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"name":"scientific research project of Key Laboratory of Intelligent Control Technology for Wuling Mountain Ecological Agriculture in Hunan Province","award":["ZNKZN2020-2"],"award-info":[{"award-number":["ZNKZN2020-2"]}]},{"name":"Scientific research project of the Education Department of Hunan Province","award":["21C0641"],"award-info":[{"award-number":["21C0641"]}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,12,8]]},"DOI":"10.1145\/3641343.3641407","type":"proceedings-article","created":{"date-parts":[[2024,4,29]],"date-time":"2024-04-29T10:37:11Z","timestamp":1714387031000},"page":"337-342","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Fault Diagnosis of Bearing with Small Sample based on Siamese Networks and Metric Learning"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3012-2706","authenticated-orcid":false,"given":"Qingnan","family":"Wang","sequence":"first","affiliation":[{"name":"School of physics, Electronics and Intelligent Manufacturing, Huaihua University, China and \rHunan Province Key Laboratory of Intelligent Control Technology for Wuling-Mountain Ecological Agriculture, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3432-6020","authenticated-orcid":false,"given":"Jihui","family":"Tu","sequence":"additional","affiliation":[{"name":"Electronic Information School, Yangtze University, China"}]}],"member":"320","published-online":{"date-parts":[[2024,4,29]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11265-018-1378-3"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"crossref","unstructured":"LEI Y G YANG B JIANG X W Nandi. 2020. Applications of machine learning to machine fault diagnosis:a review and roadmap. Mechanical Systems and Signal Processing 138.","DOI":"10.1016\/j.ymssp.2019.106587"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"crossref","unstructured":"Liu R Yang B Zio E 2018. Artificial intelligence for fault diagnosis of rotating machinery: A review. Mechanical Systems and Signal Processing (S1096-1216) 108: 33-47.","DOI":"10.1016\/j.ymssp.2018.02.016"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1155\/2018\/7068349"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2020.07.025"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/MCI.2018.2840738"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2774777"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.21629\/JSEE.2019.04.17"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107539"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-0716-0826-5_3"},{"key":"e_1_3_2_1_11_1","volume-title":"Proceedings of the ICML Deep Learning Workshop.","author":"KOCH G","year":"2015","unstructured":"KOCH G, ZEMEL R, SALAKHUTDINOV R. 2015. Siamese neural networks for one-shot image recognition. Proceedings of the ICML Deep Learning Workshop."},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/TASLP.2018.2868428"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-018-3844-z"},{"key":"e_1_3_2_1_14_1","unstructured":"Howard AG Zhu ML Chen B 2017. MobileNet-Efficient convolutional neural networks for mobile vision applications. arXiv:1704.04861"},{"key":"e_1_3_2_1_15_1","volume-title":"Proceedings of 2018 IEEE\/CVF Conference on Computer Vision and Pattern Recognition. Salt Lake City: IEEE, 4510\u20134520","author":"ML","year":"2018","unstructured":"Sandler M, Howard A, Zhu ML, 2018. MobileNetV2: Inverted residuals and linear bottlenecks. Proceedings of 2018 IEEE\/CVF Conference on Computer Vision and Pattern Recognition. Salt Lake City: IEEE, 4510\u20134520"},{"volume-title":"Proceedings of the 2019 IEEE\/CVF International Conference on Computer Vision (ICCV). Seoul: IEEE,1314\u20131324","year":"2019","key":"e_1_3_2_1_16_1","unstructured":"Howard A, Sandler M, Chen B, 2019. Searching for MobileNetV3. Proceedings of the 2019 IEEE\/CVF International Conference on Computer Vision (ICCV). Seoul: IEEE,1314\u20131324."}],"event":{"name":"ICEITSA 2023: The 3rd International Conference on Electronic Information Technology and Smart Agriculture","acronym":"ICEITSA 2023","location":"Sanya China"},"container-title":["The 3rd International Conference on Electronic Information Technology and Smart Agriculture"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3641343.3641407","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3641343.3641407","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,22]],"date-time":"2025-08-22T16:58:32Z","timestamp":1755881912000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3641343.3641407"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,8]]},"references-count":16,"alternative-id":["10.1145\/3641343.3641407","10.1145\/3641343"],"URL":"https:\/\/doi.org\/10.1145\/3641343.3641407","relation":{},"subject":[],"published":{"date-parts":[[2023,12,8]]},"assertion":[{"value":"2024-04-29","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}