{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,13]],"date-time":"2024-07-13T00:25:08Z","timestamp":1720830308751},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","isbn-type":[{"value":"9798400705748","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,20]]},"DOI":"10.1145\/3643786","type":"proceedings","created":{"date-parts":[[2024,7,12]],"date-time":"2024-07-12T16:08:47Z","timestamp":1720800527000},"source":"Crossref","is-referenced-by-count":0,"title":["Proceedings of the 5th IEEE\/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning"],"prefix":"10.1145","member":"320","published-online":{"date-parts":[[2024,7,12]]},"event":{"name":"DeepTest '24: 5th IEEE\/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning","location":"Lisbon Portugal","acronym":"DeepTest '24","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","IEEE CS","Faculty of Engineering of University of Porto"]},"container-title":[],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3643786","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,12]],"date-time":"2024-07-12T16:08:49Z","timestamp":1720800529000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/proceedings\/10.1145\/3643786"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,20]]},"ISBN":["9798400705748"],"references-count":0,"alternative-id":["10.1145\/3643786"],"URL":"https:\/\/doi.org\/10.1145\/3643786","relation":{},"subject":[],"published":{"date-parts":[[2024,4,20]]}}}