{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,24]],"date-time":"2025-08-24T01:50:04Z","timestamp":1756000204327,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":21,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,6,23]],"date-time":"2024-06-23T00:00:00Z","timestamp":1719100800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"name":"National Natural Science Foundation of China (NSFC)","award":["92373206","62090024","62202453","U20A20202"],"award-info":[{"award-number":["92373206","62090024","62202453","U20A20202"]}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,6,23]]},"DOI":"10.1145\/3649329.3656526","type":"proceedings-article","created":{"date-parts":[[2024,11,7]],"date-time":"2024-11-07T19:27:22Z","timestamp":1731007642000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":2,"title":["SmartATPG: Learning-based Automatic Test Pattern Generation with Graph Convolutional Network and Reinforcement Learning"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-1204-5929","authenticated-orcid":false,"given":"Wenxing","family":"Li","sequence":"first","affiliation":[{"name":"Institute of Computing Technology, Chinese Academy of Sciences, Beijing, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-0348-9417","authenticated-orcid":false,"given":"Hongqin","family":"Lyu","sequence":"additional","affiliation":[{"name":"Institute of Computing Technology, Chinese Academy of Sciences, Beijing, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8407-2594","authenticated-orcid":false,"given":"Shengwen","family":"Liang","sequence":"additional","affiliation":[{"name":"Institute of Computing Technology, Chinese Academy of Sciences, Beijing, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-8419-8960","authenticated-orcid":false,"given":"Tiancheng","family":"Wang","sequence":"additional","affiliation":[{"name":"Institute of Computing Technology, Chinese Academy of Sciences, Beijing, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8082-4218","authenticated-orcid":false,"given":"Huawei","family":"Li","sequence":"additional","affiliation":[{"name":"Institute of Computing Technology, Chinese Academy of Sciences, Beijing, Beijing, China"}]}],"member":"320","published-online":{"date-parts":[[2024,11,7]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"30","volume-title":"Digest of Papers","author":"Schulz M. H.","year":"1988","unstructured":"M. H. Schulz and E. Auth, \"Advanced automatic test pattern generation and redundancy identification techniques,\" in 1988 International Symposium on Fault-Tolerant Computing. Digest of Papers, 1988, pp. 30--35."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_2_1","DOI":"10.1109\/T-C.1975.224205"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_3_1","DOI":"10.1147\/rd.104.0278"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_4_1","DOI":"10.1109\/TC.1981.1675757"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_5_1","DOI":"10.1109\/TC.1983.1676174"},{"key":"e_1_3_2_1_6_1","first-page":"214","volume-title":"HITEC: a test generation package for sequential circuits,\" in 1991 European Design Automation Conference (EURO-DAC)","author":"Niermann T.","year":"1991","unstructured":"T. Niermann and J. H. Patel, \"HITEC: a test generation package for sequential circuits,\" in 1991 European Design Automation Conference (EURO-DAC), 1991, pp. 214--218."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_7_1","DOI":"10.1109\/43.108614"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_8_1","DOI":"10.1109\/ITC50671.2022.00010"},{"key":"e_1_3_2_1_9_1","first-page":"1","volume-title":"Machine learning-based DFT recommendation system for ATPG QOR,\" in 2019 International Test Conference (ITC)","author":"Zorian A.","year":"2019","unstructured":"A. Zorian, B. Shanyour, and M. Vaseekar, \"Machine learning-based DFT recommendation system for ATPG QOR,\" in 2019 International Test Conference (ITC), 2019, pp. 1--7."},{"key":"e_1_3_2_1_10_1","first-page":"1","volume-title":"Machine intelligence for efficient test pattern generation,\" in 2020 International Test Conference (ITC)","author":"Roy S.","year":"2020","unstructured":"S. Roy, S. K. Millican, and V. D. Agrawal, \"Machine intelligence for efficient test pattern generation,\" in 2020 International Test Conference (ITC), 2020, pp. 1--5."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_11_1","DOI":"10.1109\/VLSID51830.2021.00059"},{"key":"e_1_3_2_1_12_1","first-page":"1","volume-title":"Principal component analysis in machine intelligence-based test generation,\" in 2021 Microelectronics Design and Test Symposium (MDTS)","author":"Roy S.","year":"2021","unstructured":"S. Roy, S. K. Millican, and V. D. Agrawal, \"Principal component analysis in machine intelligence-based test generation,\" in 2021 Microelectronics Design and Test Symposium (MDTS), 2021, pp. 1--6."},{"volume-title":"Reinforcement learning,\" A Bradford Book","author":"Sutton R. S.","unstructured":"R. S. Sutton and A. G. Barto, \"Reinforcement learning,\" A Bradford Book, vol. 15, no. 7, pp. 665--685, 1998.","key":"e_1_3_2_1_13_1"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_14_1","DOI":"10.1007\/BF00992698"},{"key":"e_1_3_2_1_15_1","volume-title":"Proximal Policy Optimization Algorithms,\" in arXiv preprint arXiv:1707.06347","author":"Schulman J.","year":"2017","unstructured":"J. Schulman, F. Wolski, P. Dhariwal, et al., \"Proximal Policy Optimization Algorithms,\" in arXiv preprint arXiv:1707.06347, 2017."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_16_1","DOI":"10.1145\/800139.804528"},{"unstructured":"F. Brglez \"On testability analysis of combinational circuits \" in 1984 International Symposium on Circuits and Systems (ISCAS) 1984 pp. 221--225.","key":"e_1_3_2_1_17_1"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_18_1","DOI":"10.1007\/s11432-022-3772-8"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_19_1","DOI":"10.1109\/TKDE.2018.2807452"},{"key":"e_1_3_2_1_20_1","first-page":"1025","volume-title":"Inductive representation learning on large graphs,\" in 2017 Neural Information Processing Systems (NIPS)","year":"2017","unstructured":"Hamilton W, Ying Z, and Leskovec J, \"Inductive representation learning on large graphs,\" in 2017 Neural Information Processing Systems (NIPS), 2017, pp. 1025--1035."},{"key":"e_1_3_2_1_21_1","volume-title":"Exploration by Random Network Distillation,\" in arXiv preprint arXiv:1810.12894","author":"Burda Y.","year":"2018","unstructured":"Y. Burda, H. Edwards, A. Storkey, et al., \"Exploration by Random Network Distillation,\" in arXiv preprint arXiv:1810.12894, 2018."}],"event":{"sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA","SIGBED ACM Special Interest Group on Embedded Systems"],"acronym":"DAC '24","name":"DAC '24: 61st ACM\/IEEE Design Automation Conference","location":"San Francisco CA USA"},"container-title":["Proceedings of the 61st ACM\/IEEE Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3649329.3656526","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3649329.3656526","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T01:17:55Z","timestamp":1750295875000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3649329.3656526"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,23]]},"references-count":21,"alternative-id":["10.1145\/3649329.3656526","10.1145\/3649329"],"URL":"https:\/\/doi.org\/10.1145\/3649329.3656526","relation":{},"subject":[],"published":{"date-parts":[[2024,6,23]]},"assertion":[{"value":"2024-11-07","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}