{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,23]],"date-time":"2026-10-23T11:57:08Z","timestamp":1792756628244,"version":"4.5.0"},"publisher-location":"New York, NY, USA","reference-count":18,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,6,23]],"date-time":"2024-06-23T00:00:00Z","timestamp":1719100800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,6,23]]},"DOI":"10.1145\/3649329.3658246","type":"proceedings-article","created":{"date-parts":[[2024,11,7]],"date-time":"2024-11-07T14:27:22Z","timestamp":1730989642000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":26,"title":["S2RAM PUF: An Ultra-low Power Subthreshold SRAM PUF with Zero Bit Error Rate"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-2299-7246","authenticated-orcid":false,"given":"Li","family":"Ni","sequence":"first","affiliation":[{"name":"College of Integrated Circuits, Hunan University, Changsha, Hunan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8712-2964","authenticated-orcid":false,"given":"Jiliang","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Integrated Circuits, Hunan University, Changsha, Hunan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2024,11,7]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"9","article-title":"Physical unclonable functions for device authentication and secret key generation","author":"Suh G. E.","year":"2007","unstructured":"G. E. Suh et al., \"Physical unclonable functions for device authentication and secret key generation,\" in DAC, 2007, pp. 9--14.","journal-title":"DAC"},{"issue":"3","key":"e_1_3_2_1_2_1","first-page":"817","article-title":"A wide-range variation-resilient physically unclonable function in 28 nm","volume":"55","author":"Liang Z. Y.","year":"2019","unstructured":"Z. Y. Liang et al., \"A wide-range variation-resilient physically unclonable function in 28 nm,\" IEEE JSSC vol. 55, no. 3, pp. 817--825, 2019.","journal-title":"IEEE JSSC"},{"issue":"4","key":"e_1_3_2_1_3_1","first-page":"940","article-title":"A 4-fJ\/b delay-hardened physically unclonable function circuit with selective bit destabilization in 14-nm trigate CMOS","volume":"52","author":"Satpathy S.","year":"2017","unstructured":"S. Satpathy et al., \"A 4-fJ\/b delay-hardened physically unclonable function circuit with selective bit destabilization in 14-nm trigate CMOS,\" IEEE JSSC, vol. 52, no. 4, pp. 940--949, 2017.","journal-title":"IEEE JSSC"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417955"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2506641"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3035207"},{"issue":"6","key":"e_1_3_2_1_7_1","first-page":"1719","article-title":"A 373-F2 0.21%-native-ber ee sram physically unclonable function with 2-d power-gated bit cells and vss bias-based dark-bit detection","volume":"55","author":"Liu K.","year":"2020","unstructured":"K. Liu et al., \"A 373-F2 0.21%-native-ber ee sram physically unclonable function with 2-d power-gated bit cells and vss bias-based dark-bit detection,\" IEEE JSSC, vol. 55, no. 6, pp. 1719--1732, 2020.","journal-title":"IEEE JSSC"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2996772"},{"key":"e_1_3_2_1_9_1","first-page":"73","article-title":"DA PUF: dual-state analog PUF","author":"Zhang J.","year":"2022","unstructured":"J. Zhang et al., \"DA PUF: dual-state analog PUF,\" in DAC, 2022, pp. 73--78.","journal-title":"DAC"},{"key":"e_1_3_2_1_10_1","first-page":"517","article-title":"A 183F2 gate leakage-based physically unclonable function with area efficient current tilting-based masking scheme","author":"Park B.","year":"2022","unstructured":"B. Park et al., \"A 183F2 gate leakage-based physically unclonable function with area efficient current tilting-based masking scheme,\" in ESSCIRC, 2022, pp. 517--520.","journal-title":"ESSCIRC"},{"key":"e_1_3_2_1_11_1","first-page":"146","article-title":"8.3 A 553F2 2-transistor amplifier-based physically unclonable function (PUF) with 1.67% native instability","author":"Yang K.","year":"2017","unstructured":"K. Yang et al., \"8.3 A 553F2 2-transistor amplifier-based physically unclonable function (PUF) with 1.67% native instability,\" in ISSCC, 2017, pp. 146--147.","journal-title":"ISSCC"},{"issue":"7","key":"e_1_3_2_1_12_1","first-page":"2182","article-title":"PUF architecture with run-time adaptation for resilient and energy-efficient key generation via sensor fusion","volume":"56","author":"Taneja S.","year":"2021","unstructured":"S. Taneja et al., \"PUF architecture with run-time adaptation for resilient and energy-efficient key generation via sensor fusion,\" IEEE JSSC, vol. 56, no. 7, pp. 2182--2192, 2021.","journal-title":"IEEE JSSC"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2586498"},{"issue":"10","key":"e_1_3_2_1_14_1","first-page":"2957","article-title":"A 20F2\/bit current-integration-based differential nand-structured PUF for stable and V\/T variation-tolerant low-cost IoT security","volume":"57","author":"Lee J.","year":"2022","unstructured":"J. Lee et al., \"A 20F2\/bit current-integration-based differential nand-structured PUF for stable and V\/T variation-tolerant low-cost IoT security,\" IEEE JSSC, vol. 57, no. 10, pp. 2957--2968, 2022.","journal-title":"IEEE JSSC"},{"issue":"3","key":"e_1_3_2_1_15_1","first-page":"805","article-title":"A physical unclonable function with bit error rate< 2.3\u00d7108 based on contact formation probability without error correction code","volume":"55","author":"Jeon D.","year":"2020","unstructured":"D. Jeon et al., \"A physical unclonable function with bit error rate< 2.3\u00d7108 based on contact formation probability without error correction code,\" IEEE JSSC, vol. 55, no. 3, pp. 805--816, 2020.","journal-title":"IEEE JSSC"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2920714"},{"issue":"12","key":"e_1_3_2_1_17_1","first-page":"876","article-title":"Zero bit error rate ID generation circuit using via formation probability in 0.18 \u03bc m CMOS process","volume":"50","author":"Kim T.W.","year":"2014","unstructured":"T.W. Kim et al., \"Zero bit error rate ID generation circuit using via formation probability in 0.18 \u03bc m CMOS process,\" IEEE EL, vol. 50, no. 12, pp. 876--877, 2014.","journal-title":"IEEE EL"},{"issue":"2","key":"e_1_3_2_1_18_1","first-page":"648","article-title":"A 35F2 leakage-based physically unclonable function with lossless stabilization through remapping for low-cost IoT security","volume":"56","author":"Lee J.","year":"2020","unstructured":"J. Lee et al., \"A 35F2 leakage-based physically unclonable function with lossless stabilization through remapping for low-cost IoT security,\" IEEE JSSC, vol. 56, no. 2, pp. 648--657, 2020.","journal-title":"IEEE JSSC"}],"event":{"name":"DAC '24: 61st ACM\/IEEE Design Automation Conference","location":"San Francisco CA USA","acronym":"DAC '24","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA","SIGBED ACM Special Interest Group on Embedded Systems"]},"container-title":["Proceedings of the 61st ACM\/IEEE Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3649329.3658246","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3649329.3658246","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T21:18:01Z","timestamp":1750281481000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3649329.3658246"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,23]]},"references-count":18,"alternative-id":["10.1145\/3649329.3658246","10.1145\/3649329"],"URL":"https:\/\/doi.org\/10.1145\/3649329.3658246","relation":{},"subject":[],"published":{"date-parts":[[2024,6,23]]},"assertion":[{"value":"2024-11-07","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}