{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T00:02:43Z","timestamp":1755907363781,"version":"3.44.0"},"publisher-location":"New York, NY, USA","reference-count":15,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,6,12]],"date-time":"2024-06-12T00:00:00Z","timestamp":1718150400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,6,12]]},"DOI":"10.1145\/3649476.3658779","type":"proceedings-article","created":{"date-parts":[[2024,6,10]],"date-time":"2024-06-10T12:29:41Z","timestamp":1718022581000},"page":"333-337","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Comprehensive Analysis of Generated Single Event Transients in Most Common Logic Cells of Skywater's 130-nm Technology"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-2433-5078","authenticated-orcid":false,"given":"Janani","family":"Aravind","sequence":"first","affiliation":[{"name":"Electrical and Computer Engineering, North Carolina Agricultural and Technical State University, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-5393-7621","authenticated-orcid":false,"given":"Victor","family":"Oyadongha","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering, North Carolina Agricultural and Technical State University, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5540-5847","authenticated-orcid":false,"given":"Daniel","family":"Limbrick","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering, North Carolina Agricultural and Technical State University, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2024,6,12]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"[n. d.]. Skywater. https:\/\/www.skywatertechnology.com\/."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2019.2918077"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2011.18"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.907754"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.884788"},{"volume-title":"2017 IEEE 30th International Conference on Microelectronics (MIEL). 35\u201344","author":"Andjelkovic M.","key":"e_1_3_2_1_6_1","unstructured":"M. Andjelkovic, A. Ilic, Z. Stamenkovic, M. Krstic, and R. Kraemer. 2017. An overview of the modeling and simulation of the single event transients at the circuit level. In 2017 IEEE 30th International Conference on Microelectronics (MIEL). 35\u201344."},{"key":"e_1_3_2_1_7_1","volume-title":"Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells. In 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS). 212\u2013215","author":"Andjelkovic Marko","year":"2019","unstructured":"Marko Andjelkovic, Yuanqing Li, Zoran Stamenkovic, Milos Krstic, and Rolf Kraemer. 2019. Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells. In 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS). 212\u2013215."},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2001409"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1109\/TASC.2018.2797253","article-title":"Digital Superconducting Electronics Design Tools\u2014Status and Roadmap","volume":"28","author":"Fourie J.","year":"2018","unstructured":"Coenrad\u00a0J. Fourie. 2018. Digital Superconducting Electronics Design Tools\u2014Status and Roadmap. IEEE Transactions on Applied Superconductivity 28, 5 (2018), 1\u201312.","journal-title":"IEEE Transactions on Applied Superconductivity"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839174"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2007953"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2033798"},{"key":"e_1_3_2_1_13_1","unstructured":"Daniel Limbrick and William Robinson. 2012. Characterizing single event transient pulse widths in an open-source cell library using SPICE."},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910125"},{"volume-title":"2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS). 1\u20134.","author":"Wrobel F.","key":"e_1_3_2_1_15_1","unstructured":"F. Wrobel, L. Dilillo, A.\u00a0D. Touboul, and F. Saign\u00e9. 2013. Comparison of the transient current shapes obtained with the diffusion model and the double exponential law \u2014 Impact on the SER. In 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS). 1\u20134."}],"event":{"name":"GLSVLSI '24: Great Lakes Symposium on VLSI 2024","sponsor":["SIGDA ACM Special Interest Group on Design Automation"],"location":"Clearwater FL USA","acronym":"GLSVLSI '24"},"container-title":["Proceedings of the Great Lakes Symposium on VLSI 2024"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3649476.3658779","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3649476.3658779","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,22]],"date-time":"2025-08-22T02:30:34Z","timestamp":1755829834000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3649476.3658779"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,12]]},"references-count":15,"alternative-id":["10.1145\/3649476.3658779","10.1145\/3649476"],"URL":"https:\/\/doi.org\/10.1145\/3649476.3658779","relation":{},"subject":[],"published":{"date-parts":[[2024,6,12]]},"assertion":[{"value":"2024-06-12","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}