{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,8]],"date-time":"2026-10-08T11:34:32Z","timestamp":1791459272917,"version":"4.3.4"},"publisher-location":"New York, NY, USA","reference-count":32,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,9,11]],"date-time":"2024-09-11T00:00:00Z","timestamp":1726012800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,9,11]]},"DOI":"10.1145\/3650212.3680377","type":"proceedings-article","created":{"date-parts":[[2024,9,11]],"date-time":"2024-09-11T11:44:25Z","timestamp":1726055065000},"page":"1504-1515","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":5,"title":["Reproducing Timing-Dependent GUI Flaky Tests in Android Apps via a Single Event Delay"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-8894-9239","authenticated-orcid":false,"given":"Xiaobao","family":"Cai","sequence":"first","affiliation":[{"name":"Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-1193-0696","authenticated-orcid":false,"given":"Zhen","family":"Dong","sequence":"additional","affiliation":[{"name":"Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-8477-9446","authenticated-orcid":false,"given":"Yongjiang","family":"Wang","sequence":"additional","affiliation":[{"name":"Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8415-5410","authenticated-orcid":false,"given":"Abhishek","family":"Tiwari","sequence":"additional","affiliation":[{"name":"University of Passau, Passau, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3376-2581","authenticated-orcid":false,"given":"Xin","family":"Peng","sequence":"additional","affiliation":[{"name":"Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2024,9,11]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"2023. EdXposed. https:\/\/github.com\/ElderDrivers\/EdXposed"},{"key":"e_1_3_2_1_2_1","unstructured":"2023. Flame Chart. https:\/\/developer.android.com\/studio\/profile\/inspect-traces"},{"key":"e_1_3_2_1_3_1","unstructured":"2023. Xposed. https:\/\/github.com\/rovo89\/Xposed"},{"key":"e_1_3_2_1_4_1","unstructured":"2023. YAMP. https:\/\/github.com\/Grigory-Rylov\/android-methods-profiler"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-Companion52605.2021.00081"},{"key":"e_1_3_2_1_6_1","volume-title":"DeFlaker: Automatically Detecting Flaky Tests. In 2018 IEEE\/ACM 40th International Conference on Software Engineering (ICSE).","author":"Bell J.","unstructured":"J. Bell, O. Legunsen, M. Hilton, L. Eloussi, T. Yung, and D. Marinov. 2018. DeFlaker: Automatically Detecting Flaky Tests. In 2018 IEEE\/ACM 40th International Conference on Software Engineering (ICSE)."},{"key":"e_1_3_2_1_7_1","unstructured":"Xiaobao Cai Zhen Dong Yongjiang Wang Abhishek Tiwari and Xin Peng. 2024. Artifacts for Reproducing timing-dependent flaky tests in Android apps via a single delay. https:\/\/flakeecho.github.io"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/3468264.3468584"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/3395363.3397366"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/3338906.3338945"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/SCAM.2018.00009"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/2666356.2594330"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/2931037.2931069"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1145\/3293882.3330570"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/3377811.3381749"},{"key":"e_1_3_2_1_16_1","volume-title":"12th IEEE Conference on Software Testing, Validation and Verification.","author":"Lam W.","unstructured":"W. Lam, R. Oei, A. Shi, D. Marinov, and T. Xie. 2019. iDFlakies: A Framework for Detecting and Partially Classifying Flaky Tests. In 12th IEEE Conference on Software Testing, Validation and Verification."},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE5003.2020.00045"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1145\/3540250.3558956"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1145\/2635868.2635920"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1145\/2635868.2635920"},{"key":"e_1_3_2_1_21_1","volume-title":"Proceedings of the 35th ACM SIGPLAN Conference on Programming Language Design and Implementation.","author":"Maiya Pallavi","unstructured":"Pallavi Maiya, Aditya Kanade, and Rupak Majumdar. [n. d.]. Race Detection for Android Applications. In Proceedings of the 35th ACM SIGPLAN Conference on Programming Language Design and Implementation."},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-SEIP.2017.16"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICDEW.2007.4401026"},{"key":"e_1_3_2_1_24_1","volume-title":"Peeler: Learning to Effectively Predict Flakiness without Running Tests.","author":"Qin Yihao","year":"2022","unstructured":"Yihao Qin, Shangwen Wang, Kui Liu, Bo Lin, Hongjun Wu, Li Li, Xiaoguang Mao, and Tegawend\u00e9 Bissyand\u00e9. 2022. Peeler: Learning to Effectively Predict Flakiness without Running Tests."},{"key":"e_1_3_2_1_25_1","volume-title":"An Empirical Analysis of UI-based Flaky Tests. In IEEE\/ACM International Conference on Software Engineering.","author":"Romano Alan","year":"2021","unstructured":"Alan Romano, Zihe Song, Sampath Grandhi, Wei Yang, and Weihang Wang. 2021. An Empirical Analysis of UI-based Flaky Tests. In IEEE\/ACM International Conference on Software Engineering."},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1145\/3293882.3330568"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1145\/3338906.3338925"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME46990.2020.00037"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1145\/3377816.3381742"},{"key":"e_1_3_2_1_30_1","volume-title":"An Empirical Study of Flaky Tests in Android Apps. In International Conference on Software Maintenance and Evolution (ICSME). 534\u2013538","author":"Thorve Swapna","year":"2018","unstructured":"Swapna Thorve, Chandani Sreshtha, and Na Meng. 2018. An Empirical Study of Flaky Tests in Android Apps. In International Conference on Software Maintenance and Evolution (ICSME). 534\u2013538."},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME46990.2020.00083"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-SEIP.2017.13"}],"event":{"name":"ISSTA '24: 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis","location":"Vienna Austria","acronym":"ISSTA '24","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","AITO"]},"container-title":["Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3650212.3680377","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3650212.3680377","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T22:50:08Z","timestamp":1750287008000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3650212.3680377"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9,11]]},"references-count":32,"alternative-id":["10.1145\/3650212.3680377","10.1145\/3650212"],"URL":"https:\/\/doi.org\/10.1145\/3650212.3680377","relation":{},"subject":[],"published":{"date-parts":[[2024,9,11]]},"assertion":[{"value":"2024-09-11","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}