{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T05:03:30Z","timestamp":1750309410785,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":13,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,9,11]],"date-time":"2024-09-11T00:00:00Z","timestamp":1726012800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,9,11]]},"DOI":"10.1145\/3650212.3685556","type":"proceedings-article","created":{"date-parts":[[2024,9,11]],"date-time":"2024-09-11T11:44:25Z","timestamp":1726055065000},"page":"1912-1914","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Integrating Mutation Techniques to Keep Specification and Source Code in Sync"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5595-1394","authenticated-orcid":false,"given":"Kerstin","family":"Jacob","sequence":"first","affiliation":[{"name":"University of Bamberg, Bamberg, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2024,9,11]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-49812-6"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/HASE.1999.809499"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2000.873653"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1007\/S10664-013-9255-Y"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/CCE53527.2021.9633118"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-59293-8_188"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1007\/S10270-016-0568-3"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.62"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/3550356.3561545"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2017.31"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1002\/STVR.456"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-021-10079-1"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE48619.2023.00129"}],"event":{"name":"ISSTA '24: 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","AITO"],"location":"Vienna Austria","acronym":"ISSTA '24"},"container-title":["Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3650212.3685556","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3650212.3685556","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T00:58:09Z","timestamp":1750294689000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3650212.3685556"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9,11]]},"references-count":13,"alternative-id":["10.1145\/3650212.3685556","10.1145\/3650212"],"URL":"https:\/\/doi.org\/10.1145\/3650212.3685556","relation":{},"subject":[],"published":{"date-parts":[[2024,9,11]]},"assertion":[{"value":"2024-09-11","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}