{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T05:41:22Z","timestamp":1780638082262,"version":"3.54.1"},"publisher-location":"New York, NY, USA","reference-count":10,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,10,20]],"date-time":"2023-10-20T00:00:00Z","timestamp":1697760000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,10,20]]},"DOI":"10.1145\/3650400.3650411","type":"proceedings-article","created":{"date-parts":[[2024,4,17]],"date-time":"2024-04-17T08:33:18Z","timestamp":1713342798000},"page":"60-65","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":2,"title":["Optimizing IGBT Remaining Life Prediction of ELM using Nutcracker Optimization Algorithm"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-8295-0524","authenticated-orcid":false,"given":"Zhongyuan","family":"Liu","sequence":"first","affiliation":[{"name":"College of Electraical and Information Engineering, Lanzhou UnIv. of Tech, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2024,4,17]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"Yu Y, Du X","author":"Jiang C","year":"2023","unstructured":"Jiang C, Ai H, Chen W. 2023; 49(08):8-14. IGBT Aging Prediction Method Based on Time Domain Features and LSTM-Attention. China Testing. Ren H, Yu Y, Du X, 2023; 1-13. IGBT Lifetime Prediction Model Based on Optimized Long Short-Term Memory Neural Network. Journal of Electrical Engineering."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2442334"},{"key":"e_1_3_2_1_3_1","volume-title":"Effects of current and bonding wires damage on high-power IGBT module reliability by electro thermo mechanical simulation[C]\/\/2020 21 st International Conferenceon Electronic Packaging Technology","year":"2020","unstructured":"HUANG Q, PENG C, WANGLC, Effects of current and bonding wires damage on high-power IGBT module reliability by electro thermo mechanical simulation[C]\/\/2020 21 st International Conferenceon Electronic Packaging Technology. Guangzhou, China:IEEE, 2020: 1-4."},{"key":"e_1_3_2_1_4_1","volume-title":"5th international conference on integrated power electronics systems.","author":"Bayerer R","year":"2008","unstructured":"Bayerer R, Herrmann T, Licht T, VDE, 2008: 1-6. Model for power cycling lifetime of IGBT modules-various factors influencing lifetime [C]. 5th international conference on integrated power electronics systems."},{"key":"e_1_3_2_1_5_1","volume-title":"Applied Sciences","author":"Duan Z","year":"2023","unstructured":"Duan Z, Yu H, Zhang Q, Applied Sciences, 2023, 13(11)."},{"key":"e_1_3_2_1_6_1","first-page":"262","author":"Parameter Extraction A","year":"2023","unstructured":"Parameter Extraction of Solar Photovoltaic Model Based on Nutcracker Optimization Algorithm [J]. Mohamed A,Reda M, Mohammed J, Knowledge-Based Systems, 2023, 262. Nutcracker optimizer: A novel nature-inspired metaheuristic algorithm for global optimization and engineering design problems[J].","journal-title":"Knowledge-Based Systems"},{"key":"e_1_3_2_1_7_1","unstructured":"Yao X. 2023. 000105. Research on Job Shop Scheduling Problem based on Chaos-improved Ocean Predator Algorithm [Dissertation]. Yancheng Institute of Technology."},{"key":"e_1_3_2_1_8_1","unstructured":"Jiang S Shi B. 2023; 52(12): 70-75+80. Failure Pressure Prediction of Corroded Pipeline Based on ISSA-ELM Model. Hot Working Technology."},{"key":"e_1_3_2_1_9_1","unstructured":"Li C Dong S Li W. 2023; 40(07): 126-131.Prediction of Container Ship Berthing Time Based on PCA-IPSO-ELM. Computer Simulation."},{"key":"e_1_3_2_1_10_1","unstructured":"Jiang S Shi B. 2023; 52(12): 70-75+80. Failure Pressure Prediction of Corroded Pipeline Based on ISSA-ELM Model. Hot Working Technology."}],"event":{"name":"EITCE 2023: 2023 7th International Conference on Electronic Information Technology and Computer Engineering","location":"Xiamen China","acronym":"EITCE 2023"},"container-title":["Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3650400.3650411","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3650400.3650411","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T05:06:16Z","timestamp":1755752776000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3650400.3650411"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,20]]},"references-count":10,"alternative-id":["10.1145\/3650400.3650411","10.1145\/3650400"],"URL":"https:\/\/doi.org\/10.1145\/3650400.3650411","relation":{},"subject":[],"published":{"date-parts":[[2023,10,20]]},"assertion":[{"value":"2024-04-17","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}