{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,24]],"date-time":"2024-07-24T00:19:41Z","timestamp":1721780381823},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","isbn-type":[{"value":"9798400706240","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,6,10]]},"DOI":"10.1145\/3652963","type":"proceedings","created":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T22:21:15Z","timestamp":1717280475000},"source":"Crossref","is-referenced-by-count":0,"title":["Abstracts of the 2024 ACM SIGMETRICS\/IFIP PERFORMANCE Joint International Conference on Measurement and Modeling of Computer Systems"],"prefix":"10.1145","member":"320","published-online":{"date-parts":[[2024,6,10]]},"event":{"name":"SIGMETRICS\/PERFORMANCE '24: ACM SIGMETRICS\/IFIP PERFORMANCE Joint International Conference on Measurement and Modeling of Computer Systems","location":"Venice Italy","acronym":"SIGMETRICS\/PERFORMANCE '24","sponsor":["SIGMETRICS ACM Special Interest Group on Measurement and Evaluation"]},"container-title":[],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3652963","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,23]],"date-time":"2024-07-23T10:57:41Z","timestamp":1721732261000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/proceedings\/10.1145\/3652963"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,10]]},"ISBN":["9798400706240"],"references-count":0,"alternative-id":["10.1145\/3652963"],"URL":"https:\/\/doi.org\/10.1145\/3652963","relation":{},"subject":[],"published":{"date-parts":[[2024,6,10]]}}}